Memory device testing to support address-differentiated refresh rates

1. A method comprising:

testing a dynamic random access memory (DRAM) device to identify (i) a first row of storage cells that retains data for a limited time that is shorter than a threshold retention time, and (ii) a second row of storage cells that retains data for an extended time that is substantially longer than the threshold retention time;

recording data indicative of locations of the first and second rows of storage cells in a non-volatile storage element.

2. The method of claim 1 wherein testing a dynamic random access memory (DRAM) device to identify the first row of storage cells comprises:

testing retention of rows of storage cells within the DRAM device in a first retention test to identify rows that fail to retain data over a first time interval;

testing retention of the rows that fail to retain data over the first time interval in a second retention test to identify at least one row that retains data over a second time interval that is shorter than the first time interval.

3. The method of claim 1 wherein recording data indicative of locations of the first and second rows of storage cells in a non-volatile storage device that is distinct from the DRAM device comprises recording addresses of the first and second rows of storage cells in the non-volatile storage device.

4. The method of claim 1 wherein recording data indicative of locations of the first and second rows of storage cells in a non-volatile storage device that is distinct from the DRAM device comprises recording data that indicates a pattern of addresses, the pattern of addresses including the addresses of the at least the first row of storage cells.

5. A method of testing a dynamic random access memory (DRAM) device that has N rows of storage cells and that requires, in at least one operating mode, at least N refresh commands to be received from an external source within a specified time interval, the method comprising:

testing retention of the rows in a first retention test to identify rows that fail to retain data over the specified time interval;

testing retention of the rows that fail to retain data over the specified time interval in a second retention test to identify rows that retain data over an abbreviated time interval, the abbreviated time interval being shorter than the specified time interval; and

testing retention of rows that retain data over the specified time interval in a third retention test to identify rows that retain data over an extended time interval, the extended time interval being longer than the specified time interval.

6. The method of claim 5 wherein the abbreviated time interval is substantially equal to half the specified time interval.

7. The method of claim 5 further comprising recording addresses of the rows that retain data over the abbreviated time interval in a non-volatile storage device that is distinct from the DRAM device.

8. The method of claim 5 further comprising recording addresses of the rows that retain data over the abbreviated time interval within the DRAM device.

9. The method of claim 5 wherein the extended time interval is substantially equal to twice the specified time interval.

10. The method of claim 5 further comprising recording addresses of the rows that retain data over the extended time interval and addresses of the rows that retain data over the abbreviated time interval in a non-volatile circuit.

11. The method of claim 10 wherein recording addresses of the rows that retain data over the extended time interval comprises recording addresses of N rows that retain data over an extended time interval for each row that retains data over the abbreviated time interval, N being an integer greater than one.

12. The method of claim 10 wherein recording addresses of the rows that retain data over the extended time interval and addresses of the rows that retain data over the abbreviated time interval in a non-volatile circuit comprises recording addresses of the rows that retain data over the extended time interval and addresses of the rows that retain data over the abbreviated time interval in a non-volatile circuit within the DRAM device.

13. The method of claim 10 wherein recording addresses of the rows that retain data over the extended time interval and addresses of the rows that retain data over the abbreviated time interval in a non-volatile circuit comprises recording addresses of the rows that retain data over the extended time interval and addresses of the rows that retain data over the abbreviated time interval in a non-volatile storage device that is distinct from the DRAM device.

14. A memory module comprising:

a substrate;

a plurality of dynamic random access memory (DRAM) devices mounted to the substrate including a first DRAM device having a plurality of rows of storage cells that retain data for at least a first retention time and a row of storage cells that retains data for a limited time that is shorter than the first retention time; and

a non-volatile storage device mounted to the substrate and having stored therein (i) data that indicates an address of the row of storage cells that retains data for a limited time that is shorter than the first retention time and (ii) data that indicates which of the plurality of DRAM devices contains the row of storage cells that retains data for a limited time that is shorter than the first retention time.

15. The memory module of claim 14 wherein the data that indicates an address of the row of storage cells that retains data for a limited time that is shorter than the first retention time comprises the address of the row of storage cells.

16. The memory module of claim 14 wherein the data that indicates the address of the row of storage cells that retains data for a limited time that is shorter than the first retention time comprises data that indicates a pattern of addresses, the pattern of addresses including the addresses of the row of storage cells that retains data for a limited time that is shorter than the first retention time.