IP Library Granted Patent US 8,130,545
Granted Patent B2
US 8,130,545 · App. 12/938,435 · Granted Mar 6, 2012

Nonvolatile semiconductor storage device

Assignee: Kabushiki Kaisha Toshiba
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Quick Facts
Patent No.
US 8,130,545
App. No.
12/938,435
Granted
Mar 6, 2012
Kind
B2
Abstract

A nonvolatile semiconductor storage device capable of storing a plurality of bits of data in one memory cell by assigning multivalued data having a higher-order bit selected from one of a pair of data in a first unit and a lower-order bit selected from the other of the pair of data to each threshold voltage of the memory cell, wherein in a first write operation that processes data in the first unit, the logic of one of the higher-order bit and the lower-order bit is fixed, and two pieces of multivalued data that maximize the difference between the threshold voltages are assigned, thereby storing one bit of input data in the one memory cell in a pseudo binary state, and in a second write operation that processes data in a second unit larger than the first unit, a plurality of bits of input data is stored in the one memory cell in a multivalued state, and parity data for error correction in the second unit is stored in the memory cell.

Claims (18)

1. A nonvolatile semiconductor storage device, comprising:

a plurality of memory cells capable of reading and writing of data;

a flag storing part that stores flag data indicating which of multivalued data writing and binary data writing is performed for each predetermined cell region, which constitutes a part of the plurality of memory cells; and

an access range setting part that permits access to the whole of the corresponding cell region based on an external address in a case where the flag data indicates the multivalued data writing and permits access to a half of the corresponding cell region based on successive external addresses in an address range in a case where the flag data indicates the binary data writing.

2. The nonvolatile semiconductor storage device according to claim 1 , wherein the access range setting part has an address converting part that rearranges at least a part of a bit sequence constituting an external address in a case where the flag data indicates the binary data writing.

3. The nonvolatile semiconductor storage device according to claim 1 , further comprising:

a parity storing part that stores parity data used for error correction in a case where the flag data indicates the multivalued data writing,

wherein the flag storing part and the parity storing part are provided in a part of the plurality of memory cells.

4. The nonvolatile semiconductor storage device according to claim 2 , further comprising:

a parity storing part that stores parity data used for error correction in a case where the flag data indicates the multivalued data writing,

wherein the flag storing part and the parity storing part are provided in a part of the plurality of memory cells.

5. The nonvolatile semiconductor storage device according to claim 1 , wherein the size of the cell region in binary data writing is the size of a page, which is a unit of multivalued data writing, or the size of an erase block, which is an unit of data erasure of the plurality of memory cells.

6. The nonvolatile semiconductor storage device according to claim 2 , wherein the size of the cell region in binary data writing is the size of a page, which is a unit of multivalued data writing, or the size of an erase block, which is an unit of data erasure of the plurality of memory cells.

7. The nonvolatile semiconductor storage device according to claim 3 , wherein the size of the cell region in binary data writing is the size of a page, which is a unit of multivalued data writing, or the size of an erase block, which is an unit of data erasure of the plurality of memory cells.

8. The nonvolatile semiconductor storage device according to claim 4 , wherein the size of the cell region in binary data writing is the size of a page, which is a unit of multivalued data writing, or the size of an erase block, which is an unit of data erasure of the plurality of memory cells.

9. The nonvolatile semiconductor storage device according to claim 1 , wherein the size of the cell region in binary data writing is any size ranging from the size of a page, which is a unit of multivalued data writing, to the size of the whole of the plurality of memory cells.

10. The nonvolatile semiconductor storage device according to claim 2 , wherein the size of the cell region in binary data writing is any size ranging from the size of a page, which is a unit of multivalued data writing, to the size of the whole of the plurality of memory cells.

11. The nonvolatile semiconductor storage device according to claim 3 , wherein the size of the cell region in binary data writing is any size ranging from the size of a page, which is a unit of multivalued data writing, to the size of the whole of the plurality of memory cells.

Assignments (4)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043709/0035 →
Priority Claims (2)
JP 2007-300779 · Nov 20, 2007 · national
JP 2008-218153 · Aug 27, 2008 · national
Continuity (2)
Division 12272161 · Nov 17, 2008
Related Publication 20110055465A1 · Mar 3, 2011