Driving circuit for detecting line short defects

1. A driving circuit for detecting line short defects in a display panel having a pixel matrix, the driving circuit comprising:

a plurality of shift registers, each shift register having an output port for outputting a driving signal sequentially;

a plurality of diode modules coupled to the output ports of the plurality of shift registers respectively; and

at least one power supply coupled to the plurality of diode modules for providing a forward bias to the diode modules to bypass the plurality of shift registers simultaneously during at least a part of a period of detecting line short defects.

2. The driving circuit of claim 1 , wherein the diode module comprises a plurality of diodes or diode-coupled transistors coupled in series.

3. The driving circuit of claim 1 , further comprising at least one switch coupled between the at least one power supply and the plurality of diode modules.

4. The driving circuit of claim 1 , wherein the plurality of shift registers are divided into an odd group of shift registers and an even group of shift registers, the plurality of diodes are divided into an odd group of diode modules and an even group of diode modules, each diode module of the odd group of diode modules is coupled to an output port of the odd group of shift registers, each diode module of the even group of diode modules is coupled to an output port of the even group of shift registers, and the at least one power supply comprises two power supplies coupled to the odd group of diode modules and the even group of diode modules, respectively.

5. The driving circuit of claim 4 , further comprising two switches coupled between the two power supplies and the odd group of diode modules and between the two power supplies and the even group of diode modules, respectively.

6. A method for detecting line short defects using the driving circuit of claim 5 , the method comprising:

checking whether any line defects exist when the line short defect exists;

providing a forward bias voltage to one of the odd group of diode modules and the even group of diode modules to bypass one of the odd group of shift registers and the even group of shift registers; and

detecting the location of the line short defect.

7. The method of claim 6 , further comprising passing the detected location after detecting the location of the line short defect.

8. A method for detecting line short defects in a display panel using the driving circuit of claim 1 , the method comprising steps of:

checking whether any line defects exist in the display panel;

providing a forward bias voltage to the diode module to bypass the plurality of the shift registers when the line short defect exists; and

detecting the location of the line short defect.

9. The method of claim 8 , further comprising passing the detected location after detecting the location of the line short defect.