IP Library Assignment 048667/0482
Patent Assignment
Reel/Frame 048667/0482

Change of Name

Recorded: 2019-03-22 Pages: 7
Assignor
INTERCONNECT DEVICES, INC.
Executed: 2017-07-31
Assignee
SMITHS INTERCONNECT AMERICAS, INC.
THE CORPORATION TRUST COMPANY, CORPORATION TRUST CENTER, 1209 ORANGE STREET,, WILMINGTON,, DELAWARE, 19801
Covered Properties (25)
Probe Tip and Method for Making Electrical Contact with a Solder Ball Contact of an Integrated Circuir Device
Patent: 6,208,155 →
Application: 09/014,100 →
Probe with Tab Retainer
Patent: 6,104,205 →
Application: 09/030,980 →
Connector, Connector System and Method of Making a Connector
Patent: 6,042,387 →
Application: 09/049,802 →
Probe and Test Socket Assembly
Patent: 6,424,166 →
Application: 09/616,208 →
Electrical Contact Interface
Patent: 6,506,082 →
Application: 10/028,202 →
Contact Probe with Off-Centered Back-Drilled Aperture
Patent: 6,696,850 →
Application: 10/266,263 →
Multipath Interconnect with Meandering Contact Cantilevers
Patent: 7,217,138 →
Application: 11/125,035 →
Publication: US 2005/0196980
Eccentric Offset Kelvin Probe
Patent: 7,298,153 →
Application: 11/137,187 →
Publication: US 2006/0267601
Modular Semiconductor Package Testing Contactor System
Patent: 7,189,092 →
Application: 11/177,673 →
Publication: US 2006/0051995
Interconnect Assembly for a Probe Card
Patent: 7,217,139 →
Application: 11/198,995 →
Publication: US 2006/0035485
Probe with Contact Ring
Patent: 7,362,118 →
Application: 11/510,313 →
Publication: US 2008/0048701
Probe Array Wafer
Patent: 7,498,826 →
Application: 11/511,061 →
Publication: US 2008/0068034
Compressive Conductors for Semiconductor Testing
Patent: 7,728,611 →
Application: 11/671,942 →
Active Test Socket
Patent: 7,701,200 →
Application: 11/671,963 →
Adjustable Test Socket
Patent: 7,581,962 →
Application: 11/715,712 →
Publication: US 2007/0285106
Test Interconnect
Patent: 8,278,955 →
Application: 12/054,281 →
Publication: US 2009/0237097
Environmentally Sealed Contact
Patent: 7,798,867 →
Application: 12/269,235 →
Publication: US 2010/0120301
Adjustable Test Socket
Patent: 8,062,039 →
Application: 12/398,695 →
Publication: US 2009/0227125
Electrical Connector With Embedded Shell Layer
Patent: 8,506,307 →
Application: 12/959,038 →
Publication: US 2012/0142229
Interconnect System
Patent: 8,575,953 →
Application: 13/225,141 →
Publication: US 2011/0312229
Electrical Connector with Insulation Member
Patent: 8,758,066 →
Application: 13/365,931 →
Publication: US 2013/0203298
Insulated Metal Socket
Patent: 8,808,010 →
Application: 13/488,025 →
Publication: US 2012/0315775
Series Connector
Patent: 9,437,954 →
Application: 13/871,955 →
Publication: US 2014/0322988
Electrical Probe with Rotatable Plunger
Patent: 9,209,548 →
Application: 14/242,316 →
Publication: US 2015/0280344
Connectors
Patent: 9,373,909 →
Application: 14/746,661 →
Publication: US 2015/0372414