IP Library Granted Patent US 8,194,162
Granted Patent B2
US 8,194,162 · App. 12/720,949 · Granted Jun 5, 2012

Imaging device

Assignee: Fujitsu Semiconductor Limited
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Quick Facts
Patent No.
US 8,194,162
App. No.
12/720,949
Filed
Mar 10, 2010
Granted
Jun 5, 2012
Kind
B2
Art Unit
2622
USPC
348/294
Abstract

An imaging device includes an image sensing device provided on a semiconductor substrate; a transparent member provided on a light-receiving area of the image sensing device; and a circuit element provided on the transparent member, wherein the image sensing device and the circuit element are electrically coupled to each other.

Claims (12)

1. An imaging device comprising:

an image sensing device provided on a semiconductor substrate;

a transparent member provided on a light-receiving area of the image sensing device; and

a circuit element provided on the transparent member,

wherein the image sensing device and the circuit element are electrically coupled to each other,

wherein the transparent member includes a thick portion having a first thickness that corresponds to a thickness of the light-receiving area, and a thin portion having a second thickness smaller than the first thickness, and

wherein the circuit element is provided on the thin portion.

2. The imaging device according to claim 1 , wherein an upper portion of the circuit element is lower than an upper surface of the thick portion of the transparent member.

3. The imaging device according to claim 2 , wherein a resin material for sealing the circuit element is provided on the thin portion.

4. The imaging device according to claim 3 , wherein the resin material is lightproof.

5. The imaging device according to claim 1 , wherein a side face of the thick portion is inclined so that an angle formed between an upper surface of the thick portion and the side face of the thick portion is obtuse.

6. The imaging device according to claim 1 , wherein the side face of the thick portion includes a first face provided perpendicularly to an upper surface of the thick portion and above the thin portion, and a second face provided at an obtuse angle to the upper surface of the thick portion and is continuous with the first face.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0637 →
CHANGE OF NAME Recorded Jul 9, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024651/0744 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 12, 2010
From: MORIYA, SUSUMU; KOBAYASHI, IZUMI; OHNO, TAKAO
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 024074/0503 →
Priority Claims (1)
JP 2009-057558 · Mar 11, 2009 · national
Continuity (1)
Related Publication 20100231766A1 · Sep 16, 2010