IP Library Granted Patent US 7,635,889
Granted Patent B2
US 7,635,889 · App. 11/333,701 · Granted Dec 22, 2009

Semiconductor device, electronic device, and method of manufacturing semiconductor device

Assignee: Semiconductor Energy Laboratory Co., Ltd.
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Quick Facts
Patent No.
US 7,635,889
App. No.
11/333,701
Granted
Dec 22, 2009
Kind
B2
Abstract

Conductive layers having knots are adjacently formed with uniform distance therebetween. Droplets of the conductive layers are discharged to stagger centers of the droplets in a length direction of wirings so that the centers of the discharged droplets are not on the same line in a line width direction between the adjacent conductive layers. Since the centers of the droplets are staggered, parts of the conductive layers each having a widest line width (the widest width of knot) are not connected to each other, and the conductive layers can be formed adjacently with a shorter distance therebetween.

Claims (45)

1. A semiconductor device comprising:

a source electrode layer having a plurality of widths and curving in at least one portion, and

a drain electrode layer having a plurality of widths and curving in at least one portion,

wherein the source electrode layer is symmetrical along a centerline of the source electrode layer,

wherein the drain electrode layer is symmetrical along a centerline of the drain electrode layer, and

wherein side surfaces of the source electrode layer and the drain electrode layer provided adjacent to each other have curvatures in a same direction.

2. An semiconductor device according to claim 1 , wherein the semiconductor device is incorporated into a display device, a video camera, a digital camera, a personal computer, or a portable information terminal.

3. A semiconductor device according to claim 1 , wherein a distance between the source electrode layer and the drain electrode layer is uniform.

4. A semiconductor device comprising:

a source electrode layer in which width is continuously varied, and

a drain electrode layer in which width is continuously varied,

wherein side portions of the source electrode layer and the drain electrode layer each have a continuous wave shape, and

wherein side surfaces of the source electrode layer and the drain electrode layer provided adjacent to each other have curvatures in a same direction.

5. An semiconductor device according to claim 4 , wherein the semiconductor device is incorporated into a display device, a video camera, a digital camera, a personal computer, or a portable information terminal.

6. A semiconductor device according to claim 4 , wherein a distance between the source electrode layer and the drain electrode layer is uniform.

7. A semiconductor device comprising:

a source electrode layer in which width is continuously varied, and

a drain electrode layer in which width is continuously varied,

wherein side portions of the source electrode layer and the drain electrode layer each have a continuous wave shape,

wherein portions of the source electrode layer having widest widths are aligned with portions of the drain electrode layer having narrowest widths in a width direction of the source electrode layer and the drain electrode layer, and

wherein side surfaces of the source electrode layer and the drain electrode layer provided adjacent to each other have curvatures in a same direction.

8. A semiconductor device according to claim 7 wherein portions of the source electrode layer having narrowest widths are aligned with portions of the drain electrode layer having widest widths in a width direction of the source electrode layer and the drain electrode layer.

9. An semiconductor device according to claim 7 , wherein the semiconductor device is incorporated into a display device, a video camera, a digital camera, a personal computer, or a portable information terminal.

10. A semiconductor device comprising:

a gate electrode layer;

a gate insulating layer;

a semiconductor layer;

a source electrode layer; and

a drain electrode layer,

wherein the source and the drain electrode layers have a plurality of widths and curve in at least one portion,

wherein the source electrode layer is symmetrical along a centerline,

wherein the drain electrode layer is symmetrical along a centerline, and

wherein side surfaces of the source and drain electrode layers provided adjacent to each other have curvatures in a same direction.

11. An semiconductor device according to claim 10 , wherein the semiconductor device is incorporated into a display device, a video camera, a digital camera, a personal computer, or a portable information terminal.

12. A semiconductor device according to claim 10 , wherein a distance between the source and the drain electrode layers is uniform.

13. A semiconductor device comprising:

a gate electrode layer;

a gate insulating layer;

a semiconductor layer;

a source electrode layer; and

a drain electrode layer,

wherein widths of the source and the drain electrode layers are continuously varied, and

wherein side surfaces of the source and drain electrode layers provided adjacent to each other have curvatures in a same direction.

14. An semiconductor device according to claim 13 , wherein the semiconductor device is incorporated into a display device, a video camera, a digital camera, a personal computer, or a portable information terminal.

15. A semiconductor device according to claim 13 , wherein a distance between the source and the drain electrode layers is uniform.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 17, 2006
From: ISA, TOSHIYUKI; FUJII, GEN; MORISUE, MASAFUMI; KAWAMATA, IKUKO
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD
Reel/Frame 017486/0580 →
Priority Claims (1)
JP 2005-022214 · Jan 28, 2005 · national
Continuity (1)
Related Publication 20060170111A1 · Aug 3, 2006