Signal quality monitoring to defeat microchip exploitation
View Patent ↗Method and apparatus and associated method of detecting microchip tampering may include a conductive element in electrical communication with multiple sensors for verifying that signal degradation occurs at an expected region of the conductive element. A detected variance from the expected region may automatically trigger an action for impeding an integrated circuit exploitation process.
1. An apparatus comprising:
a conductive element proximate security sensitive circuitry of a microchip, wherein the conductive element conducts an electrical signal that predictably weakens as it propagates through the conductive element; and
circuitry comprising a plurality of sensors in electrical communication with respective points of the conductive element, wherein the circuitry selects one of the plurality of sensors, and initiates an action for obstructing analysis of the security sensitive circuitry in response to the predictable weakening of the electrical signal proximate the selected one of the plurality of sensors, wherein a first characteristic of the electrical signal sensed at the selected sensor is stronger than a second characteristic of the electrical signal sensed at a second sensor of the plurality, and wherein the first and second characteristics match first and second expected levels, respectively.
2. The apparatus of claim 1 , wherein the circuitry detects the predictable weakening of the electrical signal that initiates an action for obstructing analysis of the security sensitive circuitry.
3. The apparatus of claim 1 , wherein the electrical signal predictably weakens at different regions along the conductive element according to a variable signal strength of the electrical signal, wherein the regions correspond to subsets of the plurality of sensors.
4. The apparatus of claim 3 , wherein the circuitry automatically varies the signal strength of the electrical signal.
5. The apparatus of claim 1 further comprising a signal transmitter to transmit the electrical signal to the conductive element.
6. The apparatus of claim 1 further comprising a connection between the sensor and the conductive element.
7. The apparatus of claim 6 , wherein the connection comprises a through-silicon via.
8. The apparatus of claim 1 , wherein the electrical signal predictably cannot be sensed proximate the selected one of the plurality of sensors.
9. The apparatus of claim 1 , wherein the electrical signal predictably weakens within a range along the plurality of sensors.
10. The apparatus of claim 1 , further comprising program code executed by the circuitry to initiate an action for obstructing analysis of the security sensitive circuitry in response to the predictable weakening of the electrical signal.
11. The apparatus of claim 1 , wherein the conductive element comprises a metallic coil.
12. The apparatus of claim 1 , wherein the conductive element comprises a metallic path.
13. The apparatus of claim 1 , wherein the conductive element comprises a metallic plate.
14. The apparatus of claim 10 , wherein the action includes an operation selected from a group consisting of at least one of: a shutdown, a spoofing and a self-destruct operation.
15. An apparatus comprising:
a conductive element proximate security sensitive circuitry of a microchip, wherein the conductive element conducts an electrical signal, wherein the electrical signal predictably weakens as it propagates through the conductive element according to a strength of the electronic signal; and
circuitry comprising a plurality of sensors in electrical communication with respective points of the conductive element, wherein the circuitry selects one of the plurality sensors, sets a strength of the electronic signal, and initiates an action for obstructing analysis of the security sensitive circuitry in response to the electronic signal predictably weakening proximate the selected one of the plurality of sensors, wherein a first characteristic of the electrical signal sensed at the selected sensor is stronger than a second characteristic of the electrical signal sensed at a second sensor of the plurality, and wherein the first and second characteristics match first and second expected levels, respectively.
16. A method of protecting security sensitive circuitry of a microchip from undesired analysis, the method comprising:
selecting one of a plurality of sensors in electrical communication with respective points of a conductive element;
sensing at the selected sensor an unexpected weakening of an electronic signal propagating through the conductive element proximate security sensitive circuitry of the microchip; and
initiating an action configured to obstruct analysis of the security sensitive circuitry in response to sensing the unexpected weakening of the electronic signal, wherein a first characteristic of the electrical signal sensed at the selected sensor is stronger than a second characteristic of the electrical signal sensed at a second sensor of the plurality, and wherein the first and second characteristics match first and second expected levels, respectively.
17. The method of claim 16 , wherein sensing the unexpected weakening further comprises determining that the electrical signal cannot be sensed at the selected sensor.
18. The method of claim 16 further comprising varying a strength of the electronic signal to vary an area of the conductive element at which the electronic signal is expected to weaken.
19. The apparatus of claim 1 , wherein the conductive element is integrated in the microchip.