IP Library Granted Patent US 7,420,180
Granted Patent B2
US 7,420,180 · App. 11/699,366 · Granted Sep 2, 2008

Mass spectrometer and mass spectrometry

Assignee: Hitachi, Ltd.
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Quick Facts
Patent No.
US 7,420,180
App. No.
11/699,366
Granted
Sep 2, 2008
Kind
B2
Abstract

A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.

Claims (12)

1. A mass spectrometer comprising:

a first sample ion source;

a second sample ion source disposed to the downstream of the first sample ion source relative to the moving direction of the ions of the first sample ion source and at a pressure lower than that of the first sample ion source; and

mass spectrometric part disposed downstream of the second sample ion source to the moving direction of the ions of the second sample ion source, wherein

a first sample introduction port branched from a sample introduction channel is disposed to the first sample ion source and a second sample introduction port branched from the sample introduction channel is disposed to the second sample ion source.

2. A mass spectrometer according to claim 1 , comprising a controller for controlling the ionization of the sample by the first sample ion source and ionization of the sample by the second sample ionization source, wherein the controller selectively operates the first sample ion source and the second sample ion source.

3. A mass spectrometer according to claim 1 , wherein the flow rate of the sample introduced from the first sample introduction port to the first sample ion source is more than the flow rate of the sample introduced from the second sample introduction port to the second sample ion source.

4. A mass spectrometer according to claim 1 , wherein the flow rate of the sample introduced from the first sample introduction port to the first sample ion source is twice or more than the flow rate of the sample introduced from the second sample introduction port to the second sample ion source.

5. A mass spectrometer according to claim 1 , wherein the sample introduction channel is connected with a gas chromatographic column.

6. A mass spectrometer according to claim 5 , wherein a difference is provided between the length from the branch part of the sample introduction channel to the first sample introduction port and the length to the second sample introduction port, so that a sample ingredient eluted from the first sample introduction port is eluted from the second sample introduction port with a time delay by more than the peak width separated by gas chromatographic column.

7. A mass spectrometer according to claim 1 , wherein the first sample ionization source generates sample ions by atmospheric chemical ionization and the second sample ion source generates sample ions by electron impact ionization.

8. A mass spectrometer according to claim 7 , wherein the first sample ion source has a needle electrode for generating corona discharge and a lead-out electrode having an aperture and opposing to the needle electrode, and the first sample introduction port situates downstream of the lead-out electrode in the moving direction of the ions.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 30, 2007
From: YAMADA, MASUYOSHI; SUGA, MASAO; WAKI, IZUMI
To: HITACHI, LTD.
Reel/Frame 018864/0427 →
Priority Claims (1)
JP 2006-031585 · Feb 8, 2006 · national
Continuity (1)
Related Publication 20070181801A1 · Aug 9, 2007