Appearance inspection apparatus, appearance inspection system, and appearance inspection appearance
An appearance inspection apparatus, wherein an image inspection result based on a result of image-taking and image-analyzing a product to be inspected can be displayed with superposed on a visual field of an inspector inspecting the product to be inspected with an eye and in a position corresponding to an image in which the inspector is observing the product to be inspected is provided. An appearance inspection method includes: performing image inspection of a product to be inspected by image-taking the product to be inspected and image-analyzing the product to be inspected in an image-treating section. An inspector is capable of inspecting the product to be inspected with an eye in the state that a result of the image inspection is displayed with superposed on a visual field of an inspector inspecting the product to be inspected with an eye and in a position corresponding to an image in which the inspector is observing the product to be inspected.
1. An appearance inspection apparatus, wherein an image inspection result based on a result of image-taking and image-analyzing a product to be inspected can be displayed with superposed on a visual field of an inspector inspecting the product to be inspected with an eye and in a position corresponding to an image in which the inspector is observing the product to be inspected, wherein a display of the image inspection result can be changed according to a time in which the inspector observes a specific part of the product to be inspected.
2. The apparatus according to claim 1 , wherein a position of a defect detected by the image analysis is displayed with superposed on the visual field of the inspector.
3. The apparatus according to claim 1 , further comprising an appearance inspection input section in which a result of appearance inspection of the product to be inspected by the inspector can be input.
4. The apparatus according to claim 1 , further comprising an inspection data storage section for storing a result of appearance inspection of the product to be inspected by the inspector therein.
5. The apparatus according to claim 4 , wherein the inspection data storage section stores the result in association with information specifying the product to be inspected.
6. The apparatus according to claim 4 , wherein the inspection data storage section automatically collects and stores the result.
7. The apparatus according to claim 1 , further comprising a data analysis section for analyzing a result of appearance inspection of the product to be inspected by the inspector.
8. The apparatus according to claim 7 , wherein the data analysis section performs a process history analysis of the product to be inspected.
9. An appearance inspection apparatus, wherein an image inspection result based on a result of image-taking and image-analyzing a product to be inspected can be displayed with superposed on a visual field of an inspector inspecting the product to be inspected with an eye and in a position corresponding to an image in which the inspector is observing the product to be inspected, wherein the image inspection result can be displayed in a position according to change of a visual line of the inspector.
10. The apparatus according to claim 9 , further comprising an appearance inspection input section in which a result of appearance inspection of the product to be inspected by the inspector can be input.
11. The apparatus according to claim 9 , further comprising an inspection data storage section for storing a result of appearance inspection of the product to be inspected by the inspector therein.
12. The apparatus according to claim 11 , wherein the inspection data storage section stores the result in association with information specifying the product to be inspected.
13. The apparatus according to claim 11 , wherein the inspection data storage section automatically collects and stores the result.
14. The apparatus according to claim 9 , further comprising a data analysis section for analyzing a result of appearance inspection of the product to be inspected by the inspector.
15. The apparatus according to claim 14 , wherein the data analysis section performs a process history analysis of the product to be inspected.
16. The apparatus according to claim 9 , wherein a position of a defect detected by the image analysis is displayed with superposed on the visual field of the inspector.
17. An appearance inspection method comprising:
performing image inspection of a product to be inspected by image-taking the product to be inspected and image-analyzing the product to be inspected in an image-treating section,
an inspector being capable of inspecting the product to be inspected with an eye in the state that a result of the image inspection is displayed with superposed on a visual field of an inspector inspecting the product to be inspected with an eye and in a position corresponding to an image in which the inspector is observing the product to be inspected, wherein a display of the image inspection result is changed according to a time in which the inspector observes a specific part of the product to be inspected.