IP Library Granted Patent US 8,207,823
Granted Patent B2
US 8,207,823 · App. 11/645,761 · Granted Jun 26, 2012

Integrated circuit and method for writing information

Assignee: Hynix Semiconductor Inc.
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Quick Facts
Patent No.
US 8,207,823
App. No.
11/645,761
Granted
Jun 26, 2012
Kind
B2
Abstract

An integrated circuit is provided. The integrated circuit includes an RFID tag configured to store various administrative information after testing at a wafer level in response to a radio frequency signal, and an interface unit configured to perform the function of an interface between the integrated circuit and the RFID tag for storing the information in the RFID tag. An antenna of the RFID tag is formed using a wire and a lead frame. A method for writing information of an integrated circuit is also provided. The method includes the steps of performing a wafer processing of an integrated circuit having a RFID tag; performing a wafer level test of the integrated circuit; transmitting and receiving a radio frequency signal to store various administrative information in the RFID tag; and storing a chip confirmation code in the RFID tag.

Claims (34)

1. An integrated circuit comprising:

an integrated circuit region with a testing function;

a Radio Frequency Identification (RFID) integrated circuit region including an RFID tag, the RFID tag being configured to store various administrative information including ID (identification) information and test results, wherein the information is stored in the RFID tag after the testing at a wafer level in response to a radio frequency signal request;

an interface unit configured to perform the function of an interface between the integrated circuit region and the RFID integrated circuit region for storing the information in the RFID tag,

a first antenna pad formed on the RFID integrated circuit region and connected to an RFID tag antenna; and

a second antenna pad connected to the antenna and formed on the integrated circuit region,

wherein the RFID tag includes:

a memory block configured to receive an operation control signal to generate an internal control signal, store data in a nonvolatile ferroelectric capacitor in response to the internal control signal and output the stored data,

wherein a chip confirmation code is stored in the nonvolatile ferroelectric capacitor of the RFID tag by the interface between the integrated circuit region and the RFID tag,

wherein the RFID integrated circuit region includes the antenna formed using a wire, a lead frame and a stage, wherein the RFID integrated circuit region is formed over the stage.

2. An integrated circuit comprising:

an integrated circuit region with a testing function;

a Radio Frequency Identification (RFID) integrated circuit region including an RFID tag, the RFID tag being configured to store various administrative information including ID (identification) information and test results, wherein the information is stored in the RFID tag after the testing at a wafer level in response to a radio frequency signal request;

an interface unit configured to perform the function of an interface between the integrated circuit region and the RFID integrated circuit region for storing the information in the RFID tag,

a first antenna pad formed on the RFID integrated circuit region and connected to an RFID tag antenna; and

a second antenna pad connected to the antenna and formed on the integrated circuit region,

wherein the RFID tag includes:

a memory block configured to receive an operation control signal to generate an internal control signal, store data in a nonvolatile ferroelectric capacitor in response to the internal control signal and output the stored data,

wherein a chip confirmation code is stored in the nonvolatile ferroelectric capacitor of the RFID tag by the interface between the integrated circuit region and the RFID tag,

wherein the integrated circuit is formed in a FBGA (Fine Pitch Ball Grid Array) form factor,

wherein the RFID integrated circuit region includes the antenna formed using a wire, a lead frame and a stage, wherein the RFID integrated circuit region is formed over the stage.

3. The integrated circuit according to claim 1 , wherein the integrated circuit is one of a DRAM, a flash memory, a FeRAM, a CPU, an SOC, an ASIC, and a solid state semiconductor.

4. The integrated circuit according to claim 1 , wherein the RFID integrated circuit region includes:

an analog block configured to receive a radio frequency signal to output an operation command signal; and

a digital block configured to generate an address and the operation control signal in response to the operation command signal, and output a response signal corresponding to the operation command signal to the analog block.

5. The integrated circuit according to claim 4 , wherein the memory block includes:

a word line decoder configured to decode the address to select a word line;

a control signal block configured to generate the internal control signal in response to the operation control signal;

a cell array configured to store the data; and

an input/output block configured to control data input/output between the cell array and a data bus in response to the internal control signal.

6. The integrated circuit according to claim 5 , wherein the cell array includes:

a sense amplifier configured to sense and amplify the data in response to the internal control signal;

a bit line equalizing unit configured to precharge a bit line in response to a bit line equalizing signal; and

a memory array having a plurality of unit cells.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 27, 2006
From: KANG, HEE BOK
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 018744/0837 →
Priority Claims (1)
KR 10-2006-0049860 · Jun 2, 2006 · national
Continuity (1)
Related Publication 20070290706A1 · Dec 20, 2007