IP Library Granted Patent US 7,541,818
Granted Patent B2
US 7,541,818 · App. 11/482,063 · Granted Jun 2, 2009

Method and apparatus of electromagnetic measurement

Assignee: Panasonic Corporation
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Quick Facts
Patent No.
US 7,541,818
App. No.
11/482,063
Granted
Jun 2, 2009
Kind
B2
Abstract

In order to direct a probe having directivity that a received band is widened in accordance with a measurement distance, toward a DUT, shift the received band of the probe in sequence, receive electromagnetic, and measure electromagnetic interference, a plurality of long and short measurement distances between the probe and the DUT are set, and measurement at the long measurement distance and measurement at the short measurement distance are performed plural times. Herein, the measurement at the short measurement distance is performed on a received band where electromagnetic interference is measured by the measurement at the long measurement distance. Thus, measurement of electromagnetic interference can be performed with high accuracy in a short time.

Claims (17)

1. A method of electromagnetic measurement, comprising:

directing an electromagnetic field sensor having directivity, such that a received band is widened in accordance with a measurement distance toward a device under test; and

receiving an electromagnetic wave from the device under test while shifting the received band in sequence to thereby detect electromagnetic interference,

wherein a plurality of long and short measurement distances between the device under test and the electromagnetic field sensor are set,

measurement at the long measurement distance is performed a plurality of times, and

measurement at the short measurement distance is performed only on a received band where electromagnetic interference is detected by the measurement at the long measurement distance.

2. The method of electromagnetic measurement according to claim 1 , wherein when the electromagnetic interference measured by the measurement at the long measurement distance is not increased by the measurement at the short measurement distance, the electromagnetic interference is determined as extraneous noise.

3. The method of electromagnetic measurement according to claim 1 , wherein the electromagnetic interference to be measured is at least one of a frequency and an intensity of an electromagnetic wave in an electromagnetic near field.

4. A method for measuring electromagnetic interference, comprising:

providing an electromagnetic field sensor having a directional detection field, such that a detection surface area of a test device increases as the electromagnetic field sensor moves farther away from the test device,

setting the electromagnetic field sensor a first distance from the test device,

detecting electromagnetic interference from a plurality of detection areas on the test device,

setting the electromagnetic field sensor to a second distance from the test device shorter than the first distance from the test device,

detecting electromagnetic interference at the second distance only in the detection areas in which electromagnetic interference was detected at the first distance.

5. The method according to claim 4 , further comprising determining that electromagnetic interference is extraneous noise when the electromagnetic interference measured from a detection area at the second distance is not greater than the electromagnetic interference measured from the same detection area at the first distance.

6. The method according to claim 4 , wherein the electromagnetic interference is at least one of a frequency and an intensity of an electromagnetic wave in an electromagnetic near field.

7. The method according to claim 4 , wherein the first distance is not more than 50 mm and the second distance is not less than 5 mm.

Assignments (2)
CHANGE OF NAME Recorded Nov 21, 2008
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 021897/0588 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 26, 2006
From: KAJIWARA, SHOICHI; TANI, HIROYUKI; UEDA, YOICHIRO; YAMAMOTO, ATSUSHI; KOSAKA, HIROFUMI; IKEDA, KAZUHIKO
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 018305/0939 →
Priority Claims (2)
JP 2005-198441 · Jul 7, 2005 · national
JP 2005-358366 · Dec 13, 2005 · national
Continuity (1)
Related Publication 20070024293A1 · Feb 1, 2007