Adjustable test socket

1. A four-wall adjustable test socket for aligning an electronic device with an array of spring probes mounted in a test fixture plate, the four-wall adjustable test socket comprising:

a base plate secured to the test fixture plate;

a cam ring plate adjustably secured to the base plate, wherein the cam ring plate comprises:

a plurality of cam profile arcuate slots evenly positioned around the cam ring plate, wherein each cam profile arcuate slot defines a passageway through the cam ring plate, and

four adjustable wall members comprising at least a first wall member and a second wall member, wherein each adjustable wall member comprises a base and a nose, the first wall member comprising a first nose and the second wall member comprising a second nose, wherein each adjustable wall member is positioned between the base plate and the cam ring plate;

wherein the cam ring plate and the first wall member and the second wall member are configured such that a rotation of the cam ring plate relative to at least the first wall member causes a separation between the first nose and the second nose to vary as a function of the rotation.

2. The four-wall adjustable test socket of claim 1 , wherein the base plate is secured to the test fixture plate via a plurality of fasteners, wherein each fastener is located in a corner of the base plate.

3. The four-wall adjustable test socket of claim 1 , wherein the cam ring plate is adjustably secured to the base plate via a fastener extending through an arcuate slot in the base plate to an aperture in the cam ring plate.

4. The four-wall adjustable test socket of claim 1 , wherein at least one of the plurality of cam profile arcuate slots curve inwardly toward an inner edge of the cam ring plate wherein a first end of the cam profile arcuate slot is radially spaced farther from the inner edge than a second end of the cam profile arcuate slot.

5. The four-wall adjustable test socket of claim 1 , wherein the nose of each adjustable wall member comprises a beveled surface extending to a pocket wall.

6. The four-wall adjustable test socket of claim 1 , wherein the base of each adjustable wall member comprises a raised alignment stud.

7. The four-wall adjustable test socket of claim 6 , wherein the base of each adjustable wall member comprises a dowel pin that extends through the raised alignment stud and beyond a lower surface of the base.

8. The four-wall adjustable test socket of claim 7 , wherein a diameter of the dowel pin is approximately equal to a width of at least one of the cam profile arcuate slots.

9. The four-wall adjustable test socket of claim 7 , further comprising:

an adjustment handle attached to the cam ring plate, wherein the adjustment handle is configured to control a position of one or more of the adjustable wall members.

10. The four-wall adjustable test socket of claim 7 , wherein the base plate comprises a plurality of rectangular slots that extend radially outwardly from a device pocket opening in the base plate, wherein a raised alignment stud extends through one of the plurality of rectangular slots.

11. The four-wall adjustable test socket of claim 10 , wherein the adjustment handle is configured to move between a first position and a second position,

wherein when the handle is in a first position, each of the adjustable wall members is fully retracted and a device pocket has a first size,

wherein when the handle is in a second position, each of the adjustable wall members is fully extended and the device pocket has a second size,

wherein the first size is larger than the second size.

12. The four-wall adjustable test socket of claim 10 , wherein the adjustment handle is configured to be moved between a first position and a second position,

wherein movement of the adjustment handle positions one or more of the adjustable wall members, wherein the one or more adjustable wall members define a device pocket.