Analog-to-digital conversion circuit, and image sensor including the same
One embodiment of an analog-to-digital converter includes at least one comparator and a restriction circuit. The comparator has first and second input nodes and a connection node. The connection node is one of an internal node and an output node of the comparator. The restriction circuit is electrically connected to the connection node, and the restriction circuit is configured to restrict a voltage of the connection node.
1. An analog-to-digital converter, comprising:
at least one comparator, the comparator having first and second input nodes and a connection node, the connection node being one of an internal node and an output node of the comparator; and
a restriction circuit electrically connected to the connection node and including a switch connected to a diode, the restriction circuit configured to restrict a voltage of the connection node.
2. The analog-to-digital converter of claim 1 , wherein the comparator includes an amplifier, and the connection node is one of an internal node and an output node of the amplifier.
3. The analog-to-digital converter of claim 1 , wherein the connection node is the internal node of the comparator.
4. The analog-to-digital converter of claim 3 , wherein the diode is connected to ground.
5. The analog-to-digital converter of claim 3 , wherein the diode is connected to a power supply voltage.
6. The analog-to-digital converter of claim 3 , wherein the switch is connected in series to the diode.
7. The analog-to-digital converter of claim 6 , wherein the switch is configured to disable the restriction circuit during an initial operation period of the comparator.
8. The analog-to-digital converter of claim 6 , wherein the restriction circuit is connected to ground.
9. The analog-to-digital converter of claim 6 , wherein the restriction circuit is connected to a power supply voltage.
10. The analog-to-digital converter of claim 1 , wherein the connection node is the output node of the comparator.
11. The analog-to-digital converter of claim 10 , wherein the comparator includes an amplifier having first and second output nodes, at least one of the first and second output nodes of the amplifier serving as the output node of the comparator, and the restriction circuit being electrically connected between the first and second output nodes of the amplifier.
12. The analog-to-digital converter of claim 11 , wherein the restriction circuit is a diode connected PMOS transistor.
13. The analog-to-digital converter of claim 10 , wherein the diode is connected to ground.
14. The analog-to-digital converter of claim 10 , wherein the switch is connected in series to the diode.
15. The analog-to-digital converter of claim 14 , wherein the switch is configured to disable the restriction circuit during an initial operation period of the comparator.
16. The analog-to-digital converter of claim 14 , wherein the restriction circuit is connected to ground.
17. The analog-to-digital converter of claim 1 , further comprising:
a counter configured to generate a count value based on output from the comparator.
18. The analog-to-digital converter of claim 1 , wherein the comparator is configured to compare first and second inputs, the first input being a pixel signal, and the second input being a ramp signal.
19. An analog-to-digital converter, comprising:
at least one comparing circuit, the comparing circuit including,
a first comparator,
a second comparator connected to an output of the first comparator, and
a first restriction circuit electrically connected to the output of the first comparator and including a switch connected to a diode, the restriction circuit configured to restrict a voltage at the output of the first comparator.
20. The analog-to-digital converter of claim 19 , wherein the switch is connected in series to the diode.
21. The analog-to-digital converter of claim 20 , wherein the switch is configured to disable the restriction circuit during an initial operation period of the first comparator.
22. The analog-to-digital converter of claim 20 , wherein the first restriction circuit is connected to ground.
23. The analog-to-digital converter of claim 19 , wherein the comparing circuit includes a second restriction circuit, the second restriction circuit electrically connected to an output of the second comparator, the second restriction circuit configured to restrict a voltage at the output of the second comparator.
24. The analog-to-digital converter of claim 19 , wherein
the first comparator includes an amplifier having first and second output nodes, at least one of the first and second output nodes of the amplifier serving as the output of the first comparator; and
the comparing circuit includes a second restriction circuit, the second restriction circuit being electrically connected between the first and second output nodes of the amplifier, the second restriction circuit configured to restrict a voltage at the output of the first comparator.