IP Library Granted Patent US 7,037,581
Granted Patent B2
US 7,037,581 · App. 10/246,426 · Granted May 2, 2006

Conductive silicon composite, preparation thereof, and negative electrode material for non-aqueous electrolyte secondary cell

Assignee: Shin-Etsu Chemical Co., Ltd.
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Quick Facts
Patent No.
US 7,037,581
App. No.
10/246,426
Granted
May 2, 2006
Kind
B2
Abstract

A conductive silicon composite in which particles of the structure that silicon crystallites are dispersed in silicon dioxide are coated on their surfaces with carbon affords satisfactory cycle performance when used as the negative electrode material in a non-aqueous electrolyte secondary cell.

Claims (20)

1. A conductive silicon composite in which particles of the structure that crystallites of silicon having a size of 1 to 500 nm are dispersed in silicon dioxide are coated on their surfaces with carbon.

2. The conductive silicon composite of claim 1 wherein the particles of the structure that crystallites of silicon are dispersed in silicon dioxide have an average particle size of 0.01 to 30 μm, a BET specific surface area of 0.5 to 20 m 2 /g, and a carbon coverage of 3 to 70% by weight.

3. The conductive silicon composite of claim 1 wherein the particle surfaces are at least partially fused to carbon.

4. The conductive silicon composite of claim 1 wherein when analyzed by x-ray diffractometry, a diffraction peak attributable to Si(111) is observed, and the silicon crystallites have a size of 1 to 500 nm as determined from the half width of the diffraction peak by Scherrer method, and the carbon coverage is 5 to 70% by weight of the silicon composite.

5. The conductive silicon composite of claim 1 which contains 1 to 35% by weight of zero-valent silicon capable of generating hydrogen gas upon reaction with an alkali hydroxide solution.

6. The conductive silicon composite of claim 1 wherein on Raman spectroscopy, the Raman shift provides a graphite structure-intrinsic spectrum near 1580 cm −1 .

7. A method for preparing the conductive silicon composite of claim 1 , comprising the steps of disproportionating silicon oxide with an organic gas and/or vapor at a temperature of 900 to 1,400° C. and simultaneously effecting chemical vapor deposition.

8. A method for preparing the conductive silicon composite according to claim 7 wherein the silicon oxide represented by the general formula: SiOx wherein 1≦x<1.6 is in the form of particles having an average particle size of 0.01 to 30 μm and a BET specific surface area of 0.1 to 30 m 2 /g.

9. A method for preparing the conductive silicon composite according to claim 7 wherein the method is conducted in a reactor selected from a fluidized bed reactor, rotary furnace, vertical moving bed reactor, tunnel furnace, batch furnace and rotary kiln.

10. A method for preparing the conductive silicon composite of claim 1 , comprising the step of effecting chemical vapor deposition of a component with an organic gas and/or vapor at a temperature of 800 to 1,400° C.,

the component being selected from among a silicon composite obtained by previously heat treating silicon oxide in an inert gas atmosphere at 900 to 1,400° C. for disproportionation, a composite obtained by coating silicon microparticulates with silicon dioxide by the sol-gel method, a composite obtained by coagulating silicon fine powder with the aid of finely divided silica and water and sintering, and a product obtained by heating silicon and partial oxide or nitride thereof in an inert gas stream at 800 to 1,400° C.

11. A negative electrode material for a non-aqueous electrolyte secondary cell, comprising the conductive silicon composite of claim 1 .

12. A negative electrode material for a non-aqueous electrolyte secondary cell, comprising a mixture of the conductive silicon composite of claim 1 and 1 to 60% by weight of a conductive agent, the mixture having a total carbon content of 25 to 90% by weight.

13. The conductive silicon composite of claim 1 wherein the particles have an average particle size of 0.01 to 30 μm.

14. The conductive silicon composite of claim 1 wherein the particles have a BET specific surface area of 0.1 to 30 m 2 /g.

15. The conductive silicon composite of claim 1 wherein the particles have a BET specific surface area of 1 to 10 m 2 /g.

16. The conductive silicon composite of claim 1 having an electrical conductivity of at least 1×10 −6 S/m.

17. The conductive silicon composite of claim 1 having an electrical conductivity of at least 1×10 −4 S/m.

18. A method for preparing a conductive silicon composite in which particles of the structure that crystallites of silicon are dispersed in a silicon compound are coated on their surfaces with carbon

comprising the steps of previously subjecting silicon oxide to chemical vapor deposition with an organic gas and/or vapor at a temperature of 500 to 1,200° C. and heat treating the resulting product in an inert gas atmosphere at 900 to 1,400° C. for disproportionation.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2002
From: ARAMATA, MIKIO; MIYAWAKI, SATORU; UENO, SUSUMU; FUKUOKA, HIROFUMI; MOMII, KAZUMA
To: SHIN-ETSU CHEMICAL CO., LTD.
Reel/Frame 013304/0277 →
Priority Claims (1)
JP 2002-142777 · May 17, 2002 · national
Continuity (1)
Related Publication 20030215711A1 · Nov 20, 2003