Substrate processing method
There is provided a substrate processing method capable of preventing the decrease in etching efficiency by positive ions and increasing the overall etching efficiency by using negative ions. The substrate processing method includes applying a plasma RF and a bias RF in the pattern of a pulse wave, respectively. The substrate processing method repeatedly performs the steps of: ( 3 b ) etching a substrate by positive ions in plasma by applying both the plasma RF and the bias RF; ( 3 c ) generating negative ions in a processing chamber by stopping the application of both the plasma RF and the bias RF; and ( 3 a ) attracting the negative ions to the substrate by applying the bias RF and stopping the application of the plasma RF. A duty ratio of the bias RF is set to be greater than a duty ratio of the plasma RF.
1. A substrate processing method performed by a substrate processing apparatus including a processing chamber for generating therein a plasma; a mounting table, provided in the processing chamber, for mounting thereon a substrate; and an electrode disposed to face the mounting table, the substrate processing method performing a plasma etching process on the substrate by applying to the processing chamber a first frequency power for generating plasma and applying to the mounting table a second frequency power for biasing, the second frequency power having a frequency lower than a frequency of the first frequency power, the substrate processing method comprising steps of:
applying the first frequency power and the second frequency power in the pattern of a pulse wave, respectively;
etching the substrate by positive ions in the plasma by applying both the first frequency power and the second frequency power;
generating negative ions in the processing chamber by stopping the application of both the first frequency power and the second frequency power; and
attracting the negative ions to the substrate by applying the second frequency power and stopping the application of the first frequency power,
wherein a duty ratio of the second frequency power is set to be greater than a duty ratio of the first frequency power,
the step of generating negative ions is started immediately upon completing the step of etching the substrate by positive ions by applying both the first frequency power and the second frequency power, and
another step of etching the substrate by positive ions by applying both the first frequency power and the second frequency power is started immediately upon completing the step of attracting the negative ions to the substrate.
2. The substrate processing method of claim 1 , wherein the step of etching the substrate by positive ions, the step of generating negative ions, and the step of attracting the negative ions are repeated in that order.
3. The substrate processing method of claim 1 , wherein the step of generating negative ions is performed for about 1 / 4 period of the pulse wave or more.
4. The substrate processing method of claim 3 , wherein the step of etching the substrate by positive ions, the step of generating negative ions, and the step of attracting the negative ions are repeated in that order.
5. The substrate processing method of claim 1 , wherein the step of generating negative ions is performed for about 10 μsec to about 30 μsec.
6. The substrate processing method of claim 5 , wherein the step of etching the substrate by positive ions, the step of generating negative ions, and the step of attracting the negative ions are repeated in that order.
7. The substrate processing method of claim 1 , wherein the step of etching the substrate by positive ions and the another step of etching the substrate by positive ions are performed for about 1 / 2 period of the pulse wave or more.
8. The substrate processing method of claim 7 , wherein the step of generating negative ions is performed for about 1 / 4 period of the pulse wave or more.
9. The substrate processing method of claim 7 , wherein the step of generating negative ions is performed for about 10 μsec to about 30 μsec.
10. The substrate processing method of claim 7 , wherein the step of etching the substrate by positive ions, the step of generating negative ions, and the step of attracting the negative ions are repeated in that order.
11. The substrate processing method of claim 1 , wherein the duty ratio of the second frequency power is about 0.7 to about 0.8, and the duty ratio of the first frequency power is about 0.5 to about 0.6.
12. The substrate processing method of claim 11 , wherein the step of etching the substrate by positive ions and the another step of etching the substrate by positive ions are performed for about 1 / 2 period of the pulse wave or more.
13. The substrate processing method of claim 11 , wherein the step of generating negative ions is performed for about 1 / 4 period of the pulse wave or more.
14. The substrate processing method of claim 11 , wherein the step of generating negative ions is performed for about 10 μsec to about 30 μsec.
15. The substrate processing method of claim 11 , wherein the step of etching the substrate by positive ions, the step of generating negative ions, and the step of attracting the negative ions are repeated in that order.