Die design with integrated assembly aid
Methods and systems for inserting and replacing swaged probe pins in a lower die portion of a head having an array of micro-holes for receiving the probe pins are disclosed. The methods and systems include the following: swaged probe pins including substantially cylindrical ends and a swaged center portion; and an assembly aid film including an array of slotted holes, each of the slotted holes including a substantially round portion for receiving the substantially cylindrical ends of the swaged probe pins and slot portions for receiving the swaged center portion of the swaged probe pins. The array of slotted holes is configured to properly align the swaged probe pins with the array of micro-holes.
1. A method of aligning swaged probe pins in an array of micro-holes formed in a lower die portion of a die head assembly, said method comprising:
stacking an assembly aid film having slotted holes in a first position on top of said lower die portion so that round portions of said slotted holes are axially aligned with said array of micro-holes;
inserting swaged probe pins having cylindrical end portions and a swaged center portion through said slotted holes in said assembly aid film and said array of micro-holes in said lower die portion; and
lifting said assembly aid film to a second position by lifting it upwardly over said cylindrical end portion closest to said lower die portion and over said swaged center portion of each of said swaged probe pins; and
wherein in said second position, each of said slotted holes are offset from each of said array of micro-holes in said lower die portion.
2. A method according to claim 1 , further comprising:
stacking a second assembly aid film including an array of micro-holes on top of said swaged probe pins so that cylindrical end portions of said swaged probe pins opposite said lower die portion extend through said array of micro-holes in said second assembly aid film.
3. A method according to claim 2 , wherein each of said array of micro-holes of said second assembly aid film has a diameter that is selected so that each of said micro-holes in said lower die portion is substantially sealed when said swaged probe pins are inserted.
4. A method according to claim 1 , wherein at least one of said assembly aid film and said second assembly aid film is at least semi-transparent.