IP Library Granted Patent US 8,686,521
Granted Patent B2
US 8,686,521 · App. 12/716,582 · Granted Apr 1, 2014

Magnetoresistive element and magnetic memory

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Quick Facts
Patent No.
US 8,686,521
App. No.
12/716,582
Granted
Apr 1, 2014
Kind
B2
Abstract

A magnetoresistive element includes a stabilization layer, a nonmagnetic layer, a spin-polarization layer provided between the stabilization layer and the nonmagnetic layer, the spin-polarization layer having magnetic anisotropy in a perpendicular direction, and a magnetic layer provided on a side of the nonmagnetic layer opposite to a side on which the spin-polarization layer is provided. The stabilization layer has a lattice constant smaller than that of the spin-polarization layer in an in-plane direction. The spin-polarization layer contains at least one element selected from a group consisting of cobalt (Co) and iron (Fe), has a body-centered tetragonal (BCT) structure, and has a lattice constant ratio c/a of 1.10 (inclusive) to 1.35 (inclusive) when a perpendicular direction is a c-axis and an in-plane direction is an a-axis.

Claims (40)

1. A magnetoresistive element comprising:

a stabilization layer;

a nonmagnetic layer;

a spin-polarization layer provided between the stabilization layer and the nonmagnetic layer, the spin-polarization layer having magnetic anisotropy in a perpendicular direction and comprising a ferromagnetic material; and

a magnetic layer provided on a side of the nonmagnetic layer opposite to a side on which the spin-polarization layer is provided,

wherein the stabilization layer has a lattice constant smaller than that of the spin-polarization layer in an in-plane direction, and

the spin-polarization layer contains at least one element selected from a group consisting of cobalt (Co) and iron (Fe), has a body-centered tetragonal (BCT) structure, and has a lattice constant ratio c/a of 1.10 (inclusive) to 1.35 (inclusive) when the perpendicular direction is a c-axis and the in-plane direction is an a-axis.

2. The element according to claim 1 , wherein the spin-polarization layer is made of a Co X Fe 1-X alloy, and has a composition ratio of 0.4≦X≦0.6.

3. The element according to claim 1 , wherein the spin-polarization layer contains at least one element selected from a group consisting of nickel (Ni), tantalum (Ta), chromium (Cr), boron (B), phosphorus (P), carbon (C), silicon (Si), molybdenum (Mo), zirconium (Zr), platinum (Pt), palladium (Pd), rhodium (Rh), and gold (Au).

4. The element according to claim 1 , wherein the stabilization layer is (001)-oriented in a perpendicular direction, and has a lattice constant of 3.637 (inclusive) to 3.911 (inclusive) Å in an in-plane direction.

5. The element according to claim 1 , wherein the stabilization layer contains at least one element selected from a group consisting of platinum (Pt), palladium (Pd), rhodium (Rh), and iridium (Ir).

6. The element according to claim 1 , wherein the stabilization layer contains an alloy of at least one element selected from a first group consisting of iron (Fe), cobalt (Co), nickel (Ni), and copper (Cu), and at least one element selected from a second group consisting of platinum (Pt), palladium (Pd), rhodium (Rh), and gold (Au).

7. A magnetoresistive element comprising:

first and second stabilization layers;

a nonmagnetic layer;

a first spin-polarization layer provided between the first stabilization layer and the nonmagnetic layer, the first spin-polarization layer having magnetic anisotropy in a perpendicular direction and comprising a ferromagnetic material; and

a second spin-polarization layer provided between the second stabilization layer and the nonmagnetic layer, the second spin-polarization layer having magnetic anisotropy in the perpendicular direction and comprising a ferromagnetic material,

wherein the first stabilization layer has a lattice constant smaller than that of the first spin-polarization layer in an in-plane direction,

the second stabilization layer has a lattice constant smaller than that of the second spin-polarization layer in the in-plane direction, and

each of the first and second spin-polarization layers contains at least one element selected from a group consisting of cobalt (Co) and iron (Fe), has a body-centered tetragonal (BCT) structure, and has a lattice constant ratio c/a of 1.10 (inclusive) to 1.35 (inclusive) when the perpendicular direction is a c-axis and in-plane direction is an a-axis.

8. The element according to claim 7 , wherein the spin-polarization layer is made of a Co X Fe 1-X alloy, and has a composition ratio of 0.4≦X≦0.6.

9. The element according to claim 7 , wherein the spin-polarization layer contains at least one element selected from a group consisting of nickel (Ni), tantalum (Ta), chromium (Cr), boron (B), phosphorus (P), carbon (C), silicon (Si), molybdenum (Mo), zirconium (Zr), platinum (Pt), palladium (Pd), rhodium (Rh), and gold (Au).

10. The element according to claim 7 , wherein the stabilization layer is (001)-oriented in a perpendicular direction, and has a lattice constant of 3.637 (inclusive) to 3.911 (inclusive) Å in an in-plane direction.

11. The element according to claim 7 , wherein the stabilization layer contains at least one element selected from a group consisting of platinum (Pt), palladium (Pd), rhodium (Rh), and iridium (Ir).

12. A magnetic memory comprising a memory cell comprising a magnetoresistive element,

the magnetoresistive element comprising:

a stabilization layer;

a nonmagnetic layer;

a spin-polarization layer provided between the stabilization layer and the nonmagnetic layer, the spin-polarization layer having magnetic anisotropy in a perpendicular direction and comprising a ferromagnetic material; and

a magnetic layer provided on a side of the nonmagnetic layer opposite to a side on which the spin-polarization layer is provided,

wherein the stabilization layer has a lattice constant smaller than that of the spin-polarization layer in an in-plane direction, and

the spin-polarization layer contains at least one element selected from a group consisting of cobalt (Co) and iron (Fe), has a body-centered tetragonal (BCT) structure, and has a lattice constant ratio c/a of 1.10 (inclusive) to 1.35 (inclusive) when the perpendicular direction is a c-axis and the in-plane direction is an a-axis.

13. The element according to claim 1 , wherein the stabilization layer is in contact with the spin polarization layer.

14. The element according to claim 7 , wherein

the first stabilization layer is in contact with the first spin polarization layer, and

the second stabilization layer is in contact with the second spin polarization layer.

15. The memory according to claim 12 , wherein the stabilization layer is in contact with the spin polarization layer.

16. The element according to claim 1 , wherein the BCT structure is obtained by extending the lattice constant of the spin-polarization layer in the c-axis direction.

17. The element according to claim 7 , wherein the BCT structure is obtained by extending the lattice constant of the spin-polarization layer in the c-axis direction.

18. The memory according to claim 12 , wherein the BCT structure is obtained by extending the lattice constant of the spin-polarization layer in the c-axis direction.

Assignments (4)
DE-MERGER Recorded Dec 12, 2019
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051260/0291 →
MERGER Recorded Dec 12, 2019
From: TOSHIBA MEMORY CORPORATION; K.K PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051262/0776 →
CHANGE OF NAME AND ADDRESS Recorded Dec 12, 2019
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 051262/0881 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 16, 2010
From: DAIBOU, TADAOMI; NAGASE, TOSHIHIKO; KITAGAWA, EIJI; YOSHIKAWA, MASATOSHI; NISHIYAMA, KATSUYA; NAGAMINE, MAKOTO; KISHI, TATSUYA; YODA, HIROAKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 024245/0735 →