IP Library Granted Patent US 8,648,384
Granted Patent B2
US 8,648,384 · App. 13/397,907 · Granted Feb 11, 2014

Light emitting device

Inventors: Jongho Na (Seoul, KR); Hoonki Hong (Seoul, KR); Hyunkee Lee (Seoul, KR)
Assignee: LG Innotek Co., Ltd.
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Quick Facts
Patent No.
US 8,648,384
App. No.
13/397,907
Granted
Feb 11, 2014
Kind
B2
Abstract

A light emitting device is disclosed. In the light emitting device, the structure of a barrier layer of an active layer is changed, and a band gap energy of an intermediate layer is varied, thereby improving hole injection efficiency of the active layer and thus light emission efficiency.

Claims (39)

1. A light emitting device comprising a light emitting structure comprising: a first semiconductor layer; a second semiconductor layer; an active layer disposed between the first semiconductor layer and the second semiconductor layer; and undoped Al y Ga 1-y N (0<x≦1) disposed between the active layer and the second semiconductor layer, wherein

the first semiconductor layer is an N type semiconductor layer doped with an N type dopant,

the second semiconductor layer is a P type semiconductor layer doped with a P type dopant,

the active layer comprises at least one pairs of alternately stacked well layers and barrier layers,

one of the barrier layers adjacent to the second semiconductor layer comprises a first layer and a second layer disposed between the first layer and the second semiconductor layer,

the first layer has a first band gap,

the second layer has a second band gap,

the second band gap is less than the first band gap,

the second layer is doped with a P type dopant,

wherein the first layer and the second layer include In, and the second layer has In content greater than that of the first layer.

2. The light emitting device according to claim 1 , wherein each of the well layers has a third band gap, and the second band gap is greater than the third band gap.

3. The light emitting device according to claim 1 , wherein the second layer has a thickness of 2 nm to 15 nm.

4. The light emitting device according to claim 1 , wherein the band gap of the undoped Al y Ga 1-y N (0<x≦1) is greater than the first band gap.

5. The light emitting device according to claim 1 , wherein the first layer has a thickness of 4 nm to 6 nm.

6. The light emitting device according to claim 1 , wherein the second layer is doped with a Mg (magnesium) and has a concentration of the Mg of 1E19 atoms/cm 3 to 5E19 atoms/cm 3 .

7. The light emitting device according to claim 1 , further comprising:

a support substrate disposed under the second semiconductor layer;

a first electrode disposed between the support substrate and the second semiconductor layer; and

a second electrode disposed on the first semiconductor layer.

8. A light emitting device comprising a light emitting structure comprising: a first semiconductor layer; a second semiconductor layer; and an active layer disposed between the first semiconductor layer and the second semiconductor layer, wherein

the first semiconductor layer is an N type semiconductor layer doped with an N type dopant,

the second semiconductor layer is a P type semiconductor layer doped with a P type dopant,

the active layer comprises at least one pairs of alternately stacked well layers and barrier layers,

one of the barrier layers adjacent to the second semiconductor layer comprises a first layer and a second layer disposed between the first layer and the second semiconductor layer,

the first layer has a first band gap,

the second layer has a second band gap,

the second band gap is less than the first band gap,

the second layer is doped with a P type dopant,

the light emitting device further comprises an intermediate layer disposed between the active layer and the second semiconductor layer,

the intermediate layer comprises a p type doped p-Al x Ga 1-x N (0<x≦1),

the intermediate layer is a bulk layer, and

Al composition of the intermediate layer is varied, and

wherein the first layer and the second layer include In, and the second layer has In content greater than that of the first layer.

9. The light emitting device according to claim 8 , wherein the intermediate layer has a band gap greater than those of the well layer.

10. The light emitting device according to claim 8 , wherein the Al composition of the intermediate layer is increased and then decreased from the active layer to the second semiconductor layer.

11. The light emitting device according to claim 8 , wherein the Al composition of the intermediate layer is gradually increased and then gradually decreased from the active layer to the second semiconductor layer.

12. The light emitting device according to claim 8 , wherein the intermediate layer is doped with In.

13. The light emitting device according to claim 8 , wherein the intermediate layer has a thickness of 300 Å to 600 Å.

14. The light emitting device according to claim 8 , wherein the intermediate layer has an Al composition ratio varied between 5% and 30%.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2021
From: LG INNOTEK CO., LTD.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 056366/0335 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 16, 2012
From: NA, JONGHO; HONG, HOONKI; LEE, HYUNKEE
To: LG INNOTEK CO., LTD.
Reel/Frame 027715/0670 →
Priority Claims (2)
KR 10-2011-0073631 · Jul 25, 2011 · national
KR 10-2011-0075761 · Jul 29, 2011 · national
Continuity (1)
Related Publication 20120145993A1 · Jun 14, 2012