IP Library Granted Patent US 8,551,292
Granted Patent B2
US 8,551,292 · App. 13/501,791 · Granted Oct 8, 2013

Methods for determining the degree of deposition of contaminants

Inventors: Shisei Goto (Tokyo, JP); Yasunobu Ooka (Tokyo, JP); Kosuke Okamoto (Tokyo, JP)
Assignee: Nippon Paper Industries Co., Ltd.
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Quick Facts
Patent No.
US 8,551,292
App. No.
13/501,791
Granted
Oct 8, 2013
Kind
B2
Abstract

Herein provided are methods for determining deposition of contaminants significantly influencing machine runnability or product quality in manufacturing processes of pulp and paper, especially determining the degree of deposition and the morphology of deposits of sticky contaminants or pitch and for evaluating the effect of chemicals for reducing deposition. In a manufacturing process of pulp and paper is used a method comprising: determining the degree of deposition of a contaminant from a liquid or slurry on a quartz crystal oscillator; and quantifying the morphology of deposits on the surface of the quartz crystal oscillator by image analysis. Further, a method comprising adding a chemical for reducing deposition to the liquid or slurry and then quantifying the degree of deposition and the morphology of deposits is used to evaluate the effect of the chemical.

Claims (17)

1. A method for determining deposition of a contaminant from a liquid or slurry in a manufacturing process of pulp and paper, which comprises:

using a microbalance having a quartz crystal oscillator, a surface of which is coated with a material having a solid surface free energy of 75 mJ/m 2 or less, to determine the degree of deposition of the contaminant from the liquid or slurry on the quartz crystal oscillator; and

quantifying the morphology of deposits on the surface of the quartz crystal oscillator by image analysis,

wherein the quantifying step comprises quantifying the proportion of deposits having a particle size equal to or more than a predetermined number from 3 to 20 micrometer.

2. The method of claim 1 , wherein the surface of the quartz crystal oscillator is coated with an organic material.

3. The method of claim 1 , wherein the surface of the quartz crystal oscillator is coated with a material having a solid surface free energy of from 30 to 40 mJ/m 2 .

4. The method of claim 1 , wherein the contaminant is a substance containing a hydrophobic organic matter.

5. The method of claim 1 , wherein the contaminant is a sticky contaminant.

6. The method of claim 1 , wherein the contaminant is pitch.

7. The method of claim 1 , which further comprises:

adding a chemical for reducing deposition of the contaminant to the liquid or slurry;

using a microbalance having a quartz crystal oscillator to determine the degree of deposition of the contaminant on the surface of the quartz crystal oscillator from the liquid or slurry after the chemical has been added; and

comparing the degree of deposition of the contaminant in the presence of the chemical with the degree of deposition of the contaminant in the absence of the chemical to evaluate the effect of the chemical.

8. The method of claim 1 , which comprises using multiple quartz crystal oscillators coated with different materials on their surfaces to determine deposition of the contaminant from the liquid or slurry.

9. The method of claim 1 , which is an on-line continuous measurement.

10. A process for preparing a paper, comprising the method of claim 1 .

11. The method of claim 2 , wherein the surface of the quartz crystal oscillator is coated with a material having a solid surface free energy of from 30 to 40 mJ/m 2 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 13, 2012
From: GOTO, SHISEI; OOKA, YASUNOBU; OKAMOTO, KOSUKE
To: NIPPON PAPER INDUSTRIES CO., LTD.
Reel/Frame 028041/0674 →
Priority Claims (1)
JP 2009-237759 · Oct 14, 2009 · national
Continuity (1)
Related Publication 20120211190A1 · Aug 23, 2012