IP Library Granted Patent US 8,504,952
Granted Patent B2
US 8,504,952 · App. 12/980,085 · Granted Aug 6, 2013

Electrostatic discharge (ESD) protection circuit and method for designing thereof for protection of millimeter wave electrical elements

Inventor: Alon Yehezkely (Tel-Aviv, IL)
Assignee: Wilocity, Ltd.
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Quick Facts
Patent No.
US 8,504,952
App. No.
12/980,085
Granted
Aug 6, 2013
Kind
B2
Abstract

A miniaturized electrostatic discharge (ESD) protection circuit designed for millimeter wave electrical elements, wherein the ESD protection circuit is fabricated on a multilayer substrate. The ESD protection circuit comprises a metal line being connected at one end to a ground and at other end to a connective strip, wherein a length of the metal line is a maximum length that achieves a resistance value defined for the ESD protection circuit and a width of the metal line is set to a maximum width allowed for the multilayer substrate, wherein the metal line introduces a inductance value into the ESD protection circuit; and a capacitor being connected in parallel to the metal line and having a capacitance value resonating the metal line at an operating frequency band, thereby the ESD protection circuit shunts ESD pulses to the ground and passes signals at the operating frequency band.

Claims (33)

1. A method for designing an electrostatic discharge (ESD) circuit for protection of millimeter wave electrical elements, the method is performed by a computer aided design (CAD) system comprising:

determining, by the CAD system, a resistance value of the ESD circuit, wherein the resistance of the ESD circuit is determined based on a class of ESD protection required for the electrical millimeter wave elements;

computing a length and a width of a metal line based on the resistance value, wherein the length and the width of the metal line are maximized to meet at most the determined resistance value;

computing an inductance value of the metal line;

computing, a capacitance value of a capacitor to be connected in parallel to the metal line to resonate the metal line at an operating frequency band of the millimeter wave electrical elements;

connecting the metal line to a ground of a multilayer substrate on which the ESD circuit is fabricated, wherein the ESD circuit is fabricated on the multilayer substrate using a fabrication process including at least a deep sub-micron used for a 90 nanometer or below integrated circuit fabrication process; and

connecting a capacitor having the computed capacitance value in parallel to the metal line.

2. The method of claim 1 , wherein the maximum width of the metal line is determined by a foundry of the multilayer substrate.

3. The method of claim 2 , wherein the computed length of the metal line is further based on a metallization layers resistance.

4. The method of claim 1 , wherein the class of ESD protection is determined based on an ESD protection standard, wherein the ESD protection standard is at least one of: human body model (HBM) ESD, machine model (MM) ESD, and charged device model (CDM) ESD.

5. The method of claim 4 , wherein the metal line acts as an inductor.

6. The method of claim 1 , wherein the ESD circuit shunts ESD pulses to the ground and passes signals at the operating frequency band.

7. The method of claim 6 , wherein the operating frequency band is a 60 GHz frequency band.

8. A miniaturized electrostatic discharge (ESD) protection circuit for millimeter wave electrical elements, comprising:

a metal line being connected at one end to a ground and at other end to a connective strip, wherein a length of the metal line is a maximum length that achieves a resistance value defined for the ESD protection circuit and a width of the metal line is set to a maximum width allowed for the multilayer substrate, wherein the metal line introduces a inductance value into the ESD protection circuit wherein the resistance of the ESD protection circuit is determined based on a class of ESD protection required for the electrical millimeter wave elements, wherein the ESD protection circuit is fabricated on a multilayer substrate using a fabrication process including at least a deep sub-micron used for a 90 nanometer or below integrated circuit fabrication process; and

a capacitor being connected-in parallel to the metal line and having a capacitance value resonating the metal line at an operating frequency band, thereby the ESD protection circuit shunts ESD pulses to the ground and passes signals at the operating frequency band.

9. The miniaturized ESD protection circuit of claim 8 , wherein the maximum width of the metal line is determined by a foundry of the multilayer substrate.

10. The miniaturized ESD protection circuit of claim 8 , wherein the length of the metal line is further based on a metalization layers resistance.

11. The miniaturized ESD protection circuit of claim 8 , wherein the resistance of the ESD protection circuit is determined based on a class of ESD protection required for the electrical millimeter wave elements.

12. The miniaturized ESD protection circuit of claim 8 , wherein the class of ESD protection is determined based on an ESD protection standard, wherein the ESD protection standard is at least one of: human body model (HBM) ESD, machine model (MM) ESD, and charged device model (CDM) ESD.

13. The miniaturized ESD protection circuit of claim 11 , wherein the resistance value of the ESD protection circuit is below 1 Ohm.

14. The miniaturized ESD protection circuit of claim 8 , wherein the inductor is characterized by a low inductance value.

15. The miniaturized ESD protection circuit of claim 8 , wherein the operating frequency band is a 60 GHz frequency band.

16. The miniaturized ESD protection of claim 8 , wherein the connective strip is connected at one end to an antenna and at other end to a circuitry of a radio frequency integrated circuit (RFIC).

17. The miniaturized ESD protection of claim 16 , is integrated in a RFIC adapted for 60 GHz band applications.

18. An electrostatic discharge (ESD) protection circuit for protecting millimeter wave electrical elements, comprising:

a lumped-based resonator element that at one end connected to a ground and at the other end connected to a connective stripe, wherein the lumped-based resonator consists of an inductor connected in parallel to a capacitor, the lumped-based resonator resonates at an operating frequency band, thereby shunting ESD pulses to the ground and passing signals at the operating frequency band, and

wherein the lump-based resonator element is a metal line whose length and width are computed based on a resistance value determined based on a class of ESD protection required for the electrical millimeter wave elements, wherein the ESD protection circuit is fabricated on a multilayer substrate using a fabrication process including at least a deep sub-micron used for a 90 nanometer or below integrated circuit fabrication process.

19. The ESD protection circuit of claim 18 , wherein the inductor is characterized by a low inductance value.

20. The ESD protection circuit of claim 18 , wherein a resistance value of the lumped-based resonator is below 1 Ohm.

21. The ESD protection circuit of claim 18 , wherein the operating frequency band is a 60 GHz frequency band.

22. The ESD protection circuit of claim 18 , is being integrated in an impedance matching network.

23. The ESD protection circuit of claim 18 , wherein the capacitor comprises parasitic capacitance of the inductor causing the lumped-based resonator to resonate at the operating frequency band.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 12, 2014
From: WILOCITY LTD.
To: QUALCOMM ATHEROS, INC.
Reel/Frame 033521/0593 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 12, 2014
From: QUALCOMM ATHEROS, INC.
To: QUALCOMM INCORPORATED
Reel/Frame 033521/0834 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 28, 2010
From: YEHEZKELY, ALON
To: WILOCITY, LTD.
Reel/Frame 025545/0343 →
Continuity (1)
Related Publication 20120162834A1 · Jun 28, 2012