IP Library Granted Patent US 8,599,592
Granted Patent B2
US 8,599,592 · App. 13/555,745 · Granted Dec 3, 2013

Read threshold setting based on temperature integral

Inventors: Barak Rotbard (Tel Aviv, IL); Naftali Sommer (Rishon Lezion, IL); Shai Winter (Giva′ataim, IL); Ofir Shalvi (Ra′anana, IL); Dotan Sokolov (Ra′anana, IL); Or Ordentlich (Tel Aviv, IL); Micha Anholt (Tel Aviv, IL)
Assignee: Apple Inc.
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Quick Facts
Patent No.
US 8,599,592
App. No.
13/555,745
Granted
Dec 3, 2013
Kind
B2
Abstract

A method for data storage in a memory that includes multiple analog memory cells fabricated using respective physical media, includes identifying a group of the memory cells whose physical media have deteriorated over time below a given storage quality level. A rejuvenation process, which causes the physical media of the memory cells in the group to meet the given storage quality level, is applied to the identified group. Data is stored in the rejuvenated group of the memory cells.

Claims (18)

1. A method for data storage, comprising:

in a memory that includes multiple analog memory cells, storing data in a group of the analog memory cells by writing respective analog storage values into the memory cells in the group;

estimating an integral of a temperature of the memory cells in the group over time;

setting at least one read threshold for reading the memory cells in the group responsively to the estimated integral; and

reading the analog storage values from the memory cells in the group using the at least one read threshold, so as to reconstruct the stored data.

2. The method according to claim 1 , wherein estimating the integral comprises receiving readings of the temperature from a temperature sensor, and computing the integral based on the readings.

3. The method according to claim 1 , wherein estimating the integral comprises sensing a power consumption of the group of the memory cells, deducing the temperature from the sensed power consumption, and computing the integral based on the deduced temperature.

4. The method according to claim 1 , and comprising assessing a health level of the memory cells in the group based on the integral of the temperature.

5. The method according to claim 1 , wherein the memory cells are fabricated using respective physical media, and comprising identifying, based on the integral of the temperature, that the physical media of the group of the memory cells have deteriorated over time below a given storage quality level.

6. The method according to claim 5 , and comprising applying to the group a rejuvenation process, which causes the physical media of the memory cells in the group to meet the given storage quality level.

7. Apparatus for data storage, comprising:

an interface for communicating with a memory that includes multiple analog memory cells; and

circuitry, which is configured to store data in a group of the analog memory cells by writing respective analog storage values into the memory cells in the group, to estimate an integral of a temperature of the memory cells in the group over time, to set at least one read threshold for reading the memory cells in the group responsively to the estimated integral, and to read the analog storage values from the memory cells in the group using the at least one read threshold, so as to reconstruct the stored data.

8. The apparatus according to claim 7 , wherein the circuitry is configured to receive readings of the temperature from a temperature sensor, and to compute the integral based on the readings.

9. The apparatus according to claim 7 , wherein the circuitry is configured to sense a power consumption of the group of the memory cells, to deduce the temperature from the sensed power consumption, and to compute the integral based on the deduced temperature.

10. The apparatus according to claim 7 , wherein the circuitry is configured to assess a health level of the memory cells in the group based on the integral of the temperature.

11. The apparatus according to claim 7 , wherein the memory cells are fabricated using respective physical media, and wherein the circuitry is configured to identify, based on the integral of the temperature, that the physical media of the group of the memory cells have deteriorated over time below a given storage quality level.

12. The apparatus according to claim 11 , wherein the circuitry is configured to apply to the group a rejuvenation process, which causes the physical media of the memory cells in the group to meet the given storage quality level.

Continuity (7)
Division 12649382 · Dec 30, 2009
Provisional Application 61141842 · Dec 31, 2008
Provisional Application 61234688 · Aug 18, 2009
Provisional Application 61243726 · Sep 18, 2009
Provisional Application 61244500 · Sep 22, 2009
Provisional Application 61251787 · Oct 15, 2009
Related Publication 20120287692A1 · Nov 15, 2012