IP Library Granted Patent US 7,453,065
Granted Patent B2
US 7,453,065 · App. 11/269,648 · Granted Nov 18, 2008

Sensor and image pickup device

Assignees: Canon Kabushiki Kaisha; Tokyo Institute of Technology
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Quick Facts
Patent No.
US 7,453,065
App. No.
11/269,648
Granted
Nov 18, 2008
Kind
B2
Abstract

A sensor for detecting a received electromagnetic wave comprising a first electrode, a second electrode and an amorphous oxide layer interposed between the first electrode and the second electrode.

Claims (6)

1. An image pickup device comprising:

a flexible substrate;

an X-ray sensor comprises a semiconductor layer, and the semiconductor layer comprises an amporphous oxide, arranged on the flexible substrate; and

a field effect transistor for reading a signal from the X-ray sensor, wherein:

the field effect transistor has an amorphous oxide as an active layer; and

the amorphous oxide comprises one of an oxide having an electron carrier concentration of less than 10 18 /cm 3 and an oxide whose electron mobility tends to increase with increasing electron carrier concentration.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 11, 2013
From: CANON KABUSHIKI KAISHA; TOKYO INSTITUTE OF TECHNOLOGY
To: CANON KABUSHIKI KAISHA; TOKYO INSTITUTE OF TECHNOLOGY; JAPAN SCIENCE AND TECHNOLOGY AGENCY
Reel/Frame 030776/0506 →
CORRECTIVE ASSIGNMENT TO CORRECT THE SECOND CONVEYING PARTY'S LAST NAME, PREVIOUSLY RECORDED AT REEL 017526 FRAME 0607. Recorded Sep 8, 2006
From: SAITO, KEISHI; HOSONO, HIDEO; KAMIYA, TOSHIO; NOMURA, KENJI
To: CANON KABUSHIKI KAISHA; TOKYO INSTITUTE OF TECHNOLOGY
Reel/Frame 018240/0024 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2006
From: SAITO, KEISHI; HOSONO, HID` O; KAMIYA, TOSHIO; NOMURA, KENJI
To: CANON KABUSHIKI KAISHA; TOKYO INSTITUTE OF TECHNOLOGY
Reel/Frame 017526/0607 →
Priority Claims (1)
JP 2004-326681 · Nov 10, 2004 · national
Continuity (1)
Related Publication 20060108529A1 · May 25, 2006