IP Library Granted Patent US 8,196,008
Granted Patent B2
US 8,196,008 · App. 13/090,539 · Granted Jun 5, 2012

Semiconductor memory device and method of controlling the same

Assignee: Kabushiki Kaisha Toshiba
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,196,008
App. No.
13/090,539
Granted
Jun 5, 2012
Kind
B2
Abstract

A semiconductor memory device includes a plurality of detecting code generators configured to generate a plurality of detecting codes to detect errors in a plurality of data items, respectively, a plurality of first correcting code generators configured to generate a plurality of first correcting codes to correct errors in a plurality of first data blocks, respectively, each of the first data blocks containing one of the data items and a corresponding detecting code, a second correcting code generators configured to generate a second correcting code to correct errors in a second data block, the second data block containing the first data blocks, and a semiconductor memory configured to nonvolatilely store the second data block, the first correcting codes, and the second correcting code.

Claims (11)

1. A semiconductor memory device comprising:

a plurality of detecting code generators configured to generate a plurality of detecting codes to detect errors in a plurality of data items, respectively;

a plurality of first correcting code generators configured to generate a plurality of first correcting codes to respectively correct errors in a plurality of first data blocks each of which comprises one of the data items and a corresponding detecting code;

a second correcting code generator configured to generate a second correcting code to correct errors in a second data block which comprises the first data blocks;

a semiconductor memory configured to nonvolatilely store the second data block, the first correcting codes, and the second correcting code;

a first corrector configured to correct errors in the first data blocks using the first correcting codes, respectively;

a detector configured to detect, using the detecting codes, errors in the data items corrected by the first corrector, respectively, and generate first error information representing presence/absence of an error in each of the corrected data items; and

a second corrector configured to execute a Chien search for, of the corrected data items, a number of data items containing errors and correct errors using the first error information and the second correcting code,

wherein an error correction capability of the second correcting code is higher than error correction capabilities of the first correcting codes.

2. The device according to claim 1 , wherein the second corrector stops a correction process when the data items corrected by the first corrector contain no error.

3. The device according to claim 1 , wherein the semiconductor memory is a NAND flash memory.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 26, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043328/0388 →
Priority Claims (1)
JP 2007-225996 · Aug 31, 2007 · national
Continuity (3)
Continuation 12404861 · Mar 16, 2009
Continuation PCTJP2008063344 · Jul 17, 2008
Related Publication 20110197110A1 · Aug 11, 2011