IP Library Granted Patent US 7,796,067
Granted Patent B2
US 7,796,067 · App. 12/317,314 · Granted Sep 14, 2010

Curvature correction methodology

Assignee: Standard Microsystems Corporation
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Quick Facts
Patent No.
US 7,796,067
App. No.
12/317,314
Granted
Sep 14, 2010
Kind
B2
Abstract

A method is provided to produce an error corrected digital output from a temperature measurement system that generates digital outputs representative of the output of one or more temperature sensors. In an embodiment of the invention the method comprises: storing in a plurality of memory locations corresponding error correction data, with each memory location having a correlation to a corresponding range of the digital outputs; utilizing each digital output to identify a corresponding one of the memory locations; accessing the corresponding one memory location to obtain error correction data specific to the digital output; and utilizing the error correction data specific to the digital output to correct the digital output, whereby an error corrected digital output is generated.

Claims (63)

1. A method for providing an error corrected digital output from a temperature measurement system generating digital outputs representative of the output of one or more temperature sensors, said method comprising:

storing in a plurality of memory locations corresponding error correction data, each of said memory locations having a correlation to a corresponding range of said digital outputs;

utilizing each of said digital outputs to identify a corresponding one of said memory locations;

accessing said corresponding one memory location to obtain error correction data specific to each of said digital outputs;

establishing said error correction data from a piece-wise linear approximation of a characteristic error curve for said temperature measurement system;

said characteristic error curve is determined from a plurality of error curves obtained from a statistically significant number of measurement systems; and

utilizing said error correction data specific to each of said digital outputs to correct each said digital output, whereby error corrected digital outputs are generated.

2. A method in accordance with claim 1 , comprising:

providing circuitry to operate on each said digital output with said error correction data to generate said error corrected digital outputs.

3. A method in accordance with claim 1 , comprising:

providing offset data and slope data as said error correction data.

4. A method in accordance with claim 1 , comprising:

providing said temperature measurement system on a single integrated circuit.

5. A method in accordance with claim 4 , comprising:

providing circuitry on said integrated circuit to operate on each said digital output with said error correction data to generate said corrected digital output.

6. A method in accordance with claim 5 , comprising:

providing offset data and slope data as said error correction data.

7. A method in accordance with claim 1 , comprising:

establishing a plurality of linear segments of said piece-wise linear approximation, said linear segments being determined from predetermined acceptable error limits; and

utilizing each segment of said plurality of linear segments to determine corresponding said error correction data.

8. A method in accordance with claim 4 , comprising:

providing at least one temperature sensor on said integrated circuit.

9. A method in accordance with claim 4 , comprising:

providing an input to said integrated circuit for coupling to a temperature sensor external to said integrated circuit.

10. A method for providing an error corrected digital output from a temperature measurement system generating digital outputs representative of the output of one or more temperature sensors, said method comprising:

providing a plurality of error correction information sets for said measurement system;

generating said plurality of error correction information sets by:

producing a typical error curve;

providing a piece-wise linear representation of said typical error curve comprising a plurality of segments; and

minimizing the number of said segments in said piece-wise linear representation to achieve a predetermined acceptable error; and

utilizing said segments to generate error correction information sets;

storing said plurality of error correction information sets in a corresponding plurality of memory locations;

associating each of each of said memory locations to a corresponding range of said digital outputs;

utilizing each said digital output to identify a corresponding one of said memory locations;

accessing said corresponding one memory location to obtain a corresponding said error correction information set; and

utilizing said corresponding error correction data set to correct said digital output, whereby an error corrected digital output is generated.

11. A method in accordance with claim 10 , comprising:

utilizing said digital output to access a particular corresponding segment error correction information set to correct said digital output.

12. A method in accordance with claim 11 comprising:

providing a memory for storing said plurality of error correction information sets in a plurality of corresponding locations; and

storing each said error correction information set in a predetermined location that has a correlation to its corresponding said segment.

13. A method in accordance with claim 12 , comprising;

utilizing each said digital output to access a corresponding memory location based upon a corresponding said segment.

14. A method in accordance with claim 12 , comprising:

providing said temperature measurement system on a single integrated circuit.

15. A method in accordance with claim 14 , comprising:

providing circuitry on said integrated circuit to operate on each said digital output with said error correction data to generate said corrected digital output.

16. A method in accordance with claim 15 , comprising:

providing offset data and slope data as said error correction data.

17. A method in accordance with claim 10 , comprising:

providing said temperature measurement system on a single integrated circuit.

18. A method in accordance with claim 17 , comprising:

providing circuitry on said integrated circuit to operate on each said digital output with said error correction data to generate said corrected digital output.

19. A method in accordance with claim 18 , comprising:

providing offset data and slope data as said error correction data.

20. A method for providing an error corrected digital output from a temperature measurement system generating digital outputs representative of the output of one or more temperature sensors, said method comprising:

storing in a plurality of memory locations corresponding error correction data, each of said memory locations having a correlation to a corresponding range of said digital outputs;

utilizing each of said digital outputs to identify a corresponding one of said memory locations;

accessing said corresponding one memory location to obtain error correction data specific to each of said digital outputs;

establishing said error correction data from a piece-wise linear approximation of a characteristic error curve for said temperature measurement system;

establishing a plurality of linear segments of said piece-wise linear approximation, said linear segments being determined from predetermined acceptable error limits; and

utilizing each segment of said plurality of linear segments to determine corresponding said error correction data; and

utilizing said error correction data specific to each of said digital outputs to correct each said digital output, whereby error corrected digital outputs are generated.

Continuity (2)
Provisional Application 6104320200 · Apr 8, 2008
Related Publication 20090251343A1 · Oct 8, 2009