Test system for adjusting a wireless communication device by impedance loading features
A test system for adjusting a wireless communication device by impedance loading features includes a power supply for generating a plurality of voltages, a test fixture coupled to the power supply for generating impedances corresponding to a plurality of impedance loading areas, a test equipment coupled to a test point of the wireless communication device via the test fixture for measuring a plurality of radio frequency characteristic sets of the wireless communication device, and a decision device coupled to the test equipment for determining an optimal impedance loading area of the wireless communication device according to the plurality of radio-frequency characteristic sets.
1. A test system for adjusting a wireless communication device by impedance loading features comprising:
a power supply for generating a plurality of voltages;
a test fixture coupled to the power supply for generating impedances corresponding to a plurality of impedance loading areas according to the plurality of voltages generated by the power supply;
a test equipment coupled to a test point of the wireless communication device via the test fixture for measuring a plurality of radio frequency characteristic sets of the wireless communication device; and
a decision device coupled to the test equipment for determining an optimal impedance loading area of the wireless communication device for adjusting the wireless communication device according to the plurality of radio frequency characteristic sets.
2. The test system of claim 1 , wherein the test fixture is designed according to impedance matching and voltage standing wave ratios (VSWR) corresponding to the plurality of impedance loading areas.
3. The test system of claim 2 , wherein the test fixture comprises:
an input terminal coupled to the test point of the wireless communication device;
an output terminal coupled to the test equipment;
a plurality of power terminals coupled to the power supply for receiving the plurality of voltages; and
a plurality of impedance units coupled to the input terminal, the output terminal, and the plurality of power terminals, each of the plurality of impedance unit generating a specific impedance according to a received voltage.
4. The test system of claim 3 , wherein each of the plurality of impedance units comprises a Positive Intrinsic Negative diode.
5. The test system of claim 4 , wherein the Positive Intrinsic Negative diode reveals an inductive character while operating in forward bias and reveals a capacitive character while operating in reverse bias.
6. The test system of claim 4 , wherein each of the plurality of impedance units further comprises a passive component coupled to the Positive Intrinsic Negative diode in parallel.
7. The test system of claim 6 , wherein the passive component is a resistor or an inductor.
8. The test system of claim 6 , wherein each of the plurality of impedance units further comprises a switch coupled to the Positive Intrinsic Negative diode and the resistor for controlling a connection between the Positive Intrinsic Negative diode and the passive component.
9. The test system of claim 8 , wherein the switch controls a connection between the Positive Intrinsic Negative diode and the passive component according to impedances corresponding to the plurality of impedance loading areas.
10. The test system of claim 3 , wherein the test fixture further comprises a plurality of radio-frequency chocks coupled between the plurality of power terminals and the plurality of impedance units.
11. The test system of claim 1 , wherein the plurality of impedance loading areas are generated according to a predefined operating frequency band corresponding to the wireless communication device.
12. The test system of claim 1 , wherein each of the plurality of radio frequency characteristic sets comprises characteristics of transmitting power, receiving sensitivity, and power consumption.
13. The test system of claim 1 , wherein impedance of the test equipment is 50Ω.
14. The test system of claim 13 , wherein the test equipment comprises a composite analyzer and a network analyzer.
15. The test system of claim 1 , wherein the decision device is utilized for selecting an optimal radio frequency characteristic from the plurality of radio frequency characteristic sets, and determining the optimal impedance loading area of the wireless communication device according to the impedance feature of the test fixture corresponding to the optimal radio frequency characteristic.
16. The test system of claim 1 , wherein the decision device is utilized for providing a basis for adjusting an antenna and an antenna matching circuit of the wireless communication device.