Power supply voltage detection circuit and semiconductor integrated circuit device
View Patent ↗A semiconductor integrated circuit device includes a first chip, a second chip to transmit and receive data to and from the first chip, and a through circuit provided in the first chip to transfer a clock signal and a test signal to the second chip. The clock signal and the test signal is inputted from an external device. The through circuit adjusts timing relation between the clock signal and the test signal based on a timing adjust signal. The timing adjust signal is inputted from the external device.
1. A semiconductor integrated circuit device comprising:
a first chip;
a second chip to transmit and receive data to and from the first chip; and
a through circuit provided in the first chip to transfer a clock signal and a test signal to the second chip, the clock signal and the test signal being inputted from an external device;
wherein the through circuit adjusts timing relation between the clock signal and the test signal based on a timing adjust signal, the timing adjust signal being inputted from the external device.
2. The semiconductor integrated circuit device according to claim 1 , wherein the through circuit adjusts the output timing of the test signal such that the test signal satisfies specified values for a set-up time and a hold time with respect to the rising edge or the falling edge of the clock signal.
3. The semiconductor integrated circuit device according to claim 2 , wherein the through circuit comprises:
a flip-flop circuit to retain the test signal based on the clock signal; and
a timing adjust circuit to adjust timing relation of the clock signal and the test signal based on the timing adjust signal, and output the adjusted test signal to the flip-flop circuit; and
wherein the timing adjust signal is controlled by the external device; and the timing correction circuit searches for a pass range for the timing adjust signal to satisfy the specified values for the set-up time and the hold time with respect to the clock signal, and sets the output timing of the test signal based on the pass range.
4. The semiconductor integrated circuit device according to claim 2 , wherein the through circuit becomes the operation state in the operation verification test for the second chip, and becomes the non-operation state in states other than the operation verification test for the second chip.
5. The semiconductor integrated circuit device according to claim 2 , wherein the first chip is a logic chip, and the second chip is a memory chip.
6. The semiconductor integrated circuit device according to claim 1 , wherein the through circuit comprises:
a flip-flop circuit to retain the test signal based on the clock signal; and
a timing adjust circuit to adjust timing relation of the clock signal and the test signal based on the timing adjust signal, and output the adjusted test signal to the flip-flop circuit; and
wherein the timing adjust signal is controlled by the external device; and the timing correction circuit searches for a pass range for the timing adjust signal to satisfy the specified values for the set-up time and the hold time with respect to the clock signal, and sets the output timing of the test signal based on the pass range.
7. The semiconductor integrated circuit device according to claim 6 , wherein the timing correction circuit corrects the delay time of the test signal by using a time value at or near the center of the pass range.
8. The semiconductor integrated circuit device according to claim 7 , wherein the through circuit becomes the operation state in the operation verification test for the second chip, and becomes the non-operation state in states other than the operation verification test for the second chip.
9. The semiconductor integrated circuit device according to claim 7 , wherein the first chip is a logic chip, and the second chip is a memory chip.
10. The semiconductor integrated circuit device according to claim 6 , wherein the through circuit becomes the operation state in the operation verification test for the second chip, and becomes the non-operation state in states other than the operation verification test for the second chip.
11. The semiconductor integrated circuit device according to claim 6 , wherein the first chip is a logic chip, and the second chip is a memory chip.
12. The semiconductor integrated circuit device according to claim 1 , wherein the through circuit becomes the operation state in the operation verification test for the second chip, and becomes the non-operation state in states other than the operation verification test for the second chip.
13. The semiconductor integrated circuit device according to claim 12 , wherein the first chip is a logic chip, and the second chip is a memory chip.
14. The semiconductor integrated circuit device according to claim 1 , wherein the first chip is a logic chip, and the second chip is a memory chip.