Chemistry strip reader and method

1. A chemistry strip reader for analyzing chemistry strips, comprising:

a conveyor having a surface for supporting a plurality of chemistry strips in a plurality of imaging positions and for moving the chemistry strips through the imaging positions at discrete points in time;

a camera for capturing images of a field of view that includes the plurality of imaging positions and any of the chemistry strips therein, wherein the images are captured at the discrete points in time; and

a processor for determining reflectance values for each of the chemistry strips from the captured images at the discrete points in time;

wherein for each of the chemistry strips, the processor is further configured to calculate a concentration determination associated therewith by:

fitting the determined reflectance values for the chemistry strip to a curve defined by A exp[−B(t+t o )]+C, where A, B, C, and t o are fit parameters;

determining a first slope of the curve for t=−t o ; and

comparing the first slope with known first slopes for known analyte concentrations.

2. The chemistry strip reader of claim 1 , further comprising:

a plurality of calibration targets of known reflectance disposed in the field of view and adjacent the imaging positions.

3. The chemistry strip reader of claim 2 , wherein the processor is configured to determine reflectance of the calibration targets and to adjust the determined reflectance values for the chemistry strips in response to the detected reflectance of the calibration targets.

4. The chemistry strip reader of claim 1 , further comprising:

a plate disposed between the camera and the conveyor, wherein the plate includes apertures formed therein through which the camera captures the images of the plurality of imaging positions.

5. The chemistry strip reader of claim 4 , wherein the plate includes portions thereof between the apertures that form calibration targets of known reflectance.

6. The chemistry strip reader of claim 5 , wherein the processor is configured to determine reflectance of the calibration targets and to adjust the determined reflectance values for the chemistry strips in response to the detected reflectance of the calibration targets.

7. The chemistry strip reader of claim 1 , further comprising:

a light source configured to illuminate the field of view.

8. The chemistry strip reader of claim 7 , wherein the light source includes a plurality of LEDs to produce light of different colors of illumination.

9. A chemistry strip reader for analyzing chemistry strips, comprising:

a conveyor having a surface for supporting a plurality of chemistry strips in a plurality of imaging positions and for moving the chemistry strips through the imaging positions at discrete points in time;

a camera for capturing images of a field of view that includes the plurality of imaging positions and any of the chemistry strips therein, wherein the images are captured at the discrete points in time; and

a processor for determining reflectance values for each of the chemistry strips from the captured images at the discrete points in time;

wherein for each of the chemistry strips, the processor is further configured to calculate a concentration determination associated therewith by:

fitting the determined reflectance values for the chemistry strip to a curve defined by A exp[−B(t+t o )]+C, where A, B, C, and t o are fit parameters;

determining a first slope of the curve for t=−t o ;

comparing the first slope with known first slopes for given analyte concentrations;

determining an asymptotic value of the curve; and

comparing the asymptotic value with known asymptotic values for known analyte concentrations.

10. A method of analyzing a chemistry strip comprising:

capturing a plurality of images of a chemistry strip at discrete points in time using a camera;

determining reflectance values for the chemistry strip from the captured images using a processor;

fitting the determined reflectance values for the chemistry strip to a curve defined by A exp[−B(t+t o )]+C, where A, B, C, and t o are fit parameters, using the processor; and

calculating a concentration determination associated with the chemistry strip using the processor by:

determining a first slope of the curve for t=−t o , and

comparing the first slope with known first slopes for given analyte concentrations.

11. The method of claim 10 , wherein the calculating of the concentration determination further includes:

determining an asymptotic value of the curve; and

comparing the asymptotic value with known asymptotic values for known analyte concentrations.

12. A method of analyzing a chemistry strip comprising:

placing a chemistry strip on a support surface of a conveyor;

moving the conveyor surface to sequentially move the chemistry strip to a plurality of imaging positions at discrete times;

capturing an image of the chemistry strip at each of the imaging positions using a camera;

determining reflectance values for the chemistry strip from the captured images using a processor;

fitting the determined reflectance values for the chemistry strip to a curve defined by A exp[−B(t+t o )]+C, where A, B, C, and t o are fit parameters, using the processor; and

calculating a concentration determination associated with the chemistry strip using the processor by:

determining a first slope of the curve for t=−t o , and

comparing the first slope with known first slopes for given analyte concentrations.

13. The method of claim 12 , wherein the calculating of the concentration determination further includes:

determining an asymptotic value of the curve; and

comparing the asymptotic value with known asymptotic values for known analyte concentrations.