IP Library Granted Patent US 8,844,121
Granted Patent B2
US 8,844,121 · App. 13/681,095 · Granted Sep 30, 2014

System and method for manufacturing a field emission structure

Inventors: Larry W. Fullerton (New Hope, AL); Mark D. Roberts (Huntsville, AL)
Assignee: Correlated Magnetics Research LLC
H01F41/02H01P11/00H01F7/0284
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Quick Facts
Patent No.
US 8,844,121
App. No.
13/681,095
Granted
Sep 30, 2014
Kind
B2
Abstract

An improved field emission system and method is provided that involves field emission structures having electric or magnetic field sources. The magnitudes, polarities, and positions of the magnetic or electric field sources are configured to have desirable correlation properties, which may be in accordance with a code. The correlation properties correspond to a desired spatial force function where spatial forces between field emission structures correspond to relative alignment, separation distance, and the spatial force function.

Claims (23)

1. A system, comprising:

a first field emission structure, said first field emission structure having first field emission properties;

a heat source for heating said first field emission structure to at least a critical temperature at which said first field emission structure is susceptible to a change in said first field emission properties; and

a second field emission structure comprising a plurality of field emission sources having a polarity pattern, said polarity pattern including a first polarity and a second polarity opposite said first polarity, said second field emission structure having second field emission properties in accordance with said polarity pattern,

wherein said second field emission structure is brought into proximity with said first field emission structure while said first field emission structure has been heated to at least said critical temperature and causes said first field emission structure to have third field emission properties in accordance with said polarity pattern after said first field emission structure has cooled to a temperature below said critical temperature.

2. The system of claim 1 , wherein said first field emission structure is a magnetic field emission structure.

3. The system of claim 1 , wherein said first field emission structure comprises a ferromagnetic material and said critical temperature is called the Curie temperature.

4. The system of claim 1 , wherein said first field emission structure comprises an anti-ferromagnetic material and said critical temperature is called the Néel temperature.

5. A system, comprising:

a first field emission structure, said first field emission structure having first field emission properties;

a heat source for heating said first field emission structure to at least a critical temperature at which said first field emission structure is susceptible to a change in said first field emission properties; and

a second field emission structure comprising a plurality of field emission sources having a polarity pattern, said polarity pattern including a first polarity and a second polarity opposite said first polarity, wherein said second field emission structure is brought into proximity with said first field emission structure and causes said first field emission structure to have second field emission properties in accordance with said polarity pattern after said first field emission structure has cooled to a temperature below said critical temperature.

6. The system of claim 5 , wherein said first field emission structure comprises a ferromagnetic material and said critical temperature is called the Curie temperature.

7. The system of claim 5 , wherein said first field emission structure comprises an anti-ferromagnetic material and said critical temperature is called the Néel temperature.

8. The system of claim 5 , wherein heating said first field emission structure comprises heating at least one portion of said first field emission structure.

9. The system of claim 5 , wherein said heat source comprises at least one laser.

10. A method, comprising:

heating a first field emission structure having first field emission properties to at least a critical temperature at which said first field emission structure is susceptible to a change in said first field emission properties;

bringing a second field emission structure into proximity with said first field emission structure, said second field emission structure comprising a plurality of field emission sources having a polarity pattern, said polarity pattern including a first polarity and a second polarity opposite said first polarity, and

allowing said first field emission structure to cool to a temperature below said critical temperature causing said first field emission structure to have second field emission properties in accordance with said polarity pattern.

11. The method of claim 10 , wherein said first field emission structure comprises a ferromagnetic material and said critical temperature is called the Curie temperature.

12. The method of claim 10 , wherein said first field emission structure comprises an anti-ferromagnetic material and said critical temperature is called the Néel temperature.

13. The method of claim 10 , wherein heating said first field emission structure comprises heating at least one portion of said first field emission structure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2014
From: FULLERTON, LARRY W., MR.; ROBERTS, MARK D., MR.
To: CORRELATED MAGNETICS RESEARCH, LLC
Reel/Frame 032571/0866 →
Continuity (4)
Division 12206271 · Sep 8, 2008
Continuation 12123718 · May 20, 2008
Provisional Application 61123019 · Apr 4, 2008
Related Publication 20130305522A1 · Nov 21, 2013