Device and method for calibrating an imaging device for generating three dimensional surface models of moving objects

1. A method for determining a parameterization of the optical characteristics of an imaging device, the imaging device comprising at least one projection unit and at least one camera being under synchronized dynamic optical control; the method comprising performing the steps of:

(a) positioning a calibration object at a focal plane at a distance of a plurality of distances from the imaging device;

(b) aligning the calibration object at said focal plane with the imaging device;

(c) projecting a pattern onto the calibration object at said focal plane;

(d) detecting features of the pattern; and

(e) using the detected locations of the features to calibrate elements of the imaging device to determine a set of calibration parameters for said focal plane; and

repeating steps (a)-(e) for each focal plane at each of the other distances of the plurality of distances from the imaging device,

wherein the performing and the repeating occur within a single calibration session.

2. The method of claim 1 , wherein the distance between the calibration object and the imaging device along the optical axis of the projection unit is a known distance.

3. The method of claim 1 , wherein the distance perpendicular to the optical axis defines a focal plane.

4. The method of claim 1 , wherein a device is used to automate the process of repeating steps (a)-(e) for each focal plane at each of the other distances of the plurality of distances.

5. The method of claim 1 , further comprising:

(f) enabling an out of focus operation by projecting a pattern on the calibration object at a known out of focus distance;

(g) detecting features of the pattern;

(h) determining the variation of the features from those features at the in focus distance; and

(i) calculating a mapping of the degree of de-focus of any set of feature points; and

repeating steps (f)-(i) for each focal plane at each of the other distances of the plurality of distances from the imaging device,

wherein the performing and the repeating steps (a)-(i) occur within the single calibration session.

6. The method of claim 5 , wherein the feature is a line, and the variation between an in focus value of the line thickness is mapped to the out of focus value of the line thickness.

7. The method of claim 5 , wherein the feature is a box, and the variation between an in focus value of the box size is mapped to the out of focus value of the box size.

8. The method of claim 5 , wherein the feature is a box, and the variation between an in focus value of the ratio of white pixels to black pixels is mapped to the out of focus value of the ratio of white pixels to black pixels.

9. The method of claim 1 , further comprising storing the plurality of sets of calibration parameters for setting parameters for focal planes at any of said plurality of distances when the imaging device is in operation.

10. A device for determining a parameterization of the optical characteristics of an imaging device, comprising:

the imaging device, wherein the imaging device comprises at least one projection unit and at least one camera being under synchronized dynamic optical control; and

a device configured to automate executing a process comprising performing the steps of:

(a) positioning a calibration object at a focal plane at a distance of a plurality of distances from the imaging device;

(b) aligning the calibration object at said focal plane with the imaging device;

(c) projecting a pattern onto the calibration object at said focal plane;

(d) detecting features of the pattern; and

(e) using the detected locations of the features to calibrate elements of the imaging device to determine a set of calibration parameters for said focal plane; and

repeating steps (a)-(e) for each focal plane at each of the other distances of the plurality of distances from the imaging device,

wherein the performing and the repeating occur within a single calibration session.

11. The device of claim 10 , wherein the distance between the calibration object and the imaging device along the optical axis of the projection unit is a known distance.

12. The device of claim 10 , the process further comprising:

(f) enabling an out of focus operation by projecting a pattern on the calibration object at a known out of focus distance;

(g) detecting features of the pattern;

(h) determining the variation of the features from those features at the in focus distance; and

(i) calculating a mapping of the degree of de-focus of any set of feature points and repeating steps (f)-(i) for each focal plane at each of the other distances of the plurality of distances from the imaging device,

wherein the performing and the repeating steps (a)-(i) occur within the single calibration session.

13. The device of claim 12 , wherein the feature is a line, and the variation between an in focus value of the line thickness is mapped to the out of focus value of the line thickness.

14. The device of claim 12 , wherein the feature is a box, and the variation between an in focus value of the box size is mapped to the out of focus value of the box size.

15. The device of claim 12 , wherein the feature is a box, and the variation between an in focus value of the ratio of white pixels to black pixels is mapped to the out of focus value of the ratio of white pixels to black pixels.

16. The device of claim 10 , in which the device is further configured to automate executing storing the plurality of sets of calibration parameters for setting parameters for focal planes at any of said plurality of distances when the imaging device is in operation.