Active matrix substrate, display device, and active matrix substrate inspecting method
By feeding inspection signals independent from each other to upper first and second gate lead inspection lines ( 52 b, 52 c ), respectively, while maintaining the upper gate-side switching elements ( 40 c ) in an ON state, any short circuit between adjacent gate lines ( 40 ) of upper gate lines ( 40 ) and the like can be detected. By feeding inspection signals independent from each other to lower first and second gate lead inspection lines ( 53 b, 53 c ), respectively, while maintaining lower gate-side switching elements ( 40 c ′) in an ON state, any short circuit between adjacent gate lines ( 40 ) of lower gate lines ( 40 ) and the like can be detected. By feeding inspection signals independent from each other to source lead inspection lines ( 55 ) while maintaining source-side switching elements ( 41 ) in an ON state, any short circuit between adjacent ones of source lines ( 41 ) and the like can be detected.
1. An active matrix substrate, comprising:
a plurality of first lines formed parallel with one another in a display area;
a plurality of second lines formed parallel with one another so as to cross the first lines in the display area; and
a plurality of terminals formed in a mounting area,
wherein the plurality of first lines, having first ends on one side and second ends on the other side, include a first group of the first lines that are adjacent to one another and whose first ends serve as input ends for a driving signal, and a second group of the first lines that are adjacent to one another and whose second ends serve as input ends for a driving signal,
the active matrix substrate further comprising:
a first lead-out line that connects the first ends of the first lines of the first group with the terminals;
a second lead-out line that connects the second ends of the first lines of the second group with the terminals;
first switching elements connected with the second ends of the first lines of the first group;
second switching elements connected with the first ends of the first lines of the second group;
a third lead-out line that connects the first ends of the second lines with the terminals;
third switching elements connected with the second lines or the third lead-out line;
a first switching element control line through which an ON/OFF control signal can be fed to the first switching elements;
a second switching element control line through which an ON/OFF control signal can be fed to the second switching elements; and
a third switching element control line through which an ON/OFF control signal can be fed to the third switching elements;
a first inspection line through which an inspection signal can be fed to the first switching elements that are not adjacent to one another, among the first switching elements connected with the first lines of the first group;
a second inspection line connected with the first switching elements that are not connected with the first inspection line and are not adjacent to one another, among the first switching elements connected with the first lines of the first group, so that an inspection signal can be fed to said first switching elements;
a third inspection line through which an inspection signal can be fed to the second switching elements that are not adjacent to one another, among the second switching elements connected with the first lines of the second group;
a fourth inspection line connected with the second switching elements that are not connected with the third inspection line and are not adjacent to one another, among the second switching elements connected with the first lines of the second group, so that an inspection signal can be fed to said second switching elements;
a fifth inspection line through which an inspection signal can be fed to the third switching elements that are not adjacent to one another, among the third switching elements connected with the second lines; and
a sixth inspection line connected with the third switching elements that are not connected with the fifth inspection line and are not adjacent to one another, among the third switching elements connected with the second lines, so that an inspection signal can be fed to said third switching elements.
2. The active matrix substrate according to claim 1 , wherein
the first lines of the first group are provided farther to the mounting area, as compared with the first lines of the second group, and
the second switching element control line, the third inspection line, and the fourth inspection line are provided closer to the display area, as compared with the first lead-out line.
3. The active matrix substrate according to claim 2 , further comprising:
first extension lines that are extended individually from the plurality of terminals connected with the first lead-out line;
a first line-break-inspection line to which each of the first extension lines is connected and through which an inspection signal can be fed;
second extension lines that are extended individually from the plurality of terminals connected with the second lead-out line; and
a second line-break-inspection line to which each of the second extension lines is connected and through which an inspection signal can be fed.
4. A method for inspecting the active matrix substrate according to claim 3 , comprising the steps of:
inspecting the first lines of the first group by feeding an inspection signal thereto through the first line-break-inspection line;
inspecting the first lines of the second group by feeding an inspection signal thereto through the second line-break-inspection line;
cutting the first extension lines and the second extension lines;
inspecting the first lines of the first group and the first lead-out line by feeding inspection signals independent from each other to the first inspection line and the second inspection line, respectively, while maintaining the first switching elements in an ON state;
inspecting the first lines of the second group and the second lead-out line by feeding inspection signals independent from each other to the third inspection line and the fourth inspection line, respectively, while maintaining the second switching elements in an ON state;
and inspecting the second lines by feeding inspection signals independent from each other to the fifth inspection line and the sixth inspection line, respectively, while maintaining the third switching elements in an ON state.
5. The active matrix substrate according to claim 1 , wherein the third switching elements are connected with the third lead-out line.
6. The active matrix substrate according to claim 1 , wherein the first lines are gate lines, and the second lines are source lines.
7. A display device comprising the active matrix substrate according to claim 1 .
8. The display device according to claim 7 , wherein the display device is a liquid crystal display device.