Non-volatile memory device
A finFET-based non-volatile memory device on a semiconductor substrate includes source and drain regions, a fin body, a charge trapping stack and a gate. The fin body extends between the source and the drain region as a connection. The charge trapping stack covers a portion of the fin body and the gate covers the charge trapping stack at the location of the fin body. The fin body has a corner-free shape for at least ¾ of the circumference of the fin body which lacks distinct crystal faces and transition zones in between the crystal faces.
1. A method for manufacturing a finFET-based non-volatile memory device on a semiconductor substrate including source and drain regions, a fin body, a charge trapping stack and a gate; the fin body extending between the source region and the drain region, the fin connecting the source region and the drain region; the charge trapping stack being arranged to cover at least a portion of the fin body; the gate being arranged to cover the charge trapping stack at the location of the fin body, the method comprising:
forming the fin body with an entirely corner-free shape and on a gap defined by a lower surface of the fin body and an upper surface of an underlying substrate;
etching to provide a recess level that is either equal to, or larger than, the thickness of a layer of the charge trapping stack; and
wherein:
the substrate comprises an insulating layer, which is covered by a monocrystalline silicon layer; the source and drain regions and the fin body being arranged in the monocrystalline silicon layer, the insulating layer adjacent to the source and drain regions and the fin body being recessed to a recess level;
the etching is extended to a level that the insulating layer under the fin body is completely removed; and
the etching is achieved by combining a first anisotropic dry etching for partly recessing the insulating layer under the fin body with a second isotropic oxide etching for removing the insulating layer below the fin body.
2. A method for manufacturing a finFET-based non-volatile memory device, on a semiconductor substrate comprising source and drain regions, a fin body, a charge trapping stack and a gate; the fin body extending between the source region and the drain region, the fin connecting the source region and the drain region; the charge trapping stack being arranged to cover at least a portion of the fin body; the gate being arranged to cover the charge trapping stack at the location of the fin body, the method comprising:
forming the fin body with an entirely corner-free shape and on a gap defined by a lower surface of the fin body and an upper surface of an underlying substrate;
providing a gap region between a surface of the substrate and the fin body in such a way that the fin body is free-standing; and
wherein the substrate comprises a monocrystalline silicon wafer which is covered by an epitaxial Si—Ge layer, the SiGe layer being covered by an epitaxial Si layer; the source and drain regions and the fin body being arranged in the epitaxial Si layer and wherein the provision of the gap regions comprises the removal of the epitaxial SiGe layer below the fin body.
3. A method for manufacturing a finFET-based non-volatile memory device, the method comprising:
providing a substrate having an epitaxial SiGe layer on a semiconductor wafer, and an epitaxial Si layer on the epitaxial SiGe layer;
forming a fin body in the epitaxial Si layer, the fin body extending between and connecting source and drain regions in the epitaxial Si layer;
removing a portion of the epitaxial SiGe layer below the fin body to form a gap region between a surface of the wafer and the fin body;
providing a charge trapping stack arranged to cover at least a portion of the fin body; and
providing a gate arranged to cover a portion of the charge trapping stack.
4. The method of claim 3 , wherein forming a fin body includes forming a rounded, substantially edge-free fin body.
5. A finFET-based non-volatile memory device, the device comprising:
a semiconductor wafer;
an epitaxial SiGe layer on the semiconductor wafer;
an epitaxial Si layer on the epitaxial SiGe layer;
source and drain regions in the epitaxial Si layer;
a fin body in the epitaxial Si layer, the fin body extending between and connecting the source and drain regions;
a gap region at discontinuity of the epitaxial SiGe layer between the fin body and the wafer, the gap region being defined by a surface of the wafer, a surface of the fin body and portions of the SiGe layer bordering the discontinuity;
a charge trapping stack arranged to cover at least a portion of the fin body; and
a gate arranged to cover a portion of the charge trapping stack.
