IP Library Granted Patent US 7,555,359
Granted Patent B2
US 7,555,359 · App. 11/539,468 · Granted Jun 30, 2009

Apparatus and method for correcting defects by friction stir processing

Assignee: Hitachi, Ltd
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Quick Facts
Patent No.
US 7,555,359
App. No.
11/539,468
Granted
Jun 30, 2009
Kind
B2
Abstract

A method for correcting surface and near surface defects in metal components in which the component is first inspected to identify both the site and size of a component defect. Thereafter, it is determined if the defect is correctable by friction stir processing and, if so, the defect is corrected by performing friction stir processing on the component at the site of the defect. Optionally, one of several different sized friction stir processing tools is selected as a function of the size of the defect.

Claims (42)

1. A method for correcting surface and near surface defects in components comprising the steps of:

inspecting the component to identify a site of a component defect,

determining if the defect is correctable by friction stir processing,

if so, transmitting information concerning the defect to a friction stir processing station, and

performing friction stir processing on the component at the site of the defect to thereby correct the defect.

2. The invention as defined in claim 1 wherein said determining step further comprises the step of determining the size of the defect and performing friction stir processing at the site of the defect only when the size and/or depth of the defect is less than a predetermined amount.

3. The invention as defined in claim 1 wherein said determining step further comprises the step of determining the size of the defect and further comprising the step of selecting a friction stir processing tool dimensioned as a function of the defect size and/or depth necessary to correct the defect.

4. The invention as defined in claim 1 wherein said performing step further comprises the step of calculating a path necessary to correct the defect and thereafter moving a friction stir processing tool along said path.

5. The invention as defined in claim 1 wherein said inspecting step comprises the step of x-ray inspection of the component.

6. The invention as defined in claim 1 wherein said inspecting step comprises the step of inspecting only a predefined portion of the component.

7. A method for correcting surface and near surface defects in at least two types of components, each type of component having a different shape, the method comprising the steps of:

identifying the type of the component,

inspecting the component to identify a site of a component defect,

determining if the defect is correctable by friction stir processing,

if so, transmitting information concerning the defect to a friction stir processing station,

placing the component in a clamping jig specific to the component type, and

performing friction stir processing on the component at the she of the defect to thereby correct the defect.

8. The invention as defined in claim 7 wherein said determining step further comprises the step of determining the size of the defect and performing friction stir processing at the she of the defect only when the size and/or depth of the defect is less than a predetermined amount.

9. The invention as defined in claim 7 wherein said determining step further comprises the step of determining the size and/or depth of the defect and further comprising the step of selecting a friction stir processing tool dimensioned as a function of the defect size necessary to correct the defect.

10. The invention as defined in claim 7 wherein said performing step further comprises the step of calculating a path necessary to correct the defect and thereafter moving a friction stir processing tool along said path.

11. The invention as defined in claim 7 wherein said inspecting step comprises the step of x-ray inspection of the component.

12. The invention as defined in claim 7 wherein said inspecting step comprises the step of inspecting only a predefined portion of the component.

13. A method for correcting surface and near surface defects in components comprising the steps of:

inspecting the component to identify a site and size and/or depth of a component defect,

determining if the defect is correctable by friction stir processing,

if so, transmitting information to a friction stir processing station to select a friction stir processing tool as a function of the size of the defect and thereafter perform friction stir processing on the component at the site of the defect with the selected tool and performing friction stir processing on the component at the site of the defect to thereby correct the defect.

14. The invention as defined in claim 13 wherein said determining step further comprises the step of determining the size of the defect and performing friction stir processing at the site of the defect only when the size of the defect is less than a predetermined amount.

15. The invention as defined in claim 13 wherein said performing step further comprises the step of calculating a path necessary to correct the defect and thereafter moving the selected friction stir processing tool along said path.

16. The invention as defined in claim 13 wherein said inspecting step comprises the step of x-ray inspection of the component.

17. The invention as defined in claim 13 wherein said inspecting step comprises the step of inspecting only a predefined portion of the component.

18. System for correcting surface and near surface defects in components comprising:

means for inspecting the component to determine a site and size and/or depth of the defect,

means for determining if the defect is sufficiently small that the defect can be corrected by friction stir processing,

means for transmitting information to a friction stir processing station to perform friction stir processing at the site of the defect if the defect is sufficiently small to be correctable by friction stir processing, and

means for performing friction stir processing on the component at the site of the defect to thereby correct the defect.

19. The invention as defined in claim 18 wherein said inspecting means comprises x-ray inspecting means.

20. The invention as defined in claim 18 and further comprising means for selecting a friction stir processing tool as a function of the defect size and/or depth.

21. The invention as defined in claim 18 and comprising means for rejecting the component if the defect is greater than a predetermined size and/or depth.

22. The invention as defined in claim 18 wherein said inspecting means comprises means for inspecting only a portion of the component.

23. The invention as defined in claim 18 and comprising means for identifying the type of component.

24. The invention as defined in claim 23 wherein said identifying means comprises means for identifying an RFID tag.

25. The invention as defined in claim 18 and further comprising a conveyor means for selectively transporting the component from said inspecting means to the friction stir processing station.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 6, 2006
From: BADARINARAYAN, HARSHA; HUNT, FRANK; OKAMOTO, KAZUTAKA
To: HITACHI, LTD.
Reel/Frame 018361/0605 →
Continuity (1)
Related Publication 20080154423A1 · Jun 26, 2008