Scanning mechanism for scanning probe microscope and scanning probe microscope

1. A scanning probe microscope scanning mechanism for moving an object to be moved along a Z-axis, comprising:

a Z stage to move the object along the Z-axis, wherein the Z stage comprises an insulating board, a Z-direction moving actuator fixed to the insulating board, a conductive pattern for the insulating board, and an electrical connecting portion to electrically connect the conductive pattern to the Z-direction moving actuator;

wherein the object is mounted on a free end of the Z-direction moving actuator, and the electrical connecting portion is attached at a fixed end of the Z-direction moving actuator.

2. A mechanism according to claim 1 , further comprising:

a fixed base;

an X-Y stage, housed in the fixed base, to move the object alone an X-axis and a Y-axis that are perpendicular to each other and to the Z-axis;

an X-direction moving actuator extending along the X-axis between the X-Y stage and the fixed base; and

a Y-direction moving actuator extending along the Y-axis between the X-Y stage and the fixed base,

wherein the X-Y stage comprises: a movable portion that is movable along the X-axis and the Y-axis, a fixed portion located around the movable portion, a pair of first elastic support portions that are located on both sides of the movable portion along the X-axis and that connect the movable portion and the fixed portion, a pair of second elastic support portions that are located on both sides of the movable portion along the Y-axis and that connect the movable portion and the fixed portion, and a third elastic support portion that is located on one side of the movable portion along the Z-axis and that connects the movable portion and the fixed portion,

wherein the X-direction moving actuator extends in contact with the first elastic support portions and the fixed base and is capable of expanding and contracting along the X-axis, and the Y-direction moving actuator extends in contact with the second elastic support portions and the fixed base and is capable of expanding and contracting along the Y-axis, and

wherein the insulating board of the Z-stage is held on the movable portion of the X-Y stage.

3. A mechanism according to claim 1 , wherein the electrical connecting portion comprises a conductive paste.

4. A mechanism according to claim 1 , wherein the electrical connecting portion comprises a conductive adhesive.

5. A mechanism according to claim 1 , wherein the electrical connecting portion comprises solder that melts at a low temperature.

6. A mechanism according to claim 1 , wherein the insulating board comprises a material having a Young's modulus larger than 7×10 9 Pa.

7. A mechanism according to claim 1 , wherein the insulating board comprises a ceramic material.

8. A mechanism according to claim 1 , wherein the Z-direction moving actuator comprises two piezoelectric elements which can expand and contract along the Z-axis, and which are located coaxially and respectively extend from the insulating board to opposite sides along the Z-axis.

9. A mechanism according to claim 1 , wherein the object comprises a sample to be observed.

10. A mechanism according to claim 1 , wherein the object comprises a cantilever.

11. A scanning probe microscope comprising the scanning mechanism according to claim 1 .

12. A mechanism according to claim 1 , wherein the Z-direction moving actuator comprises a piezoelectric actuator.

13. A mechanism according to claim 12 , wherein a contact area between the electrical connecting portion and the piezoelectric element is not more than ½ an area of a surface of the piezoelectric element that is in contact with the electrical connecting portion.

14. A mechanism according to claim 12 , wherein the piezoelectric element has a mass of not more than 1 g.