IP Library Granted Patent US 7,908,993
Granted Patent B2
US 7,908,993 · App. 11/466,665 · Granted Mar 22, 2011

Film forming apparatus, film forming method and method for manufacturing piezoelectric actuator

Assignees: Brother Kogyo Kabushiki Kaisha; National Institute of Advanced Science and Technology
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Quick Facts
Patent No.
US 7,908,993
App. No.
11/466,665
Granted
Mar 22, 2011
Kind
B2
Abstract

A film forming apparatus including a film forming chamber which forms a film, a jetting mechanism which jets aerosol containing material particles onto a substrate in the film forming chamber, a measuring chamber communicating with the film forming chamber, a measuring mechanism which measures a thickness of the film in the measuring chamber, a pressure adjusting mechanism which controls an internal pressure of the film forming chamber and the measuring chamber, a conveyor which transports the substrate between the film forming chamber and the measuring chamber, and a blocking section which blocks a communication between the film forming chamber and the measuring chamber. Accordingly, inside of the measuring chamber is maintained clean without being polluted with the aerosol, and the measurement precision can be maintained. In the film forming process, the film thickness can be easily and precisely measured, and fed back to the film forming condition.

Claims (23)

1. A film forming apparatus comprising:

a film forming chamber which forms a film;

a jetting mechanism which jets aerosol containing material particles onto a substrate in the film forming chamber to form a film formed of the material particles on the substrate; a measuring chamber communicating with the film forming chamber;

a measuring mechanism which measures a thickness of the film in the measuring chamber;

a pressure adjusting mechanism which is connected to the film forming chamber and the measuring chamber via a first valve and a second valve, respectively, and which controls an internal pressure of the film forming chamber and an internal pressure of the measuring chamber;

a conveyor which transports the substrate between the film forming chamber and the measuring chamber;

a blocking section which blocks a communication between the film forming chamber and the measuring chamber;

a pressure controller which controls the pressure adjusting mechanism and the valves; and

a blocking controller which controls the blocking section,

wherein, when the substrate is transported by the conveyor, the blocking controller controls the blocking section to communicate the film forming chamber and the measuring chamber, and the pressure controller closes the second valve between the pressure adjusting mechanism and the measuring chamber, opens the first valve between the pressure adjusting mechanism and the film forming chamber, and controls the pressure adjusting mechanism to make the internal pressure of the measuring chamber greater than the internal pressure of the film forming chamber.

2. The film forming apparatus according to claim 1 , wherein the measuring mechanism is a non-contact type mechanism, and arranged at outside of the measuring chamber.

3. The film forming apparatus according to claim 2 , wherein the measuring mechanism is an optical mechanism which is provided with a light emitting section which emits light to the substrate, and a light receiving section which receives light reflected from the substrate.

4. The film forming apparatus according to claim 1 , wherein a port for carrying the substrate in and out is provided in the measuring chamber.

5. The film forming apparatus according to claim 1 , wherein the conveyor is provided as a plurality of conveyors.

6. The film forming apparatus according to claim 1 , further comprising an intermediate chamber, provided between the film forming chamber and the measuring chamber, through which the film forming chamber and the measuring chamber communicate with each other, wherein the intermediate chamber is provided with a cleaner which removes contamination of the substrate.

7. The film forming apparatus according to claim 6 , wherein the cleaner is a gas cleaner which removes the contamination of the substrate by spraying gas to the substrate, and the gas cleaner serves also as a second pressure adjusting mechanism which adjusts a pressure of one of the film forming chamber and the measuring chamber communicating with the intermediate chamber by supplying gas to the intermediate chamber.

8. The film forming apparatus according to claim 7 , wherein the gas is same as gas which forms the aerosol.

9. The film forming apparatus according to claim 6 , wherein the blocking section is formed as a plurality of blocking sections provided in the intermediate chamber at two locations on a side of the film forming chamber and a side of the measuring chamber.

10. The film forming apparatus according to claim 9 , wherein the cleaner is arranged in the intermediate chamber between the blocking sections at the two locations.

11. The film forming apparatus according to claim 9 , wherein an intermediate chamber-pressure adjusting mechanism, which controls an internal pressure of a space partitioned by the blocking sections at the two locations, is arranged in the intermediate chamber.

12. The film forming apparatus according to claim 4 , further comprising an opening/closing portion which is provided in the measuring chamber and which opens/closes the port, and an open/close detector which detects an open/close state of the port by the opening/closing portion, wherein the blocking controller closes the blocking section when the open/close detector detects that the port is in an open state.

13. The film forming apparatus according to claim 9 , further comprising a position detector which is provided in the conveyor and which detects a position of the substrate on the conveyor; and a blocking controller which closes the blocking section on the side of the measuring chamber and opens the blocking section on the side of the film forming chamber when the position detector detects that the substrate is located between the film forming chamber and the intermediate chamber, and which closes the blocking section on the side of the film forming chamber and opens the blocking section on the side of the measuring chamber when the position detector detects that the substrate is located between the measuring chamber and the intermediate chamber.

14. The film forming apparatus according to claim 1 , further comprising a judging section which judges whether or not the thickness of the film measured by the measuring mechanism is smaller than a predetermined reference thickness; a jet condition adjusting section which adjusts a jet condition of the jetting mechanism on the basis of the thickness of the film measured by the measuring mechanism; and an apparatus controller which controls, the conveyor to transport the substrate from the measuring chamber to the film forming chamber, which controls the jet condition adjusting section to adjust the jet condition of the jetting mechanism in accordance with the thickness of the film and controls the jetting mechanism to jet the aerosol to the substrate transported to the film forming chamber according to the adjusted jet condition when the judging section judges that the film thickness is smaller than the reference thickness.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE 2ND ASSIGNEE AS NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AND ATTACHED ASSIGNMENT PREVIOUSLY RECORDED ON REEL 018497 FRAME 0500. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT OF 70% INTEREST TO 1ST ASSIGNEE AND 30% INTEREST TO 2ND ASSIGNEE IN THE INVENTION AND IN ANY US APPLNS AND PATENTS. Recorded Jul 30, 2008
From: YASUI, MOTOHIRO
To: BROTHER KOGYO KABUSHIKI KAISHA; NATIONAL INSTITUTE OF ADVANCED SCIENCE AND TECHNOLOGY
Reel/Frame 021318/0743 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 8, 2006
From: YASUI, MOTOHIRO
To: BROTHER KOGYO KABUSHIKI KAISHA; NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE
Reel/Frame 018497/0500 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 8, 2006
From: AKEDO, JUN
To: BROTHER KOGYO KABUSHIKI KAISHA; NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Reel/Frame 018497/0514 →
Priority Claims (1)
JP 2005-243130 · Aug 24, 2005 · national
Continuity (1)
Related Publication 20070044713A1 · Mar 1, 2007