IP Library › Granted Patent US 747,227
Granted Patent S1
US 747,227 · App. 29/500,547 · Granted Jan 12, 2016

Thermogravimetric analyzer

Inventor: Hirohito Fujiwara (Tokyo, JP)
Assignee: Hitachi High-Tech Science Corporation
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 747,227
App. No.
29/500,547
Granted
Jan 12, 2016
Kind
S1
Claims (1)

The ornamental design for a thermogravimetric analyzer, as shown and described.

Assignments (2)
CHANGE OF NAME Recorded Jun 6, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 071510/0296 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 26, 2014
From: FUJIWARA, HIROHITO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033612/0263 →
Priority Claims (1)
JP 2014-004228 · Feb 28, 2014 · national