Image sensor and method for manufacturing the same

1. A device comprising:

at least one transistor over a pixel region of a first substrate;

a first dielectric over the first substrate, the first dielectric including at least one first metal interconnection connected to the at least one transistor, respectively;

a crystalline semiconductor layer over the first dielectric;

a photodiode in the crystalline semiconductor layer formed in a region corresponding to the pixel region;

a dummy region in the crystalline semiconductor layer excepting the region of the photodiode;

at least one via contact penetrating the dummy region, and connected to the at least one first metal interconnection, wherein the at least one via contact comprises one of an n-type and a p-type impurity; and

a second dielectric including at least one second metal interconnection over the crystalline semiconductor layer, wherein the at least one second metal interconnection electrically connects the at least one via contact to the photodiode.

2. The device of claim 1 , wherein the photodiode is formed by implanting impurity ions into the crystalline semiconductor layer in the region corresponding to the pixel region.

3. The device of claim 1 , wherein the at least one via contact comprises metal.

4. The device of claim 1 , wherein the first substrate comprises one of a single crystalline silicon substrate and a substrate doped with at least one of p-type impurities and n-type impurities.

5. The device of claim 4 , wherein the crystalline semiconductor layer comprises a p-type layer.

6. The device of claim 1 , further comprising a passivation layer over the second dielectric including the at least one via contact.

7. The device of claim 1 , wherein the at least one transistor comprises one of a three transistor (3Tr) configuration, a four transistor (4Tr) configuration, and a five transistor (5Tr) configuration.

8. The device of claim 1 , wherein each of the at least one first and second metal interconnections comprises at least one of aluminum (Al), copper (Cu), cobalt (Co), and tungsten (W).

9. A method comprising:

forming a transistor over a pixel region of a first substrate; and then

forming a first dielectric including a first metal interconnection over the first substrate, the first metal interconnection being connected to the transistor; and then

forming a crystalline semiconductor layer over the first dielectric; and then

selectively implanting impurity ions into the crystalline semiconductor layer to form a photodiode in a first portion of the crystalline semiconductor layer corresponding to the pixel region, and to form a dummy region in a second portion of the crystalline semiconductor layer not corresponding to the pixel region; and then

forming a photoresist pattern over the crystalline semiconductor layer, the photoresist pattern exposing the dummy region corresponding to the first metal interconnection; and then

implanting conductive impurities into the dummy region and the first dielectric using the photoresist pattern as an ion implantation mask to form a via contact that penetrates the dummy region and is connected to the first metal interconnection; and then

forming a second dielectric including a second metal interconnection over the crystalline semiconductor layer, the second metal interconnection electrically connecting the via contact to the photodiode.

10. The method of claim 9 , wherein forming the crystalline semiconductor layer comprises:

preparing a second substrate including a crystalline semiconductor layer; and then

bonding the first and second substrates to each other; and then

separating the second substrate from the crystalline semiconductor layer to leave the crystalline semiconductor layer remaining over the first substrate.

11. The method of claim 10 , wherein the crystalline semiconductor layer comprises a p-type layer.

12. The method of claim 9 , wherein forming the via contact comprises:

forming a photoresist pattern over the crystalline semiconductor layer, the photoresist pattern selectively exposing the dummy region corresponding to the first metal interconnection; and then

selectively etching the dummy region and the first dielectric using the photoresist pattern as an etch mask to form a via hole exposing the first metal interconnections; and then

depositing a metallic material in the via hole.

13. The method of claim 12 , wherein the metallic material comprises at least one of aluminum (Al), copper (Cu), cobalt (Co), and tungsten (W).

14. The method of claim 9 , wherein the conductive impurity comprises one of an n-type impurity and a p-type impurity.

15. The method of claim 9 , further comprising forming a passivation layer over the second dielectric including the second metal interconnection.

16. The method of claim 9 , wherein the photodiode is formed by implanting impurities into the first portion of the crystalline semiconductor layer to form one of a p-n junction and an n-p junction.

17. The method of claim 9 , wherein forming the transistor comprises forming at least one of a three transistor (3Tr) configuration, a four transistor (4Tr) configuration, and a five transistor (5Tr) configuration.

18. The method of claim 9 , wherein the first substrate comprises one of a single crystalline silicon substrate and a substrate doped with at least one of p-type impurities and n-type impurities.