IP Library Granted Patent US 8,115,198
Granted Patent B2
US 8,115,198 · App. 11/916,161 · Granted Feb 14, 2012

Array of differentiated FETS having a nanotube or nanowire channel and corresponding electronic device, for the detection of analytes

Assignee: Thales and Ecole Polytechnique
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,115,198
App. No.
11/916,161
Granted
Feb 14, 2012
Kind
B2
Abstract

In an array R of field-effect transistors for detecting analytes, each transistor of the array comprises a gate G, a semiconductor nanotube or nanowire element NT connected at one end to a source electrode S and at another end to a drain electrode D, in order to form, at each end, a junction J 1 , J 2 with the channel. At least transistors FET 1,1 , FET 1,2 of the array are differentiated by a different conducting material (m 1 , m 2 ) of the source electrode S and/or drain electrode D.

Claims (40)

1. An array of field-effect transistors for the detection of analytes, each transistor of the array comprising:

a gate, a source electrode and a drain electrode, said electrodes being formed in a conducting material, and

a nanotube or nanowire semiconductor element forming a channel of a transistor, said element being connected at one end to the source electrode and at the other end to the drain electrode, said source electrode, and said drain electrode, respectively forming with the channel a first junction and a second junction,

wherein said array comprises at least two differentiated transistors,

wherein a first of said at least two differentiated transistors has a source and a drain formed of a first material,

wherein a second of said at least two differentiated transistors has a source and a drain formed of a second material, wherein said first material and said second material are different conductive materials,

said transistors each including an exposed detection zone comprising one or both of said first and second junctions.

2. The array of transistors as claimed in claim 1 , wherein:

each junction is formed by a first and a second material having a contact surface in between, wherein

one of first and second junctions of at least a first transistor, and a second transistor of the array are differentiated by the dimensions and/or shape of the contact surface between the first and second materials forming the junction, and wherein:

the first and second materials forming the first junction respectively comprise the conducting material of the source and the conducting material of the nanotube semi-conductor element of the channel of the first junction, and the first and second materials forming the second junction respectively comprise the conducting material of the drain and the conducting material of the nanotube semi-conductor element of the channel of the second junction.

3. The array of transistors as claimed in claim 1 , wherein at least said first junction formed with the source is exposed to the medium to be detected.

4. The array of transistors as claimed in claim 1 , wherein at least one transistor of the array includes a sensitive functionalization layer deposited on the semiconductor element of said at least one transistor.

5. The array of transistors as claimed in claim 4 , wherein said sensitive functionalization layer comprises a layer of polymer-type chemical molecules or enzymes.

6. The array of transistors as claimed in claim 4 , wherein all or some of the transistors of the array include a sensitive functionalization layer and the type of the sensitive layer can vary depending on the transistor.

7. The array of transistors as claimed in claim 1 , including a passivation layer with apertures corresponding to the detection zones of the array.

8. The array of transistors as claimed in claim 1 , each transistor of the array comprising:

a substrate forming a gate;

a dielectric layer on the substrate; and

a nanotube or nanowire semiconductor element, a source electrode and a drain electrode that are placed on the dielectric layer, the substrate forming the rear face, and said nanotube element, drain electrode and source electrode forming the active face.

9. The array as claimed in claim 8 , comprising at least two subarrays of transistors and a support on which said subarrays are mounted.

10. The array as claimed in claim 9 , wherein said subarrays are mounted on said support using the flip-chip technique.

11. The array as claimed in claim 10 , including a passivation layer with apertures corresponding to the detection zones of the array; wherein said support includes conducting tracks for connecting the gate of each of said subarrays.

12. The array as claimed in claim 8 , wherein the connection for the gate is provided in the active face via a hole etched in the dielectric layer.

13. The array of transistors as claimed in claim 1 , wherein the conductive materials of the drain and source electrodes are respectively metal, and wherein a first transistor and a second transistor are differentiated in that the metal of the source electrode and/or the drain electrode of the first transistor is different from the metal of the source electrode and/or the drain electrode of the first transistor.

14. An electronic analyte detection device capable of operating in a liquid or gaseous medium, comprising:

an array of field-effect transistors as claimed in claim 1 and

control means for applying a gate voltage, a drain voltage and a source voltage to transistors of said array in order to determine, for each of said transistors, a threshold voltage corresponding to a gate-source voltage value at which said transistor is turned on,

means for storing a corresponding matrix of conduction states, which includes the threshold voltages for each of said transistors, and

data processing means for delivering detection information according to said matrix.

15. The electronic analyte detection device as claimed in claim 14 , further including a heater for a hot operation mode.

16. The electronic analyte detection device as claimed in claim 14 , wherein at least one of the transistors of the array is free of a sensitive functionalization layer deposited on the semiconductor element of said transistor.

17. The electronic detection device as claimed in claim 14 , wherein:

said control means are configured so as to deliver a measure of the slope of the variation in current as a function of the reapplied gate-source voltage for each of said turned-on transistors,

the slopes of said transistors being stored in said matrix of conduction states, and

said data processing means being configured to deliver analyte concentration information on the basis of said slopes.

18. The electronic device as claimed in claim 14 , wherein the data processing means comprise one or more reference matrices and comparison means for comparing a matrix of conduction states with said reference matrices.

19. The electronic analyte detection device as claimed in claim 14 , wherein

the array of transistors is such that each junction is formed by a first and a second material having a contact surface in between, and wherein

one or both of first and second junctions of at least a first transistor and a second transistor of the array are differentiated by the dimensions and/or shape of the contact surface between the first and second materials forming the junction.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE THE ADDRESS OF THE SECOND ASSIGNEE SHOULD READ 91128 PALAISEAU CEDEX - FRANCE PREVIOUSLY RECORDED ON REEL 020183 FRAME 0133. ASSIGNOR(S) HEREBY CONFIRMS THE THE SECOND ASSIGNEE'S ADDRESS PREVIOUSLY READ ETABALISSEMENT PUBLIC, PALAISEAU CEDEX, FRANCE 92200. Recorded Apr 3, 2008
From: BONDAVALLI, PAOLO; LEGAGNEUX, PIERRE; LE BARNY, PIERRE; PRIBAT, DIDIER; NAGLE, JULIEN
To: THALES; ECOLE POLYTECHNIQUE
Reel/Frame 020752/0346 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 30, 2007
From: BONDAVALLI, PAOLO; LEGAGNEUX, PIERRE; LE BARNY, PIERRE; PRIBAT, DIDIER; NAGLE, JULIEN
To: THALES; ECOLE POLYTECHNIQUE
Reel/Frame 020183/0133 →
Priority Claims (1)
FR 05 05492 · May 31, 2005 · national
Continuity (1)
Related Publication 20080210987A1 · Sep 4, 2008