IP Library Granted Patent US 8,383,493
Granted Patent B2
US 8,383,493 · App. 12/376,435 · Granted Feb 26, 2013

Production of semiconductor devices

Inventor: Wang Nang Wang (Bath, GB)
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Quick Facts
Patent No.
US 8,383,493
App. No.
12/376,435
Granted
Feb 26, 2013
Kind
B2
Abstract

A method of producing a layered semiconductor device comprises the steps of: (a) providing a base comprising a plurality of semiconductor nano-structures, (b) growing a semiconductor material onto the nano-structures using an epitaxial 5 growth process, and (c) growing a layer of the semiconductor material using an epitaxial growth process.

Claims (22)

1. A method of producing a layered semiconductor device comprising the steps of:

a) providing a base comprising a plurality of semiconductor nano-structures,

b) growing a semiconductor material onto the nano-structures using an epitaxial growth process, and

c) growing a layer of the semiconductor device onto the semiconductor material using an epitaxial growth process;

wherein the plurality of semiconductor nano-structures is located on a substrate and the method comprises the initial step of producing the nano-structures by etching a semiconductor template on the substrate until the substrate is exposed.

2. A method according to claim 1 , wherein the nano-structures comprise a material selected from the group consisting of GaN, AIN, InN, ZnO, SiC, Si, and alloys thereof.

3. A method according to claim 1 , wherein the template comprises a simple layer, or multiple layers, or a heterostructure, or superlattices consisting of n-or p-type doped or un-doped semiconductors comprising III-V or II-VI compounds.

4. A method according to claim 1 , wherein the template comprises a simple layer, or multiple layers, or a heterostructure, or superlattices consisting of n-or p-type doped or un-doped semiconductors selected from AlN, AlxGal-xN with 1>×>0, GaN and InxGal-xN with 1>×>0.

5. A method according to claim 1 , wherein the template comprises a p-GaN top layer.

6. A method according to claim 1 , wherein each nano-structure comprises a nano-column.

7. A method according to claim 1 , wherein the substrate material is selected from a group consisting of sapphire, silicon, silicon carbide, diamond, metals, metal oxides, compound semiconductors, glass, quartz and composite materials.

8. A method according to claim 1 , wherein the substrate material comprises a single crystal with a specific crystal orientation.

9. A method according to claim 1 , wherein step (c) includes growing at least one additional layer.

10. A method according to claim 1 , further comprising the step of creating a contact electrode on the device.

11. A method according to claim 1 , further comprising the step of, if the substrate is formed of a conducting material, creating a contact electrode on the substrate.

12. A method according to claim 1 , comprising the step of separating the base from the semiconductor material grown in step (b).

13. A method according to claim 12 , wherein after separation, a contact electrode is created on the semiconductor material.

14. A method according to claim 1 , comprising the step of bonding the device to a submount.

15. A method according to claim 1 , wherein the device is an optical device.

16. A method according to claim 1 , wherein, in step (c), the device is fabricated from non-polar epitaxial semiconductor material.

17. A method according to claim 1 , wherein the semiconductor material grown in step (b) is non-polar.

18. A method according to claim 17 , wherein the substrate comprises γ-plane sapphire or m-plane 4H- or 6H- SiC.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 23, 2024
From: QUANTUM NIL LIMITED; QUANTUM NIL LIMITED TAIWAN BRANCH
To: QUANTUM NIL CORPORATION; QUANTUM NIL TECHNOLOGY PTE. LTD.
Reel/Frame 068763/0564 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 31, 2022
From: WANG, WANG NANG
To: QUANTUM NIL LIMITED; QUANTUM NIL LIMITED TAIWAN BRANCH
Reel/Frame 060944/0919 →
Priority Claims (2)
GB 0702560.4 · Feb 9, 2007 · national
GB 0708281.1 · Apr 30, 2007 · national
Continuity (1)
Related Publication 20100276665A1 · Nov 4, 2010