Enhanced delay matching buffer circuit
A buffer circuit includes an input stage including at least one MOS device having a first threshold voltage associated therewith, the input stage being adapted to receive an input signal referenced to a first voltage supply. The buffer circuit further includes an output stage including at least one MOS transistor having the first threshold voltage associated therewith, an input of the output stage being connected to an output of the input stage, the output stage being operative to generate an output signal which is indicative of a logic state of the input signal. The buffer circuit includes a delay control circuit adapted for connection between at least one of the first voltage supply and a voltage return of the buffer circuit, and at least one of the input stage and the output stage. The delay control circuit includes at least one MOS device having a second threshold voltage associated therewith. The MOS device in the delay control circuit being adapted to receive, as a control signal, a second voltage supply, a delay of the buffer circuit being at least partially controlled as a function of a process parameter, the second voltage supply and/or a temperature of the MOS device in the delay control circuit.
1. A buffer circuit, comprising:
an input stage including at least one metal-oxide-semiconductor (MOS) device having a first threshold voltage associated therewith, the input stage being adapted to receive an input signal referenced to a first voltage supply;
an output stage including at least one MOS transistor having the first threshold voltage associated therewith, an input of the output stage being connected to an output of the input stage, the output stage being operative to generate an output signal which is indicative of a logic state of the input signal; and
a delay control circuit adapted for connection between at least one of: (i) the input stage and at least one of the first voltage supply and a voltage return of the buffer circuit; and (ii) the output stage and at least one of the first voltage supply and the voltage return of the buffer circuit, the delay control circuit being connected outside a signal path of the buffer circuit, the delay control circuit comprising at least one MOS device having a second threshold voltage associated therewith, the second threshold voltage being greater than the first threshold voltage, the at least one MOS device in the delay control circuit receiving, as a control signal, a second voltage supply, the second voltage supply being independent of the first voltage supply and the voltage return of the buffer circuit, a delay of the buffer circuit being at least partially controlled as a function of at least one of a process parameter, the second voltage supply and a temperature of the at least one MOS device in the delay control circuit.
2. The buffer circuit of claim 1 , wherein the delay control circuit comprises an N-channel MOS (NMOS) device having the second threshold voltage associated therewith and including a first source/drain adapted for connection to the first voltage supply, a second source/drain connected to the input stage, and a gate adapted for connection to the second voltage supply.
3. The buffer circuit of claim 1 , wherein the delay control circuit comprises an NMOS device having the second threshold voltage associated therewith and including a first source/drain adapted for connection to the voltage return of the buffer circuit, a second source/drain connected to the input stage, and a gate adapted for connection to the second voltage supply.
4. The buffer circuit of claim 1 , wherein the delay control circuit comprises an NMOS device having the second threshold voltage associated therewith and including a first source/drain adapted for connection to the first voltage supply, a second source/drain connected to the output stage, and a gate adapted for connection to the second voltage supply.
5. The buffer circuit of claim 1 , wherein the delay control circuit comprises an NMOS device having the second threshold voltage associated therewith and including a first source/drain adapted for connection to the voltage return of the buffer circuit, a second source/drain connected to the output stage, and a gate adapted for connection to the second voltage supply.
6. The buffer circuit of claim 1 , wherein the delay control circuit comprises:
a first NMOS device having the second threshold voltage associated therewith and including a first source/drain adapted for connection to the voltage return of the buffer circuit, a second source/drain connected to a first node of the input stage, and a gate adapted for connection to the second voltage supply, a fall time of the output signal being controlled at least in part as a function of at least one of the second voltage supply and one or more characteristics of the first NMOS device; and
a second NMOS device having the second threshold voltage associated therewith and including a first source/drain adapted for connection to the first voltage supply, a second source/drain connected to a second node of the input stage, and a gate adapted for connection to the second voltage supply, a rise time of the output signal being controlled at least in part as a function of at least one of the second voltage supply and one or more characteristics of the second NMOS device.
