IP Library Granted Patent US 8,173,469
Granted Patent B2
US 8,173,469 · App. 13/050,201 · Granted May 8, 2012

Fabrication method of light emitting device

Assignee: LG Innotek Co., Ltd.
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Quick Facts
Patent No.
US 8,173,469
App. No.
13/050,201
Granted
May 8, 2012
Kind
B2
Abstract

Provided is a method for fabricating a light emitting device. The method for fabricating the light emitting device includes forming a buffer layer including a compound semiconductor in which a rare-earth element is doped on a substrate, forming a light emitting structure including a first conductive type semiconductor layer, an active layer, and a second conductive type semiconductor layer, which are successively stacked on the buffer layer, forming a first electrode layer on the light emitting structure, removing the substrate, and forming a second electrode layer under the light emitting structure.

Claims (19)

1. A method for fabricating a light emitting device, the method comprising:

forming a buffer layer comprising a compound semiconductor in which a rare-earth element is doped on a substrate;

forming a light emitting structure comprising a first conductive type semiconductor layer, an active layer, and a second conductive type semiconductor layer, which are successively stacked on the buffer layer;

forming a first electrode layer on the light emitting structure;

removing the substrate; and

forming a second electrode layer under the light emitting structure.

2. The method of claim 1 , wherein the buffer layer has band gap energy less than that of the light emitting structure.

3. The method of claim 1 , wherein the buffer layer has band gap energy of about 1.8 eV to about 2.3 eV.

4. The method of claim 1 , wherein the rare-earth element comprises at least one of Eu, Er, Pr, Tb, Dy, Ce, Sm, Gd, Ho, Yb, Lu, Nd, Pm, and Tm.

5. The method of claim 1 , wherein Eu is doped into a GaN-based compound semiconductor to form the buffer layer.

6. The method of claim 1 , wherein the buffer layer and the light emitting structure are formed of the same compound semiconductor material.

7. The method of claim 1 , wherein the buffer layer has a thickness of about 0.1 nm to about 1 μm.

8. The method of claim 1 , wherein the removing of the substrate comprises irradiating a laser onto a bottom surface of the substrate to dissolve the buffer layer, thereby removing the substrate.

9. The method of claim 8 , wherein the laser has a wavelength of at least about 320 nm.

10. The method of claim 1 , wherein the forming of the first electrode layer comprises:

forming an ohmic layer on the light emitting structure;

forming a reflective layer on the ohmic layer; and

forming a conductive support member on the reflective layer.

11. The method of claim 1 , further comprising, after the removing of the substrate, removing the buffer remaining on a bottom surface of the light emitting structure.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 4, 2024
From: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
To: FAIRLIGHT INNOVATIONS, LLC
Reel/Frame 068839/0745 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2021
From: LG INNOTEK CO., LTD.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 056366/0335 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2011
From: PARK, KYUNG WOOK; JUNG, MYUNG HOON
To: LG INNOTEK CO., LTD.
Reel/Frame 025974/0246 →
Priority Claims (1)
KR 10-2010-0024087 · Mar 18, 2010 · national
Continuity (1)
Related Publication 20110229999A1 · Sep 22, 2011