IP Library Granted Patent US 8,154,307
Granted Patent B2
US 8,154,307 · App. 12/233,421 · Granted Apr 10, 2012

Electronic circuit comprising a device to measure phase noise of an oscillating and/or resonant device

Assignees: STMicroelectronics S.A.; Centre National de la Recherche Scientifique
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,154,307
App. No.
12/233,421
Granted
Apr 10, 2012
Kind
B2
Abstract

An electronic circuit includes several (at least two) oscillating and/or resonant devices. The circuit uses a measuring device to measure the phase noise of one of the two oscillating/resonant devices. This measuring device is integrated on a chip on which the oscillating/resonant device to be measured is also integrated. The circuits and methods described find application in the area of radiofrequency/high frequency electronics RF/HF, in particular adapted to general public applications in mobile communication systems and/or to metrology.

Claims (66)

1. An electronic circuit comprising:

a first oscillating and/or resonant device configured to produce a first signal at a first oscillation frequency;

a second oscillating and/or resonant device configured to produce a second signal at a second oscillation frequency, wherein one of the first and second signals is used as a reference measurement; and

a measuring device configured to measure a phase noise of one of the first and second devices, said measuring device being integrated on an integrated circuit chip on which said one of the first and second devices whose phase noise is to be measured is also integrated, wherein the measuring device comprises:

an input path receiving said first signal;

an output path delivering an output signal;

a splitter circuit to split said first signal into two identical signals;

a first measuring pathway and a second measuring pathway in parallel, each pathway having an input connected to receive the identical signal from an output of the splitter circuit, and each pathway having an output connected to an input of a mixer circuit, the first measuring pathway including in series connection the second oscillating and/or resonant device, and the second measuring pathway comprising a phase-shifter circuit such that said output from the second measuring pathway to the mixer circuit is phase-shifted relative to said output from the first measuring pathway to the mixer circuit; and

a low-noise amplifier coupled to an output of the mixer circuit;

wherein the second measuring pathway comprises a third oscillating and/or resonant device in a series connection with the phase-shifter circuit.

2. The circuit according to claim 1 , wherein the measuring device also comprises a filtering circuit coupled between the output of the mixer circuit and an input of the low-noise amplifier.

3. The circuit according to claim 1 , wherein the measuring device comprises an additional measuring pathway which is switched to replace said first measuring pathway, the additional measuring pathway comprising a series connected fourth oscillating and/or resonant device.

4. The circuit according to claim 3 , further comprising switching circuitry between the first measuring pathway and the additional measuring pathway.

5. The circuit according to claim 1 , further comprising a digital cell with a digital signal processor DSP which receives digital data from an analog/digital converter ADC and delivers digital data to a digital/analog converter DAC.

6. The circuit according to claim 5 , wherein the digital signal processor comprises a data store configured to store measured phase noise, and a comparator configured to compare this measured phase noise with a reference phase noise, and a decision circuit configured to determine the phase noise behavior or development of the oscillating and/or resonant devices.

7. The circuit according to claim 5 , wherein the digital processor, the analog/digital converter, the digital/analog converter and the oscillating and/or resonant devices are components of a radiofrequency transmit/receive chain.

8. The circuit according to claim 7 , wherein the measuring device is configured to perform measurements of the phase noise of the oscillating and/or resonant devices during non-communicating time intervals of said chain using the elements present in this chain.

9. The circuit according to claim 1 , wherein at least one of the oscillating and/or resonant devices is an adjustable frequency oscillator having a relatively high overload factor at its oscillation frequency.

10. The circuit according to claim 9 , wherein the adjustable frequency oscillator is a bulk acoustic wave resonator BAW.

11. The circuit according to claim 10 , wherein the BAW resonator is fabricated on an acoustic-absorbent carrier, itself fabricated either by stacking of materials having different acoustic impedances on a substrate of the circuit, or on a membrane below which the substrate is etched.

12. The circuit according to claim 10 , wherein the BAW resonator is directly integrated on the integrated circuit chip, or said BAW resonator is fabricated on a different chip, then connected to the integrated circuit chip via connection means.

13. The circuit according to claim 1 , wherein the first oscillating and/or resonant device is one of a frequency synthesizer or a local oscillator or a voltage-controlled oscillator.

14. A phase error measurement circuit, comprising:

an oscillator configured to generate an oscillation signal at an oscillation frequency;

a splitter circuit configured to split said oscillation signal into first and second identical signals, the first identical signal applied to a first processing path and the second identical signal applied to a second processing path;

a resonant circuit having a resonant frequency substantially equal to the oscillation frequency coupled in series within the first processing path;

a phase shift circuit coupled in series within the second processing path;

a mixer having a first input connected to an output of the first processing path and a second input connected to an output of the second processing path, the mixer having an output;

a low-pass filter coupled to the output of the mixer and configured to generate a signal indicative of a phase noise of the resonant circuit; and

a feedback control loop having an input coupled to receive a signal from the first processing path prior to input to said mixer and an output coupled to the oscillator to tune operation of the oscillator such that the oscillation frequency is substantially equal to the resonant frequency.

