IP Library Granted Patent US 7,184,142
Granted Patent B2
US 7,184,142 · App. 10/807,328 · Granted Feb 27, 2007

Raman probe and Raman spectrum measuring apparatus utilizing the same

Assignees: Riken; Machida Endoscope Co., Ltd.
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Quick Facts
Patent No.
US 7,184,142
App. No.
10/807,328
Granted
Feb 27, 2007
Kind
B2
Abstract

A Raman probe for measuring Raman spectrum includes an exciting-end light guiding path for guiding excitation light from a light source to a sample; a receiving light-guide path for guiding a light signal from said sample to a detector; a band-pass filter for passing said excitation light and blocking Raman-scattered light produced from said exciting-end light guiding path; a pipe for securing said band-pass filter inside said pipe, said pipe being mounted on a light-outgoing end of said exciting-end light guiding path; and an edge filter mounted on a light-incident end of said receiving light-guide path, said edge filter passing Raman-scattered light from said sample while blocking the excitation light. The edge filter is a short-wavelength transmitting filter that permits passage of wavelengths shorter than the excitation wavelength.

Claims (18)

1. A Raman probe for measuring Raman spectrum, comprising:

an exciting-end light guiding path for guiding excitation light from a light source to a sample;

a receiving light-guide path for guiding a light signal from said sample to a detector;

a band-pass filter for passing said excitation light and blocking Raman-scattered light produced from said exciting-end light guiding path;

a pipe for securing said band-pass filter inside said pipe, said pipe being mounted on a light-outgoing end of said exciting-end light guiding path; and

an edge filter mounted on a light-incident end of said receiving light-guide path, said edge filter passing Raman-scattered light from said sample while blocking the excitation light;

wherein the edge filter is a short-wavelength transmitting filter that permits passage of wavelengths shorter than the excitation wavelength.

2. The Raman probe according to claim 1 , wherein said receiving light-guide path is made up of a plurality of optical fibers the light-incident ends of which are arranged around said pipe,

wherein said edge filter is formed in a circular shape with an opening provided at the center, and

wherein the tip of said pipe is inserted into said opening.

3. The Raman probe according to claim 1 , wherein said pipe is made of metal.

4. The Raman probe according to claim 1 , wherein said exciting-end light guiding path consists of a single optical fiber.

5. A Raman-spectrum measuring apparatus, comprising:

a laser light source;

a spectroscope; and

a Raman probe for guiding light emitted by said laser light source to a sample and for guiding Raman-scattered light from said sample to said spectroscope;

wherein the Raman probe is one according to claim 1 .

6. The Raman-spectrum measuring apparatus according to claim 5 , wherein said laser light source is a pulsed light source.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 30, 2004
From: KOMACHI, YUICHI; TASHIRO, HIDEO; SATO, HIDETOSHI; AIZAWA, KATSUO
To: RIKEN; MACHIDA ENDOSCOPE CO., LTD.
Reel/Frame 015624/0997 →
Priority Claims (1)
JP 2003-083480 · Mar 25, 2003 · national
Continuity (1)
Related Publication 20060146322A1 · Jul 6, 2006