IP Library Granted Patent US 8,183,589
Granted Patent B2
US 8,183,589 · App. 12/953,775 · Granted May 22, 2012

Substrate for fabricating light emitting device and method for fabricating the light emitting device

Assignee: LG Innotek Co., Ltd.
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Quick Facts
Patent No.
US 8,183,589
App. No.
12/953,775
Granted
May 22, 2012
Kind
B2
Abstract

Provided is a substrate for fabricating a light emitting device and a method for fabricating the light emitting device. The method for fabricating the light emitting device may include forming a sacrificial layer having band gap energy less than energy of a laser irradiated on a substrate, forming a growth layer on the sacrificial layer, forming a light emitting structure including a first conductive type semiconductor layer, an active layer, and a second conductive type semiconductor layer on the growth layer, and irradiating the laser onto the sacrificial layer to pass through the substrate, thereby to lift-off the substrate.

Claims (26)

1. A method for fabricating a light emitting device, the method comprising:

forming a sacrificial layer having band gap energy less than energy of a substrate on the substrate;

forming a growth layer on the sacrificial layer;

forming a light emitting structure comprising a first conductive type semiconductor layer, an active layer, and a second conductive type semiconductor layer on the growth layer; and

irradiating the laser onto the sacrificial layer passing through the substrate, thereby to lift-off the substrate,

wherein the growth layer is formed of the same material as that of the substrate.

2. The method of claim 1 , further comprising removing the growth layer using an etching process after the substrate is lift-off.

3. The method of claim 1 , further comprising forming a first electrode on the light emitting structure.

4. The method of claim 2 , further comprising forming a second electrode on the first conductive type semiconductor layer exposed by removing the growth layer.

5. The method of claim 1 , wherein the substrate is formed of sapphire having a single crystalline structure, and the growth layer is formed of sapphire having a poly crystalline structure.

6. The method of claim 1 , wherein the sacrificial layer has a band gap of about 1.0 eV to about 7.0 eV.

7. The method of claim 1 , wherein the sacrificial layer includes at least one selected from the group including ITO, MoxOy, WxOy, NiOx, TiOx, MN, and GaN.

8. The method of claim 1 , wherein the sacrificial layer has a thickness of about 10 nm to about 100 μm.

9. The method of claim 1 , further comprising patterning a top surface of the growth layer after the growth layer is formed.

10. The method of claim 1 , further comprising forming a buffer layer on the growth layer after the growth layer is formed.

11. A substrate for fabricating a light emitting device, the substrate comprising:

a substrate;

a sacrificial layer having band gap energy less than energy of the substrate used for removing the substrate;

a growth layer on the sacrificial layer; and

a light emitting structure comprising a first conductive type semiconductor layer, an active layer, and a second conductive type semiconductor layer on the growth layer,

wherein the growth layer is formed of the same material as that of the substrate.

12. The substrate of claim 11 , wherein the sacrificial layer has a band gap of about 1.0 eV to about 7.0 eV.

13. The substrate of claim 11 , wherein the substrate is formed of sapphire having a single crystalline structure, and the growth layer is formed of sapphire having a poly crystalline structure.

14. The substrate of claim 11 , wherein the sacrificial layer includes at least one selected from the group including ITO, MoxOy, WxOy, NiOx, TiOx, MN, and GaN.

15. The substrate of claim 11 , wherein the sacrificial layer has a thickness of about 10 nm to about 100 μm.

16. The substrate of claim 11 , wherein the growth layer has a top surface including a pattern structure.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 4, 2024
From: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
To: FAIRLIGHT INNOVATIONS, LLC
Reel/Frame 068839/0745 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2021
From: LG INNOTEK CO., LTD.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 056366/0335 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 24, 2010
From: JEONG, HWAN HEE
To: LG INNOTEK CO., LTD
Reel/Frame 025420/0858 →
Priority Claims (1)
KR 10-2010-0020648 · Mar 9, 2010 · national
Continuity (1)
Related Publication 20110220938A1 · Sep 15, 2011