IP Library Granted Patent US 7,876,449
Granted Patent B2
US 7,876,449 · App. 12/654,685 · Granted Jan 25, 2011

Laser interferometer

Assignee: Mitutoyo Corporation
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Quick Facts
Patent No.
US 7,876,449
App. No.
12/654,685
Granted
Jan 25, 2011
Kind
B2
Abstract

A laser interferometer includes: a laser source for emitting a laser beam while stabilizing a center wavelength of the laser beam by modulating the laser beam using a modulation signal of a predetermined frequency; and a reference mirror and a measurement mirror for reflecting the laser beam. The laser interferometer further includes: a sampling unit for acquiring a sampling value by sampling interference light reflected by the reference mirror and the measurement mirror with a sampling frequency that is a multiple by an integer of two or more of a frequency of the modulation signal; and an average calculator for calculating an average value by averaging a time-series sampling value acquired by the sampling unit in accordance with the sampling frequency. The laser interferometer calculates a displacement of the measurement mirror based on the average value calculated by the average calculator.

Claims (7)

1. A laser interferometer, comprising: a laser source for emitting a laser beam, a reference surface provided at a predetermined position for reflecting the laser beam; and a measurement surface provided on a target object for reflecting the laser beam, the laser interferometer measuring a displacement of the target object by calculating a displacement of the measurement surface based on an interference light reflected by the reference surface and the measurement surface, wherein

the laser source emits the laser beam while stabilizing a center wavelength of the laser beam by modulating the laser beam using a modulation signal of a predetermined frequency,

the laser interferometer further comprising: a sampling unit that acquires a sampling value by sampling the interference light in accordance with a sampling frequency that is a multiple of an integer of two or more of a frequency of the modulation signal; and

an average calculator that calculates an average value by averaging the sampling value in time-series acquired by the sampling unit in accordance with the sampling frequency,

a displacement of the measurement surface being measured based on the average value calculated by the average calculator.

2. The laser interferometer according to claim 1 , wherein the average calculator calculates an average value every time the sampling unit acquires sampling values of a number corresponding to the sampling frequency.

3. The laser interferometer according to claim 1 , wherein the average calculator calculates a moving average value of intervals corresponding to the sampling frequency.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 29, 2009
From: OOZEKI, HIDEKAZU
To: MITUTOYO CORPORATION
Reel/Frame 023742/0973 →
Priority Claims (1)
JP 2009-004717 · Jan 13, 2009 · national
Continuity (1)
Related Publication 20100177318A1 · Jul 15, 2010