7. The buffer circuit of claim 1 , wherein the delay control circuit comprises:
a first NMOS device having the second threshold voltage associated therewith and including a first source/drain adapted for connection to the voltage return of the buffer circuit, a second source/drain connected to a first node of the input stage, and a gate adapted for connection to the second voltage supply, a fall time of the output signal being controlled at least in part as a function of at least one of the second voltage supply and one or more characteristics of the first NMOS device;
a second NMOS device having the second threshold voltage associated therewith and including a first source/drain adapted for connection to the first voltage supply, a second source/drain connected to a second node of the input stage, and a gate adapted for connection to the second voltage supply, a rise time of the output signal being controlled at least in part as a function of at least one of the second voltage supply and one or more characteristics of the second NMOS device;
a third NMOS device having the second threshold voltage associated therewith and including a first source/drain adapted for connection to the voltage return of the buffer circuit, a second source/drain connected to a first node of the output stage, and a gate adapted for connection to the second voltage supply, a fall time of the output signal being controlled at least in part as a function of at least one of the second voltage supply and one or more characteristics of the third NMOS device; and
a fourth NMOS device having the second threshold voltage associated therewith and including a first source/drain adapted for connection to the first voltage supply, a second source/drain connected to a second node of the output stage, and a gate adapted for connection to the second voltage supply, a rise time of the output signal being controlled at least in part as a function of at least one of the second voltage supply and one or more characteristics of the fourth NMOS device.
8. The buffer circuit of claim 7 , wherein the MOS devices in the input stage and output stage are sized to have a substantially greater transconductance than an effective conductance of each of the first, second, third and fourth NMOS devices in the delay control circuit, such that a delay through the buffer circuit is primarily controlled by at least one of the second voltage supply and one or more process, voltage and temperature variations of the first, second, third and fourth NMOS devices.
9. The buffer circuit of claim 1 , wherein the input stage comprises an NMOS device and a P-channel MOS (PMOS) device connected together in an inverter configuration, the NMOS and PMOS devices each having the first threshold voltage associated therewith.
10. The buffer circuit of claim 1 , wherein the output stage comprises an NMOS device and a PMOS device connected together in an inverter configuration, the NMOS and PMOS devices each having the first threshold voltage associated therewith.
11. The buffer circuit of claim 1 , wherein the second voltage supply is substantially greater than the first voltage supply.
12. The buffer circuit of claim 1 , further comprising at least one intermediate buffer stage including an input connected to the output of the input stage and an output connected to the input of the output stage.
13. The buffer circuit of claim 1 , wherein the second voltage supply is substantially equal to about 3.3 volts and the first voltage supply is substantially equal to about 1.0 volt.
14. An integrated circuit including at least one buffer circuit, the at least one buffer circuit comprising:
an input stage including at least one metal-oxide-semiconductor (MOS) device having a first threshold voltage associated therewith, the input stage being adapted to receive an input signal referenced to a first voltage supply;
an output stage including at least one MOS transistor having the first threshold voltage associated therewith, an input of the output stage being connected to an output of the input stage, the output stage being operative to generate an output signal which is indicative of a logic state of the input signal; and
a delay control circuit adapted for connection between at least one of: (i) the input stage and at least one of the first voltage supply and a voltage return of the buffer circuit; and (ii) the output stage and at least one of the first voltage supply and the voltage return of the buffer circuit, the delay control circuit being connected outside a signal path of the buffer circuit, the delay control circuit comprising at least one MOS device having a second threshold voltage associated therewith, the second threshold voltage being greater than the first threshold voltage, the at least one MOS device in the delay control circuit receiving, as a control signal, a second voltage supply, the second voltage supply being independent of the first supply voltage and the voltage return of the buffer circuit, a delay of the buffer circuit being at least partially controlled as a function of at least one of a process parameter, the second voltage supply and a temperature of the at least one MOS device in the delay control circuit.