6. The device of claim 5 , wherein the fin body has a rounded shape that is substantially edge-free.
7. A method for manufacturing a finFET-based non-volatile memory device on a semiconductor substrate including source and drain regions, a fin body extending between and connecting the source region and the drain region, a charge trapping stack being arranged to cover the fin body, and a gate being arranged to cover the charge trapping stack at the location of the fin body, the method comprising:
forming the fin body with an entirely corner-free shape and on a gap defined by a lower surface of the fin body and an upper surface of an underlying substrate, the substrate including an insulating layer covered by a monocrystalline silicon layer, the source and drain regions and the fin body being arranged in the monocrystalline silicon layer, the insulating layer adjacent to the source and drain regions and the fin body being recessed to a recess level; and
etching to provide a recess level that is either equal to, or larger than, the thickness of a layer of the charge trapping stack, the etching being extended to a level that the insulating layer under the fin body is completely removed and is achieved by combining a first anisotropic dry etching for partly recessing the insulating layer under the fin body with a second isotropic oxide etching for removing the insulating layer below the fin body.
8. The method according to claim 7 , wherein forming the fin body includes shaping the fin body by annealing the fin body in hydrogen ambient at an elevated temperature between about 850 and about 1000° C.
9. A method for manufacturing a finFET-based non-volatile memory device on a semiconductor substrate including:
a monocrystalline silicon wafer which is covered by an epitaxial Si—Ge layer, the SiGe layer being covered by an epitaxial Si layer;
source and drain regions, the source and drain regions and the fin body being arranged in the epitaxial Si layer;
a fin body extending between and connecting the source region and the drain region;
a charge trapping stack being arranged to cover at least a portion of the fin body; and
a gate being arranged to cover the charge trapping stack at the location of the fin body;
the method comprising:
forming the fin body with an entirely corner-free shape and on a gap defined by a lower surface of the fin body and an upper surface of an underlying substrate; and
providing a gap region between a surface of the substrate and the fin body in such a way that the fin body is free-standing by removing the epitaxial SiGe layer below the fin body.
10. A finFET-based non-volatile memory device comprising:
a substrate including a monocrystalline silicon wafer, an epitaxial SiGe layer on the monocrystalline silicon wafer, and an epitaxial Si layer on the epitaxial SiGe layer;
source and drain regions formed in the epitaxial Si layer;
a fin body being arranged in the epitaxial Si layer, extending between the source region and the drain region, and connecting the source region and the drain region;
a channel in the substrate formed in the SiGe layer below the fin body, the channel forming a gap defined by a lower surface of the fin body and an upper surface of an underlying substrate in the channel, such that the fin body is free-standing over the gap;
a charge trapping stack configured and arranged to cover at least a portion of the fin body and including a dielectric material in contact with the fin body at an interface therewith, the fin body having a cross section that is entirely corner-free; and
a gate being arranged to cover a portion of the charge trapping stack over the fin body.
11. A finFET-based non-volatile memory device according to claim 10 , wherein the fin body has a rounded, corner-free shape.
12. A finFET-based non-volatile memory device according to claim 10 , wherein the fin body has a circular shape or an elliptical shape.
13. A Memory array comprising at least one finFET-based non-volatile memory device in accordance with claim 10 .
14. A Semiconductor device comprising at least one finFET-based non-volatile memory device in accordance with claim 10 .
15. A finFET-based non-volatile memory device according to claim 10 , wherein the fin body is arranged over a silicon dioxide layer included in the substrate.
16. A finFET-based non-volatile memory device according to claim 13 , wherein the charge trapping stack is formed around a circumference of the fin body; and
the gate is formed around the circumference of the charge trapping stack.
17. A finFET-based non-volatile memory device according to claim 10 , further comprising a second charge trapping stack formed between the substrate and the fin body.
18. A finFET-based non-volatile memory device comprising:
a source region and a drain region;
a fin body extending between the source region and the drain region, the fin connecting the source region and the drain region;
below the fin body, a gap defined by a lower surface of the fin body and an upper surface of an underlying substrate;
a first charge trapping stack configured and arranged to cover at least a portion of the fin body and including a dielectric material in contact with the fin body at an interface therewith;
a second charge trapping stack formed on the substrate, the first and second charge trapping stacks separated by the gap; and
a gate being arranged to cover a portion of the charge trapping stack over the fin body.
19. A finFET-based non-volatile memory device of claim 18 : wherein the gate fills the gap region.
20. A finFET-based non-volatile memory device of claim 18 , wherein the fin body has a cross section that is entirely corner-free.