Nonvolatile memory device and program method with improved pass voltage window

1. A memory device, comprising:

a memory cell array comprising a plurality of memory cells arranged in relation to a plurality of word lines including a selected word line and a plurality of non-selected word lines, and a plurality of bit lines;

a high voltage generator configured to generate a program voltage applied to the selected word line, a pass voltage applied to at least one of the non-selected word lines adjacent to the selected word line, and a local voltage applied to at least one of the non-selected word lines in a local self-boosting scheme; and

control logic configured to control the generation of the program voltage, such that the program voltage is incrementally increased during a program operation, and further configured to control the generation of the pass voltage, such that the pass voltage is incrementally increased in response to the program voltage, and still further configured to control the generation of the local voltage to decrease the local voltage in response to the increasing program voltage.

2. The memory device of claim 1 , wherein generation of the program voltage is controlled in relation to a defined Incremental Step Pulse Programming (ISPP).

3. The memory device of claim 1 , wherein the memory cell array comprises at least one memory cell string,

wherein the program voltage is applied to one memory cell in the memory cell string,

a first pass voltage is applied to an upper word line with respect to the one memory cell, and

a second pass voltage is applied to a lower word line with respect to the one memory cell.

4. The memory device of claim 3 , wherein the second pass voltage is greater than the first pass voltage, thereby preventing charge sharing between memory cells.

5. The memory device of claim 3 , wherein the control logic is further configured to divide the upper word line and the lower word line into a plurality of groups, and selectively apply the pass voltage and the local voltage to the plurality of groups.

6. The memory device of claim 3 , wherein the control logic is further configured to apply the pass voltage and the local voltage to respective memory cells in the memory cell string.

7. A program method for a memory device including a memory cell array comprising a plurality of memory cells arranged in relation to a plurality of word lines including a selected word line and a plurality of non-selected word lines, and a plurality of bit lines, a high voltage generator configured to generate a program voltage applied to the selected word line, a pass voltage applied to at least one of the non-selected word lines adjacent to the selected word line, and a local voltage applied during to at least one of the non-selected word lines in a local self-boosting scheme, and control logic configured to control operation of the memory cell array and the high voltage generator, wherein the program method comprises:

generating the program voltage to be incrementally increasing;

generating the pass voltage to be increasing in response to the increasing program voltage; and

generating the local voltage to be decreasing in response to the increasing program voltage.

8. The method of claim 7 , wherein generation of the program voltage is controlled in relation to a defined Incremental Step Pulse Programming (ISPP).

9. The method of claim 7 , wherein the pass voltage is incrementally increased in response to the program voltage.

10. The method of claim 7 , wherein the memory cell array comprises at least one memory cell string and the method further comprises:

applying the program voltage to one memory cell in the memory cell string,

applying a first pass voltage to an upper word line with respect to the one memory cell, and

applying a second pass voltage to a lower word line with respect to the one memory cell.

11. The method of claim 10 , wherein the second pass voltage is greater than the first pass voltage.

12. The method of claim 10 , further comprising:

dividing the upper word line and the lower word line into a plurality of groups; and

selectively apply the pass voltage and the local voltage to the plurality of groups.

13. The method of claim 10 , further comprising:

applying the pass voltage and the local voltage to respective memory cells in the memory cell string.

14. A computational system comprising a central processing unit (CPU) and a memory controller connected via a system bus, the memory controller being connected to and controlling the operation of a memory device,

wherein the memory device comprises:

a memory cell array comprising a plurality of memory cells arranged in relation to a plurality of word lines including a selected word line and a plurality of non-selected word lines, and a plurality of bit lines;

a high voltage generator configured to generate a program voltage applied to the selected word line, a pass voltage applied to at least one of the non-selected word lines adjacent to the selected word line, and a local voltage applied to at least one of the non-selected word lines in a local self-boosting scheme; and

control logic configured to control the generation of the program voltage, such that the program voltage is incrementally increased during a program operation, and further configured to control the generation of the pass voltage, such that the pass voltage is incrementally increased in response to the increasing program voltage, and still further configured to control the generation of the local voltage to decrease the local voltage in response to the program voltage.

15. The computational system of claim 14 , wherein the memory cell array comprises at least one memory cell string, the program voltage is applied to one memory cell in the memory cell string, a first pass voltage is applied to an upper word line with respect to the one memory cell, and a second pass voltage greater than the first pass voltage is applied to a lower word line with respect to the one memory cell.