15. The phase error measurement circuit of claim 14 further comprising a second resonant circuit having a resonant frequency coupled in series within the second processing path.

16. The phase error measurement circuit of claim 14 further comprising a third resonant circuit having a resonant frequency coupled in parallel with the resonant circuit of the first processing path.

17. The phase error measurement circuit of claim 16 further comprising a switching circuit configured to selectively choose one of the resonant circuit and the third resonant circuit for to be coupled in series within the first processing path.

18. The phase error measurement circuit of claim 14 , wherein the resonant circuit is a bulk acoustic wave resonator BAW.

19. A phase error measurement circuit comprising:

an oscillator configured to generate an oscillation signal at an oscillation frequency;

a splitter circuit configured to split said oscillation signal into first and second identical signals, the first identical signal applied to a first processing path and the second identical signal applied to a second processing path;

a resonant circuit having a resonant frequency substantially equal to the oscillation frequency coupled in series within the first processing path;

a phase shift circuit coupled in series within the second processing path;

a mixer having a first input connected to an output of the first processing path and a second input connected to an output of the second processing path, the mixer having an output;

a low-pass filter coupled to the output of the mixer and generating a signal indicative of a phase noise of the resonant circuit;

a second resonant circuit having a resonant frequency coupled in series within the second processing path; and

a switching circuit in the second processing path configured to selectively bypass the second resonant circuit in the second processing path.

20. The phase error measurement circuit of claim 19 further comprising a feedback control loop having an input coupled to receive the first identical signal from the first processing path and an output coupled to the oscillator to tune operation of the oscillator such that the oscillation frequency is substantially equal to the resonant frequency.

21. A phase error measurement circuit, comprising:

an oscillator configured to generate an oscillation signal at an oscillation frequency;

a splitter circuit configured to split said oscillation signal into first and second identical signals, the first identical signal applied to a first processing path and the second identical signal applied to a second processing path;

a resonant circuit having a resonant frequency substantially equal to the oscillation frequency coupled in series within the first processing path;

a phase shift circuit coupled in series within the second processing path;

a mixer having a first input connected to an output of the first processing path and a second input connected to an output of the second processing path, the mixer having an output;

a low-pass filter coupled to the output of the mixer and generating a signal indicative of a phase noise of the oscillator; and

a feedback control loop having an input coupled to receive a signal output from the first processing path prior to said mixer and an output coupled to an input of the oscillator to tune operation of the oscillator such that the oscillation frequency is substantially equal to the resonant frequency.

22. The phase error measurement circuit of claim 21 further comprising a second resonant circuit having a resonant frequency coupled in series within the second processing path.

23. The phase error measurement circuit of claim 21 further comprising a third resonant circuit having a resonant frequency coupled in parallel with the resonant circuit of the first processing path.

24. The phase error measurement circuit of claim 23 further comprising a switching circuit configured to selectively choose one of the resonant circuit and the third resonant circuit for to be coupled in series within the first processing path.

25. The phase error measurement circuit of claim 21 , wherein the resonant circuit is a bulk acoustic wave resonator BAW.

26. A phase error measurement circuit comprising:

an oscillator configured to generate an oscillation signal at an oscillation frequency;

a splitter circuit configured to split said oscillation signal into first and second identical signals, the first identical signal applied to a first processing path and the second identical signal applied to a second processing path;

a resonant circuit having a resonant frequency substantially equal to the oscillation frequency coupled in series within the first processing path;

a phase shift circuit coupled in series within the second processing path;

a mixer having a first input connected to an output of the first processing path and a second input connected to an output of the second processing path, the mixer having an output;

a low-pass filter coupled to the output of the mixer and generating a signal indicative of a phase noise of the oscillator;

a second resonant circuit having a resonant frequency coupled in series within the second processing path; and

a switching circuit in the second processing path configured to selectively bypass the second resonant circuit in the second processing path.

27. The phase error measurement circuit of claim 26 further comprising a feedback control loop having an input coupled to the first processing path and an output coupled to the oscillator to tune operation of the oscillator such that the oscillation frequency is substantially equal to the resonant frequency.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2025
From: CENTRE NATIONAL DE RECHERCHE SCIENTIFIQUES (CNRS)
To: STMICROELECTRONICS FRANCE
Reel/Frame 072836/0094 →
CHANGE OF NAME Recorded Feb 23, 2024
From: STMICROELECTRONICS SA
To: STMICROELECTRONICS FRANCE
Reel/Frame 066663/0136 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 7, 2008
From: CATHELIN, ANDREA; GODET, SYLVAIN; LLOPIS, OLIVIER; TOURNIER, ERIC; THURIES, STEPHANE
To: STMICROELECTRONICS S.A.; CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
Reel/Frame 021804/0639 →
Priority Claims (1)
FR 07 57729 · Sep 20, 2007 · national
Continuity (1)
Related Publication 20090079441A1 · Mar 26, 2009