Method to control anodic current in an x-ray source
An apparatus and method for an x-ray system includes an x-ray emitter having a first electrode and a second electrode. A high voltage supply is electrically connected to the first electrode. A power supply is electrically connected to the second electrode. A controller electrically connected to the high voltage supply and power supply is configured to provide a predetermined parameter to the second electrode during operation of the x-ray emitter to generate the predetermined dose rate from the x-ray emitter. During operation of the x-ray emitter, at least one operational value of the second electrode corresponding to the predetermined parameter is measured and combined with the predetermined parameter using an algorithm to obtain a modified predetermined parameter to be provided by the controller to the second electrode during a subsequent operation of the x-ray emitter.
1. An x-ray system comprising:
an x-ray emitter including a first electrode and a second electrode;
a high voltage supply electrically connected to the first electrode;
a power supply electrically connected to the second electrode;
a controller to control the high voltage supply and power supply to provide a predetermined dose rate from the x-ray emitter, the controller being configured to provide a predetermined parameter to the second electrode during operation of the x-ray emitter to generate the predetermined dose rate;
wherein during operation of the x-ray emitter, at least one operational value of the second electrode corresponding to the predetermined parameter is measured and combined with the predetermined parameter using an algorithm to obtain a modified predetermined parameter to be provided by the controller to the second electrode during a subsequent operation of the x-ray emitter; and
the at least one operational value from a flawed operation of the x-ray system is disregarded and the modified predetermined parameter is the modified predetermined parameter from a previous operation of the x-ray system.
2. The x-ray system of claim 1 wherein the predetermined parameter is electrical power.
3. The x-ray system of claim 2 wherein the at least one operational value is a plurality of operational values, the plurality of operational values being statistically averaged before being combined with the predetermined parameter.
4. The x-ray system of claim 1 wherein the predetermined parameter is electrical current.
5. The x-ray system of claim 4 wherein the at least one operational value is a plurality of operational values, the plurality of operational values being statistically averaged before being combined with the predetermined parameter.
6. The x-ray system of claim 1 wherein the predetermined parameter is electrical voltage.
7. The x-ray system of claim 6 wherein the at least one operational value is a plurality of operational values, the plurality of operational values being statistically averaged before being combined with the predetermined parameter.
8. The x-ray system of claim 1 wherein the at least one operational value is measured at predetermined time increments.
9. The x-ray system of claim 8 wherein the predetermined time increments are a function of a difference in value between consecutive measurements of operational values.
10. The x-ray system of claim 8 wherein the predetermined time increments are a function of a difference in value between non-consecutive measurements of operational values.
11. The x-ray system of claim 1 wherein the modified predetermined parameter is an average of the predetermined parameter and the at least one operational value.
12. The x-ray system of claim 1 wherein the modified predetermined parameter is a median of the predetermined parameter and the at least one operational value.
13. The x-ray system of claim 1 wherein the modified predetermined parameter is a mean of the predetermined parameter and the at least one operational value.
14. The x-ray system of claim 1 wherein the modified predetermined parameter is one of a weighted calculated variation of an average, a mean or a median of the predetermined parameter and the at least one operational value.
15. The x-ray system of claim 1 wherein the modified predetermined parameter is a combination of a plurality of previously modified predetermined parameters from previous operations of the x-ray emitter and the at least one operational value.
16. The x-ray system of claim 1 wherein the controller determines a flawed operation of the x-ray system by comparing the at least one operational value to an average of previous modified predetermined parameters.
17. The x-ray system of claim 1 wherein the controller includes a look-up table to store the modified predetermined parameter.
18. A method for operating an x-ray system comprising the steps of:
providing an x-ray emitter including a first electrode and a second electrode, a high voltage supply electrically connected to the first electrode, a power supply electrically connected to the second electrode;
electrically connecting a controller to the high voltage supply and power supply to provide a predetermined dose rate from the x-ray emitter;
providing a predetermined parameter by the controller to the second electrode during operation of the x-ray emitter to generate the predetermined dose rate;
measuring at least one operative value of the second electrode corresponding to the predetermined parameter;
calculating a second predetermined parameter;
disregarding the at least one operational value in response to a flawed operation of the x-ray system and assigning the second predetermined parameter to be the second predetermined parameter from a previous operation of the x-ray system; and
the controller providing the second predetermined parameter to the second electrode during a subsequent operation of the x-ray emitter.
19. The method of claim 18 wherein the predetermined parameter is electrical power.
20. The method of claim 19 wherein the at least one operative value is a plurality of operational values, the plurality of operational values being statistically averaged and used to calculate the second predetermined parameter.
21. The method of claim 18 wherein the predetermined parameter is electrical current.
22. The method of claim 21 wherein the at least one operative value is a plurality of operational values, the plurality of operational values being statistically averaged and used to calculate the second predetermined parameter.
23. The method of claim 18 wherein the predetermined parameter is electrical voltage.
24. The method of claim 23 wherein the at least one operative value is a plurality of operational values, the plurality of operational values being statistically averaged and used to calculate the second predetermined parameter.
25. The method of claim 18 wherein the at least one operative value is measured at predetermined time increments.
26. The method of claim 25 wherein the predetermined time increments are a function of a difference in value between consecutive measurements of operational values.
27. The method of claim 25 wherein the predetermined time increments are a function of a difference in value between non-consecutive measurements of operational values.
28. The method of claim 18 wherein the second predetermined parameter is an average of the predetermined parameter and the at least one operational value.
29. The method of claim 18 wherein the second predetermined parameter is a median of the predetermined parameter and the at least one operational value.
30. The method of claim 18 wherein the second predetermined parameter is a mean of the predetermined parameter and the at least one operational value.
31. The method of claim 18 wherein the second predetermined parameter is one of a weighted calculated variation of an average, a mean or a median of the predetermined parameter and the at least one operational value.
32. The method of claim 18 wherein the second predetermined parameter is a combination of a plurality of previously modified predetermined parameters from previous operations of the x-ray emitter and the at least one operational value.
33. The method of claim 18 further comprising comparing the at least one operational value to a corresponding setpoint value to determine a flawed operation of the x-ray system.
34. The method of claim 18 wherein the controller includes a look-up table to store the second predetermined parameter.
35. An x-ray system comprising:
an x-ray emitter including an anode and a cathode;
a high voltage supply electrically connected to the anode;
a power supply electrically connected to the cathode;
a controller to control the high voltage supply and power supply to provide a predetermined dose rate from the x-ray emitter, the controller being configured to provide a predetermined filament parameter to the cathode during operation of the x-ray emitter to generate the predetermined dose rate;
wherein during operation of the x-ray emitter, at least one operational value of the cathode corresponding to the predetermined filament parameter is measured at predetermined time increments and combined with the predetermined filament parameter using an algorithm to obtain a modified predetermined filament parameter to be provided by the controller to the cathode during a subsequent operation of the x-ray emitter; and
the predetermined time increments are a function of a difference in value between one of consecutive measurements of operational values or non-consecutive measurements of operational values.