Asymmetrical random access memory cell, memory comprising asymmetrical memory cells and method to operate such a memory

1. An asymmetrical random access memory cell ( 1 ) comprising:

a first cross coupled inverter ( 2 ) having a first node ( 22 );

a second cross coupled inverter ( 3 ) having a second node ( 32 );

a pair of complementary bit-lines comprising a first bit-line blc), the first bit-line coupled to the first node; and a second bit line (blt), the second bit-line coupled to the second node;

the first bit-line being coupled to a first pass-transistor ( 21 );

the second bit-line being coupled to a second pass-transistor ( 31 ); wherein, the first cross coupled inverter ( 2 ) comprises a different switching threshold than the second cross coupled inverter such that the first and second cross coupled inverters provide asymmetrical physical behaviours; and wherein the third pass-transistor ( 4 ) is coupled in series to the first pass-transistor ( 21 ) between the first node and the first bit-line (blc).

2. The asymmetrical random access memory cell according to claim 1 wherein, the first and third pass-transistors ( 21 , 4 ) each have a lower threshold voltage than the second pass-transistor ( 31 ).

3. The asymmetrical random access memory cell according to claim 1 , wherein, the first and second pass-transistors ( 21 , 31 ) are each driven by a single word-line (wl).

4. The asymmetrical random access memory cell according to claim 1 , wherein the third pass-transistor ( 4 ) is coupled to a write select line (wbsel) which is generated by a driver circuit ( 6 ), the write select line drives the third pass-transistor during a write operation and does not drive the third pass-transistor during a read operation.

5. The asymmetrical random access memory cell according to claim 1 , wherein, the first bit-line (blc) is coupled to ground.

6. The asymmetrical random access memory cell of claim 1 wherein the first bit-line (blc) is coupled to a supply voltage.

7. A random access memory comprising a plurality of asymmetrical random access memory cells; the plurality of asymmetrical random access memory cells each comprising:

a first cross coupled inverter ( 2 ) having a first node ( 22 );

a second cross coupled inverter ( 3 ) having a second node ( 32 );

a pair of complementary bit-lines comprising a first bit-line (blc), the first bit-line coupled to the first node; and a second bit line (blt), the second bit-line coupled to the second node;

the first bit-line being coupled to a first pass-transistor ( 21 ); the second bit-line being coupled to a second pass-transistor ( 31 ); wherein, the first cross coupled inverter ( 2 ) comprises a different switching threshold than the second cross coupled inverter such that the first and second cross coupled inverters exhibit asymmetrical physical behaviours; and

wherein a third pass-transistor ( 4 ) is coupled in series to the first pass-transistor ( 21 ) between the first node and the first bit-line (blc); wherein the plurality of asymmetrical random access memory cells are arranged in a plurality of columns and a plurality of rows; and wherein a driver circuit is provided to control each of the third pass-transistors ( 4 ).

8. The asymmetrical random access memory according to claim 7 , wherein, the first bit-line (blc) of at least one of the random access memory cells is coupled to ground.

9. The asymmetrical random access memory according to claim 7 , wherein the first bit-line (blc) of at least one of the random access memory cells is coupled to a supply voltage.

10. A method of operating a random access memory comprising the steps of:

providing a plurality of asymmetrical random access memory cells arranged in a plurality of rows and a plurality of columns;

the asymmetrical random access memory cells each comprising a first cross coupled inverter ( 2 ) having a first node ( 22 );

a second cross coupled inverter ( 3 ) having a second node ( 32 );

a pair of complementary bit-lines comprising a first bit-line (blc), the first bit-line coupled to the first node; and a second bit line (blt), the second bit-line coupled to the second node;

the first bit-line being coupled to a first pass-transistor ( 21 );

the second bit-line being coupled to a second pass-transistor ( 31 ); wherein, the first cross coupled inverter ( 2 ) comprises a different switching threshold than the second cross coupled inverter such that the first and second cross coupled inverters exhibit asymmetrical physical behaviours; and wherein a third pass-transistor ( 4 ) is coupled in series to the first pass-transistor ( 21 ) between the first node and the first bit-line (blc); and wherein a driver circuit is provided to drive the third pass-transistor ( 4 ); driving the third pass-transistor ( 4 ) during a write-cycle of a memory cell so that the first and second nodes ( 22 , 32 ) are connected to the first and second bit-lines (blc, blt) respectively; and wherein the driver circuit does not drive the third pass-transistor ( 4 ) during a read-cycle of the memory cell.

11. A method of operating a random access memory according to claim 10 , wherein when the first bit-line is coupled ground the driver circuit ( 6 ) drives the third pass-transistor ( 4 ), and when a ‘one’ is to be written to the random access memory the third pass-transistor ( 4 ) is driven by a write driver circuit ( 7 ) which generates a signal (wt).