IP Library Granted Patent US 8,089,046
Granted Patent B2
US 8,089,046 · App. 12/233,805 · Granted Jan 3, 2012

Method and apparatus for calibrating mass flow controllers

Assignee: Applied Materials, Inc.
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Quick Facts
Patent No.
US 8,089,046
App. No.
12/233,805
Granted
Jan 3, 2012
Kind
B2
Abstract

A method for determining the flow rate of a gas includes measuring a first concentration of a calibration gas provided to the process chamber at a first pressure and temperature by directing infrared radiation into the process chamber and monitoring a first amount of infrared radiation absorbed by the calibration gas. A mixture of a second gas and the calibration gas is provided to the process chamber while maintaining the first pressure and temperature. A second concentration of the calibration gas in the mixture is measured by directing infrared radiation into the process chamber and monitoring a second amount of infrared radiation absorbed by the calibration gas. A flow rate of the second gas is calculated by comparing the first and second concentrations of the calibration gas. In one embodiment, the calibration gas and the second gas may not absorb the infrared radiation at the same wavelength.

Claims (36)

1. A method of determining the flow rate of a gas provided to a process chamber, comprising:

measuring a first concentration of a calibration gas provided to the process chamber at a first pressure and temperature by directing infrared radiation into the process chamber and monitoring a first amount of infrared radiation absorbed by the calibration gas;

providing a mixture of a second gas and the calibration gas to the process chamber while maintaining the first pressure and temperature;

measuring a second concentration of the calibration gas in the mixture by directing infrared radiation into the process chamber and monitoring a second amount of infrared radiation absorbed by the calibration gas; and

calculating a flow rate of the second gas by comparing the first and second concentrations of the calibration gas.

2. The method of claim 1 , further comprising:

comparing the flow rate of the second gas to a readback value of a mass flow controller providing the second gas to the process chamber; and

adjusting a calibration factor of the mass flow controller in response to the comparison.

3. The method of claim 1 , further comprising:

providing a mixture of a third gas and the calibration gas to the process chamber while maintaining the first pressure and temperature;

measuring a third concentration of the calibration gas in the mixture by directing infrared radiation into the process chamber and monitoring a third amount of infrared radiation absorbed by the calibration gas; and

calculating a flow rate of the third gas by comparing the first and third concentrations of the calibration gas.

4. The method of claim 3 , further comprising:

comparing the flow rate of the third gas to a readback value of a mass flow controller providing the third process gas to the process chamber; and

adjusting a calibration factor of the mass flow controller in response to the comparison.

5. The method of claim 1 , wherein the second gas either does not absorb infrared radiation or absorbs infrared radiation at a different wavelength than the calibration gas.

6. The method of claim 1 , wherein the calibration gas comprises silicon tetrafluoride (SiF 4 ), nitrogen trifluoride (NF 3 ), or carbon tetrafluoride (CF 4 ).

7. The method of claim 1 , wherein the infrared radiation is provided by a laser source.

8. A method of calibrating a plurality of mass flow controllers provided to a plurality of process chambers, comprising:

providing a single infrared radiation source to a plurality of process chambers, each process chamber having a plurality of mass flow controllers coupled thereto; and

calibrating at least one of the plurality of mass flow controllers of each process chamber by:

(a) measuring a first concentration of a calibration gas provided to the process chamber at a constant pressure and temperature by directing infrared radiation into the process chamber and monitoring a first amount of infrared radiation absorbed by the calibration gas;

(b) providing a mixture of a desired gas and the calibration gas to the process chamber while maintaining the constant pressure and temperature;

(c) measuring a second concentration of the calibration gas in the mixture by directing infrared radiation into the process chamber and monitoring a second amount of infrared radiation absorbed by the calibration gas;

(d) calculating a flow rate of the desired gas by comparing the first and second concentrations of the calibration gas; and

(e) comparing the calculated flow rate to a readback value of a mass flow controller providing the desired gas; and

(f) adjusting a calibration factor of the mass flow controller in response to the comparison;

wherein (a)-(f) are performed in each process chamber for each mass flow controller to be calibrated.

9. The method of claim 8 , wherein the desired gas either does not absorb infrared radiation or absorbs infrared radiation at a different wavelength than the calibration gas.

10. The method of claim 8 , wherein the calibration gas is different for each process chamber.

11. The method of claim 8 , wherein the calibration is performed serially for each process chamber.

12. The method of claim 8 , wherein the calibration is performed in parallel for each process chamber.

13. The method of claim 8 , wherein the infrared radiation source is a laser source.

14. The method of claim 13 , further comprising:

routing a signal provided by the infrared radiation source to and from each process chamber at a different pulse frequency for each chamber.

15. The method of claim 8 , wherein the calibration gas comprises silicon tetrafluoride (SiF 4 ), nitrogen trifluoride (NF 3 ), or carbon tetrafluoride (CF 4 ).

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2008
From: DAVIS, MATTHEW F.; LILL, THORSTEN B.; WALKER, QUENTIN E.
To: APPLIED MATERIALS, INC.
Reel/Frame 021556/0308 →
Continuity (1)
Related Publication 20100071438A1 · Mar 25, 2010