IP Library Granted Patent US 7,838,874
Granted Patent B2
US 7,838,874 · App. 12/213,094 · Granted Nov 23, 2010

Light-emitting device, electronic device, and manufacturing method of light-emitting device

Assignee: Semiconductor Energy Laboratory Co., Ltd.
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Quick Facts
Patent No.
US 7,838,874
App. No.
12/213,094
Granted
Nov 23, 2010
Kind
B2
Abstract

The present invention provides a light-emitting element and a light-emitting device which have high contrast, and specifically, provides a light-emitting device whose contrast is enhanced, not by using a polarizing plate but using a conventional electrode material. Reflection of external light is suppressed by provision of a light-absorbing layer included between a non-light-transmitting electrode and a light-emitting layer. As the light-absorbing layer, a layer is used, which is obtained by adding a halogen atom into a layer including an organic compound and a metal oxide. Further, the light-absorbing layer is formed also over a region in which a thin film transistor for driving a light-emitting element is formed, a region in which a wiring is formed, and the like, and thus light is extracted from the side opposite to the region in which the TFT is formed, thereby reducing reflection of external light.

Claims (52)

1. A light-emitting device comprising:

a substrate;

an anode formed over the substrate;

a light-emitting layer formed over the anode;

a cathode formed over the light-emitting layer;

a light-absorbing layer formed between the anode and the light-emitting layer, the light-absorbing layer comprising metal oxide, organic compound, and halogen,

wherein the anode is a non-light-transmitting electrode, and

wherein the cathode is a light-transmitting electrode.

2. The light-emitting device according to claim 1 , wherein the metal oxide is one selected from the group consisting of vanadium oxide, molybdenum oxide, niobium oxide, rhenium oxide, tungsten oxide, ruthenium oxide, titanium oxide, chromium oxide, zirconium oxide, hafnium oxide, and tantalum oxide.

3. The light-emitting device according to claim 1 , wherein the organic compound is a hole-transporting material.

4. The light-emitting device according to claim 1 , wherein the halogen is fluorine.

5. The light-emitting device according to claim 1 , further comprising:

a thin film transistor over the substrate, electrically connected to the anode, and

wherein the light-absorbing layer is formed over the thin film transistor.

6. An electronic device comprising the light-emitting device according to claim 1 .

7. The light-emitting device according to claim 1 , wherein the light-absorbing layer is in contact with the anode.

8. A light-emitting device comprising:

a substrate;

a cathode formed over the substrate;

a light-emitting layer formed over the cathode;

an anode formed over the light-emitting layer;

a light-absorbing layer formed between the light-emitting layer and the anode, the light-absorbing layer comprising metal oxide, organic compound, and halogen,

wherein the cathode is a light-transmitting electrode, and

wherein the anode is a non-light-transmitting electrode.

9. The light-emitting device according to claim 8 , wherein the metal oxide is one selected from the group consisting of vanadium oxide, molybdenum oxide, niobium oxide, rhenium oxide, tungsten oxide, ruthenium oxide, titanium oxide, chromium oxide, zirconium oxide, hafnium oxide, and tantalum oxide.

10. The light-emitting device according to claim 8 , wherein the organic compound is a hole-transporting material.

11. The light-emitting device according to claim 8 , wherein the halogen is fluorine.

12. The light-emitting device according to claim 8 , further comprising:

a thin film transistor over the substrate, electrically connected to the cathode, and

wherein the light-absorbing layer is formed over the thin film transistor.

13. An electronic device comprising the light-emitting device according to claim 8 .

14. The light-emitting device according to claim 8 , wherein the light-absorbing layer is in contact with the anode.

15. A manufacturing method of a light-emitting device, comprising the steps of:

forming a first electrode having a non-light-transmitting property;

forming a film comprising a metal oxide and an organic compound, by a co-evaporation method, over the first electrode;

adding a halogen into the film comprising the metal oxide and the organic compound;

forming a light-emitting layer over the film comprising the metal oxide and the organic compound, after the step of adding the halogen; and

forming a second electrode having a light-transmitting property, over the light-emitting layer.

16. The manufacturing method of the light-emitting device according to claim 15 , further comprising the steps of:

forming a thin film transistor, before the step of forming the first electrode,

wherein the film comprising the metal oxide and the organic compound is formed over the thin film transistor.

17. The manufacturing method of the light-emitting device according to claim 15 , wherein the halogen is added by an ion implantation method.

18. A manufacturing method of a light-emitting device, comprising the steps of:

forming a first electrode having a light-transmitting property;

forming a light-emitting layer, over the first electrode; and

forming a film comprising a metal oxide and an organic compound, by a co-evaporation method, over the light-emitting layer;

adding a halogen into the film comprising the metal oxide and the organic compound;

forming a second electrode having a non-light-transmitting property, over the film comprising the metal oxide and the organic compound, after the step of adding the halogen.

19. The manufacturing method of the light-emitting device according to claim 18 , further comprising the steps of:

forming a thin film transistor, before the step of forming the first electrode,

wherein the film comprising the metal oxide and the organic compound is formed over the thin film transistor.

20. The manufacturing method of the light-emitting device according to claim 18 , wherein the halogen is added by an ion implantation method.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 13, 2008
From: IBE, TAKAHIRO; IKEDA, HISAO; KOEZUKA, JUNICHI; KATO, KAORU
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 021146/0057 →
Priority Claims (1)
JP 2007-157434 · Jun 14, 2007 · national
Continuity (1)
Related Publication 20080308794A1 · Dec 18, 2008