IP Library › Granted Patent US 819,581
Granted Patent S1
US 819,581 · App. 29/601,371 · Granted Jun 5, 2018

Socket for electronic device testing apparatus

Inventors: Takeshi Okushi (Tokyo, JP); Mitsunori Aizawa (Tokyo, JP); Masanori Nagashima (Saitama, JP); Takashi Kawashima (Tokyo, JP)
Assignee: ADVANTEST CORPORATION
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Quick Facts
Patent No.
US 819,581
App. No.
29/601,371
Granted
Jun 5, 2018
Kind
S1
Claims (1)

The ornamental design for a socket for an electronic device testing apparatus, as shown and described.

Assignments (1)
CHANGE OF ADDRESS Recorded Dec 18, 2018
From: ADVANTEST CORPORATION
To: ADVANTEST CORPORATION
Reel/Frame 047987/0626 →
Priority Claims (2)
KR 30-2014-0035153 · Jul 17, 2014 · national
KR 30-2014-0035155 · Jul 17, 2014 · national
Continuity (1)
Division 29509962 · Nov 24, 2014